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Featured researches published by Wenya Fan.


Advances in resist technology and processing. Conference | 2003

Organosiloxane based bottom antireflective coating for 193nm lithography

Bo Li; Kim Do; Jason T. Stuck; Songyuan Xie; Roger Y. Leung; Tiffany Nguyen; Jaswinder Gill; Lei Jin; Wenya Fan; Shilpa Thanawala; Faith Zhou; Nancy Iwamoto; Emma Brouk; Joseph Kennedy

A spin-on sacrificial 193 nm UV absorbing organosiloxane film was developed to facilitate ArF photoresist (PR) patterning. To improve lithographic compatibility with acrylate based photoresists, different performance additives were evaluated as photoresist adhesion promoter. The results suggested that the type and loading of the photoresist adhesion promoter had a large impact on the profile and focus latitude of the patterned photoresist features. An efficient photoresist adhesion promoter candidate was identified, which has minimum impact on other solution and film properties. This work has led to the development of DUO 193 organosiloxane based bottom anti-reflective coating. Application of this film as a blanket level bottom anti-reflective coating or as a fill material for via first trench last (VFTL) dual damascene patterning is possible. The SiO structure intrinsic to this film provides a high degree of plasma etch selectivity to the thin ArF photoresists in use today. Furthermore, an equivalent plasma etch rate between DUO 193 and the low dielectric constant SiOCH films used as the dielectric layer in the backend Cu interconnect structure is possible without compromising the photoresist etch selectivity. Equivalent etch rate is necessary for complete elimination of the “fencing” or “shell” defects found at the base of the etched trench feature located at the perimeter of the top of the via. Advanced ArF PR features of 100 nm in width (and smaller) have been routinely patterned on DUO 193 film. Via fill, plasma etch rate, wet etch rate, ArF PR patterning and shelf life data will be discussed in this presentation.


SID Symposium Digest of Technical Papers | 2006

65.2: Spin-On Polymers for TFT Gate Dielectric Application and Planarization of Stainless Steel

Jinghong Chen; Mehari Stifanos; Wenya Fan; Jan Nedbal; Jeff Rose; Ahila Krishnamoorthy; Emma Brouk; Peter A. Smith; Brian J. Daniels

We present spin-on polymer films with significantly improved dielectric properties for TFT gate dielectric applications. Breakdown voltage//leakage current//CV hysteresis are 4.10 MV/cm at 1 μA/cm2//4.9 × 10−8 A/cm2 at 2.5 MV/cm//3.4 V and 4.73 MV/cm//2.6 × 10−8 A/cm2//0.44V at curing temperatures of 250 °C and 425 °C, respectively. In addition, we present our recent results using spin-on dielectrics to planarize and insulate stainless steel substrates for flexible displays and high resolution QVGA mobile displays.


Archive | 2008

METHODS FOR FORMING DOPED REGIONS IN SEMICONDUCTOR SUBSTRATES USING NON-CONTACT PRINTING PROCESSES AND DOPANT-COMPRISING INKS FOR FORMING SUCH DOPED REGIONS USING NON-CONTACT PRINTING PROCESSES

Roger Y. Leung; De-Ling Zhou; Wenya Fan


Archive | 2004

Repair and restoration of damaged dielectric materials and films

Wenya Fan; Victor Lu; Michael Thomas; Brian J. Daniels; Tiffany Nguyen; De Ling Zhou; Ananth Naman; Lei Jin; Anil Bhanap


Archive | 2002

Interlayer adhesion promoter for low k materials

Victor Lu; Roger Y. Leung; Wenya Fan; Ananth Naman; De-Ling Zhou


Archive | 2008

METHODS FOR SIMULTANEOUSLY FORMING N-TYPE AND P-TYPE DOPED REGIONS USING NON-CONTACT PRINTING PROCESSES

Roger Y. Leung; Anil Bhanap; Zhe Ding; Nicole Rutherford; Wenya Fan


Archive | 2007

Methods of making low-refractive index and/or low-k organosilicate coatings

Roger Y. Leung; De-Ling Zhou; Wenya Fan; Peter A. Smith; Paul G. Apen; Brian J. Daniels; Ananth Naman; Teresa A. Ramos; Robert R. Roth


Archive | 2010

Compositions for forming doped regions in semiconductor substrates, methods for fabricating such compositions, and methods for forming doped regions using such compositions

Roger Y. Leung; Wenya Fan; Jan Nedbal


Archive | 2008

METHODS FOR FORMING DOPED REGIONS IN A SEMICONDUCTOR MATERIAL

Roger Y. Leung; De-Ling Zhou; Wenya Fan


Archive | 2008

Boron-comprising inks for forming boron-doped regions in semiconductor substrates using non-contact printing processes and methods for fabricating such boron-comprising inks

Roger Y. Leung; De-Ling Zhou; Wenya Fan

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