Vijay Janapa Reddi

Web search using mobile cores: quantifying and mitigating the price of efficiency

The commoditization of hardware, data center economies of scale, and Internet-scale workload growth all demand greater power efficiency to sustain scalability. Traditional enterprise workloads, which are typically memory and I/O bound, have been well served by chip multiprocessors com- prising of small, power-efficient cores. Recent advances in mobile computing have led to modern small cores capable of delivering even better power efficiency. While these cores can deliver performance-per-Watt efficiency for data center workloads, small cores impact application quality-of-service robustness, and flexibility, as these workloads increasingly invoke computationally intensive kernels. These challenges constitute the price of efficiency. We quantify efficiency for an industry-strength online web search engine in production at both the microarchitecture- and system-level, evaluating search on server and mobile-class architectures using Xeon and Atom processors.

PLR: A Software Approach to Transient Fault Tolerance for Multicore Architectures

Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point toward multicore designs, there is substantial interest in adapting such parallel hardware resources for transient fault tolerance. This paper presents process-level redundancy (PLR), a software technique for transient fault tolerance, which leverages multiple cores for low overhead. PLR creates a set of redundant processes per application process and systematically compares the processes to guarantee correct execution. Redundancy at the process level allows the operating system to freely schedule the processes across all available hardware resources. PLR uses a software-centric approach to transient fault tolerance, which shifts the focus from ensuring correct hardware execution to ensuring correct software execution. As a result, many benign faults that do not propagate to affect program correctness can be safely ignored. A real prototype is presented that is designed to be transparent to the application and can run on general-purpose single-threaded programs without modifications to the program, operating system, or underlying hardware. The system is evaluated for fault coverage and performance on a four-way SMP machine and provides improved performance over existing software transient fault tolerance techniques with a 16.9 percent overhead for fault detection on a set of optimized SPEC2000 binaries.

Using Process-Level Redundancy to Exploit Multiple Cores for Transient Fault Tolerance

Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs, there is substantial interest in adapting such parallel hardware resources for transient fault tolerance. This paper proposes a software-based multi-core alternative for transient fault tolerance using process-level redundancy (PLR). PLR creates a set of redundant processes per application process and systematically compares the processes to guarantee correct execution. Redundancy at the process level allows the operating system to freely schedule the processes across all available hardware resources. PLRs software-centric approach to transient fault tolerance shifts the focus from ensuring correct hardware execution to ensuring correct software execution. As a result, PLR ignores many benign faults that do not propagate to affect program correctness. A real PLR prototype for running single-threaded applications is presented and evaluated for fault coverage and performance. On a 4-way SMP machine, PLR provides improved performance over existing software transient fault tolerance techniques with 16.9% overhead for fault detection on a set of optimized SPEC2000 binaries.

Voltage emergency prediction: Using signatures to reduce operating margins

Inductive noise forces microprocessor designers to sacrifice performance in order to ensure correct and reliable operation of their designs. The possibility of wide fluctuations in supply voltage means that timing margins throughout the processor must be set pessimistically to protect against worst-case droops and surges. While sensor-based reactive schemes have been proposed to deal with voltage noise, inherent sensor delays limit their effectiveness. Instead, this paper describes a voltage emergency predictor that learns the signatures of voltage emergencies (the combinations of control flow and microarchitectural events leading up to them) and uses these signatures to prevent recurrence of the corresponding emergencies. In simulations of a representative superscalar microprocessor in which fluctuations beyond 4% of nominal voltage are treated as emergencies (an aggressive configuration), these signatures can pinpoint the likelihood of an emergency some 16 cycles ahead of time with 90% accuracy. This lead time allows machines to operate with much tighter voltage margins (4% instead of 13%) and up to 13.5% higher performance, which closely approaches the 14.2% performance improvement possible with an ideal oracle-based predictor.

An event-guided approach to reducing voltage noise in processors

Supply voltage fluctuations that result from inductive noise are increasingly troublesome in modern microprocessors. A voltage ldquoemergencyrdquo, i.e., a swing beyond tolerable operating margins, jeopardizes the safe and correct operation of the processor. Techniques aimed at reducing power consumption, e.g., by clock gating or by reducing nominal supply voltage, exacerbate this noise problem, requiring ever-wider operating margins. We propose an event-guided, adaptive method for avoiding voltage emergencies, which exploits the fact that most emergencies are correlated with unique microarchitectural events, such as cache misses or the pipeline flushes that follow branch mispredictions. Using checkpoint and rollback to handle unavoidable emergencies, our method adapts dynamically by learning to trigger avoidance mechanisms when emergency-prone events recur. After tightening supply voltage margins to increase clock frequency and accounting for all costs, the net result is a performance improvement of 8% across a suite of fifteen SPEC CPU2000 benchmarks.

Dimetrodon: processor-level preventive thermal management via idle cycle injection

Processor-level dynamic thermal management techniques have long targeted worst-case thermal margins. We examine the thermal-performance trade-offs in average-case, preventive thermal management by actively degrading application performance to achieve long-term thermal control. We propose Dimetrodon, the use of idle cycle injection, a flexible, per-thread technique, as a preventive thermal management mechanism and demonstrate its efficiency compared to hardware techniques in a commodity operating system on real hardware under throughput and latency-sensitive real-world workloads. Compared to inflexible hardware techniques, Dimetrodon achieves favorable trade-offs for temperature reductions up to 30% due to rapid heat dissipation during short idle intervals.

Persistent Code Caching: Exploiting Code Reuse Across Executions and Applications

Run-time compilation systems are challenged with the task of translating a programs instruction stream while maintaining low overhead. While software managed code caches are utilized to amortize translation costs, they are ineffective for programs with short run times or large amounts of cold code. Such program characteristics are prevalent in real-life computing environments, ranging from graphical user interface (GUI) programs to large-scale applications such as database management systems. Persistent code caching addresses these issues. It is described and evaluated in an industry-strength dynamic binary instrumentation system - Pin. The proposed approach improves the intra-execution model of code reuse by storing and reusing translations across executions, thereby achieving inter-execution persistence. Dynamically linked programs leverage inter-application persistence by using persistent translations of library code generated by other programs. New translations discovered across executions are automatically accumulated into the persistent code caches, thereby improving performance over time. Inter-execution persistence improves the performance of GUI applications by nearly 90%, while inter-application persistence achieves a 59% improvement. In more specialized uses, the SPEC2K INT benchmark suite experiences a 26% improvement under dynamic binary instrumentation. Finally, a 400% speedup is achieved in translating the Oracle database in a regression testing environment

Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity

Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.

Voltage Noise in Production Processors

Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

Eliminating voltage emergencies via software-guided code transformations

In recent years, circuit reliability in modern high-performance processors has become increasingly important. Shrinking feature sizes and diminishing supply voltages have made circuits more sensitive to microprocessor supply voltage fluctuations. These fluctuations result from the natural variation of processor activity as workloads execute, but when left unattended, these voltage fluctuations can lead to timing violations or even transistor lifetime issues. In this article, we present a hardware--software collaborative approach to mitigate voltage fluctuations. A checkpoint-recovery mechanism rectifies errors when voltage violates maximum tolerance settings, while a runtime software layer reschedules the programs instruction stream to prevent recurring violations at the same program location. The runtime layer, combined with the proposed code-rescheduling algorithm, removes 60% of all violations with minimal overhead, thereby significantly improving overall performance. Our solution is a radical departure from the ongoing industry-standard approach to circumvent the issue altogether by optimizing for the worst-case voltage flux, which compromises power and performance efficiency severely, especially looking ahead to future technology generations. Existing conservative approaches will have severe implications on the ability to deliver efficient microprocessors. The proposed technique reassembles a traditional reliability problem as a runtime performance optimization problem, thus allowing us to design processors for typical case operation by building intelligent algorithms that can prevent recurring violations.