Wenya Fan
Honeywell
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Advances in resist technology and processing. Conference | 2003
Bo Li; Kim Do; Jason T. Stuck; Songyuan Xie; Roger Y. Leung; Tiffany Nguyen; Jaswinder Gill; Lei Jin; Wenya Fan; Shilpa Thanawala; Faith Zhou; Nancy Iwamoto; Emma Brouk; Joseph Kennedy
A spin-on sacrificial 193 nm UV absorbing organosiloxane film was developed to facilitate ArF photoresist (PR) patterning. To improve lithographic compatibility with acrylate based photoresists, different performance additives were evaluated as photoresist adhesion promoter. The results suggested that the type and loading of the photoresist adhesion promoter had a large impact on the profile and focus latitude of the patterned photoresist features. An efficient photoresist adhesion promoter candidate was identified, which has minimum impact on other solution and film properties. This work has led to the development of DUO 193 organosiloxane based bottom anti-reflective coating. Application of this film as a blanket level bottom anti-reflective coating or as a fill material for via first trench last (VFTL) dual damascene patterning is possible. The SiO structure intrinsic to this film provides a high degree of plasma etch selectivity to the thin ArF photoresists in use today. Furthermore, an equivalent plasma etch rate between DUO 193 and the low dielectric constant SiOCH films used as the dielectric layer in the backend Cu interconnect structure is possible without compromising the photoresist etch selectivity. Equivalent etch rate is necessary for complete elimination of the “fencing” or “shell” defects found at the base of the etched trench feature located at the perimeter of the top of the via. Advanced ArF PR features of 100 nm in width (and smaller) have been routinely patterned on DUO 193 film. Via fill, plasma etch rate, wet etch rate, ArF PR patterning and shelf life data will be discussed in this presentation.
SID Symposium Digest of Technical Papers | 2006
Jinghong Chen; Mehari Stifanos; Wenya Fan; Jan Nedbal; Jeff Rose; Ahila Krishnamoorthy; Emma Brouk; Peter A. Smith; Brian J. Daniels
We present spin-on polymer films with significantly improved dielectric properties for TFT gate dielectric applications. Breakdown voltage//leakage current//CV hysteresis are 4.10 MV/cm at 1 μA/cm2//4.9 × 10−8 A/cm2 at 2.5 MV/cm//3.4 V and 4.73 MV/cm//2.6 × 10−8 A/cm2//0.44V at curing temperatures of 250 °C and 425 °C, respectively. In addition, we present our recent results using spin-on dielectrics to planarize and insulate stainless steel substrates for flexible displays and high resolution QVGA mobile displays.
Archive | 2008
Roger Y. Leung; De-Ling Zhou; Wenya Fan
Archive | 2004
Wenya Fan; Victor Lu; Michael Thomas; Brian J. Daniels; Tiffany Nguyen; De Ling Zhou; Ananth Naman; Lei Jin; Anil Bhanap
Archive | 2002
Victor Lu; Roger Y. Leung; Wenya Fan; Ananth Naman; De-Ling Zhou
Archive | 2008
Roger Y. Leung; Anil Bhanap; Zhe Ding; Nicole Rutherford; Wenya Fan
Archive | 2007
Roger Y. Leung; De-Ling Zhou; Wenya Fan; Peter A. Smith; Paul G. Apen; Brian J. Daniels; Ananth Naman; Teresa A. Ramos; Robert R. Roth
Archive | 2010
Roger Y. Leung; Wenya Fan; Jan Nedbal
Archive | 2008
Roger Y. Leung; De-Ling Zhou; Wenya Fan
Archive | 2008
Roger Y. Leung; De-Ling Zhou; Wenya Fan