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Dive into the research topics where Wang Runsheng is active.

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Featured researches published by Wang Runsheng.


Scientia Sinica Informationis | 2012

New device technologies of integrated circuit in post-Moore era

Huang Ru; Li Ming; An Xia; Wang Runsheng; Cai Yimao

With the continuous development of large scale integrated circuit (IC) technology, challenges resulting from short channel effects, quantum tunneling and parasitic effects make it increasingly difficult for conventional microelectronic device technology to fulfill the demand of sustaining progressing of IC technology node, and especially the increasingly serious problem of energy consumption has been the greatest bottleneck in continuing Moores Law, making it inevitable to take advantage of new device technology in post-Moores era. Therefore, it has become a hot issue that how to develop nanoscale new devices to meet the future demands of microelectronic industry in different IC applications. In this paper, we introduce new device technologies from viewpoints of new structure, new principle and new material, including FinFET, UTB SOI devices, quasi-SOI devices, MultiGate/Gate-All-Around silicon nanowire devices, super steep sub-threshold swing devices and high mobility channel devices. Advantages, existing problems, potential solutions and application prospect of these devices are analyzed, and a roadmap for new device technology in post-Moore era is discussed.


Archive | 2007

Double-fin type channel double-grid multifunction field effect transistor and producing method thereof

Wu Dake; Zhou Falong; Huang Ru; Wang Runsheng; Zhang Xing; Wang Yangyuan


Archive | 2012

Method for testing density of grid dielectric layer trap of non-substrate semiconductor device

Zou Jibin; Huang Ru; Wang Runsheng; Ai Yujie; Fan Jiewen


Archive | 2014

Method for preparing independent bigrid FinFET (Fin Field Effect Transistor) on bulk silicon

Huang Ru; Fan Jiewen; Xu Xiaoyan; Li Jia; Wang Runsheng


Archive | 2014

Method for testing trap density and position of gate dielectric layer of semiconductor device

Huang Ru; Zou Jibin; Liu Changze; Wang Runsheng; Fan Jiewen; Wang Yangyuan


Archive | 2017

Install leaded light post on communications chassis picture peg card

Ma Jie; Wang Runsheng; Li Yang; Hao Shuning; Qian Ruijie; Chen Weifeng; Chen Guang; Wang Wenbo


Archive | 2017

Light guiding column for communication cabinet plugboard

Ma Jie; Wang Runsheng; Li Yang; Hao Shuning; Qian Ruijie; Chen Weifeng; Chen Guang; Wang Wenbo


Archive | 2017

Acceleration transient simulation method for random telegraph noise in circuit

Wang Runsheng; Guo Shaofeng; Huang Ru; Wang Yangyuan


Archive | 2016

Circuit simulation method having grid edge roughness effect for fin-type field effect transistors

Huang Ru; Jiang Xiaobo; Wang Runsheng


IEEE Conference Proceedings | 2016

信頼性と性能同時最適化を考慮したトンネルFETにおける絶縁破壊への深い洞察【Powered by NICT】

Huang Qianqian; Jia Rundong; Zhu Jiadi; Lv Zhu; Wang Jiaxin; Chen Cheng; Zhao Yang; Wang Runsheng; Bu Weihai; Wang Wenbo; Kang Jin; Hua Kelu; Wu Hanming; Yu Shaofeng; Wang Yangyuan; Huang Ru

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Li Yang

Tianjin Polytechnic University

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