Wen-Yu Shiao

White light generation with CdSe-ZnS nanocrystals coated on an InGaN-GaN quantum-well blue/Green two-wavelength light-emitting diode

We grew and processed a blue/green two-wavelength light-emitting diode (LED) based on the mixture of two kinds of quantum wells (QW) in epitaxial growth. The X-ray diffraction and photoluminescence measurements indicated that the crystalline structure and the basic optical property of individual kinds of QW are not significantly changed in the mixed growth. The relative electroluminescence (EL) intensity of the two colors depends on the injection current level, which controls the hole concentration distribution among the QWs. At low injection levels, the top green-emitting QW dominates in EL. As the injection current increases, the blue-emitting QWs beneath become dominating. We also coated CdSe-ZnS nanocrystals on the top of the two-wavelength LED for converting blue photons into red light. With the coating of such nanocrystals, the device emits blue, green, and red lights for white light generation

Prestrained effect on the emission properties of InGaN∕GaN quantum-well structures

The authors demonstrate the spectral redshift of the quantum wells (QWs) designated for green emission into the orange range in a light-emitting diode by adding a violet-emitting QW at the bottom in metal-organic chemical vapor deposition. An electroluminescence redshift of 53nm was obtained. The cathodoluminescence spectra indicated that the long-wavelength QWs close to the violet one were strongly influenced by this added QW and mainly emitted the orange photons. Those near the top were less affected. This influence is supposed to originate from the prestrained effect in the barrier layer right above the violet QW. Such a prestrained effect is expected to be more effective when the underlying QW is well shaped and the heterojunction strain is strong, like the case of the violet QW. This effect is weak between the high-indium QWs, in which the formation of indium-rich clusters releases the strain.

Threading dislocation evolution in patterned GaN nanocolumn growth and coalescence overgrowth

Threading dislocation (TD) evolution during patterned GaN nanocolumn (NC) growth and coalescence overgrowth with metal-organic chemical vapor deposition is studied based on the comparisons of NC and coalescence overgrowth samples of different NC cross-section diameters and spacing sizes. From the measurement results of depth-dependent x-ray diffraction and cross-section transmission electron microscopy, it is found that the TD density in an NC depends on the patterned hole size for NC growth. Also, the TD formation at the beginning of coalescence overgrowth is related to the NC spacing size. Although the TD density at the bottom of the overgrown layer is weakly dependent on NC and spacing sizes, at its top surface, the TD density strongly relies on NC size. Among the overgrowth samples of different NC diameters and spacing sizes with a fixed NC diameter/spacing ratio, the one with the smallest size and spacing leads to the lowest TD density, the largest lateral domain size, and the highest photoluminescen...

Phosphor-Free Monolithic White-Light LED

Phosphor-free monolithic InGaN-based white-light LED has the advantages of simpler device process and potentially higher efficiency. Several techniques have been developed for implementing such white-light LEDs. Among them, the key issue is the growth of a high-quality high-indium InGaN/GaN quantum well (QW). An underlying InGaN layer growth technique is introduced for enhancing the crystal quality of a high-indium QW. To demonstrate the superior properties of a QW grown with this technique, a green LED is fabricated based on the underlying growth technique to compare with another LED of the same emission wavelength based on the conventional growth method. Then, the underlying growth technique is used to grow three yellow-emitting QWs of high efficiency. The yellow photons mix with blue light from an overgrown blue-emitting QW to produce white light. The improved properties of the phosphor-free monolithic white-light LED are discussed in detail.

Nitride Nanocolumns for the Development of Light-Emitting Diode

The progress of light-emitting-diode (LED) development based on nitride nanocolumn (NC) growth, including InGaN/GaN quantum-well (QW) growth on NCs and regularly arranged GaN NC growth, is first reviewed. Then, the coalescence-overgrowth results based on patterned GaN NC growth are introduced. The overgrowth quality dependence on NC cross-sectional size and NC spacing size is discussed. Generally, a smaller NC dimension and spacing size lead to higher overgrowth quality, including lower threading dislocation (TD) density and larger lateral domain size. Next, the emission enhancement results of blue- and green-emitting InGaN/GaN QW and LED structures based on NC growth and coalescence overgrowth are presented. Significant enhancements (up to ~100% output intensity increase in a blue LED) are demonstrated. For LED applications, the TD density reduction in an overgrown GaN template can more effectively enhance the emission efficiency of a blue LED, when compared with a green LED.

Improved a-plane GaN quality grown with flow modulation epitaxy and epitaxial lateral overgrowth on r-plane sapphire substrate

The authors demonstrate superior crystal quality of a-plane GaN grown on r-plane sapphire substrate based on the flow modulation epitaxy (FME) technique, in which the Ga atom supply is alternatively switched on and off with continuous nitrogen supply. With the FME technique, a high growth rate of 2.3μm∕h can still be achieved. With or without epitaxial lateral overgrowth (ELOG), either c- or m-mosaic condition is significantly improved in the samples of using FME. With ELOG, the surface roughness can be reduced from 1.58to0.647nm in an area of 10×10μm2 microns by using the FME technique. Based on the results of photoluminescence measurement, one can also conclude the better optical property of the FME-grown a-plane GaN thin films. Besides, it is shown that tensile strain is more relaxed in the FME samples.

X-ray diffraction study on an InGaN∕GaN quantum-well structure of prestrained growth

We compare the x-ray diffraction (XRD) results of two InGaN∕GaN quantum-well (QW) structures to observe the effects of prestrained growth by depositing a low-indium QW before the growth of five high-indium QWs. From the results of reciprocal space mapping, we observe the fully strained condition in the QWs of the control sample. However, in the sample of prestrained growth, the average strain is partially relaxed. By using an XRD fitting algorithm for calibrating QW parameters, we obtain reasonable values for the compositions and thicknesses of the QWs in both samples. In particular, by assuming a nonuniform strain relaxation distribution among the five high-indium QWs in the prestrained sample, we obtain reasonable composition variations among the QWs. The high-indium QW closest to the low-indium one is most strain-relaxed and has the highest indium incorporation, leading to the longest-wavelength emission. The observed red shift with increasing electron penetration depth in the cathodo-luminescence spec...

Comparison of nanostructure characteristics of ZnO grown on GaN and sapphire

The immature developments of p-type ZnO and ZnO-related ternary or quaternary compound and the small lattice mismatch between ZnO and GaN stimulate interest in the hybrid growth of ZnO and GaN. In this research, we compared the nanostructures and optical properties of two ZnO thin-film samples grown under the same conditions but on different underlying materials (sapphire and GaN). With the high growth temperature of 450°C, both samples show domain structures. However, in contrast to the sample of ZnO on sapphire, the sample of ZnO on GaN starts with smaller domains (a few tens of nanometers in width) of almost vertical boundaries at the interface and evolves into larger domains (around 100nm in width). The 30° twist of the basal plane in ZnO with respect to its underlying sapphire does not occur in the sample of ZnO on GaN. Within a domain of ZnO on sapphire, misfit and threading dislocations can be periodically observed along the interface with the separation of about 8nm. The transition of the lattice ...

Combination of Nitride Semiconductor Nanostructures and Nano-photonics for Efficient Solid-state Lighting

Nitride nanostructures and nano-photonics, including an MOCVD prestrained InGaN/GaN quantum well growth technique for orange and white LED fabrication and surface plasmon coupling with an InGaN/GaN quantum well for light emission enhancement, are reported.

Phosphor-free White-light Light-emitting Diodes Based on Prestrained InGaN/GaN Quantum Wells

A prestrained MOCVD growth technique is introduced to enhance the indium incorporation of InGaN/GaN quantum wells for effectively emitting yellow-red light such that white-light light-emitting diodes can be fabricated without using phosphors.