Xiaoman Duan
Massachusetts Institute of Technology
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Featured researches published by Xiaoman Duan.
Applied Physics Letters | 2006
Lingping Zeng; Yasha Yi; Ching-yin Hong; Jifeng Liu; Ning-Ning Feng; Xiaoman Duan; L. C. Kimerling; Bernard A. Alamariu
An efficient light-trapping scheme is developed for solar cells that can enhance the optical path length by several orders of magnitude using a textured photonic crystal as a backside reflector. It comprises a reflection grating etched on the backside of the substrate and a one-dimensional photonic crystal deposited on the grating. Top-contacted crystalline Si solar cells integrated with the textured photonic crystal back reflector were designed and fabricated. External quantum efficiency was significantly improved between the wavelengths of 1000 and 1200nm (enhancement up to 135 times), and the overall power conversion efficiency was considerably increased.
Applied Physics Letters | 2008
Lingping Zeng; Peter Bermel; Yasha Yi; Bernard A. Alamariu; K. A. Broderick; Jifeng Liu; Ching-yin Hong; Xiaoman Duan; John D. Joannopoulos; L. C. Kimerling
Herein the authors report the experimental application of a powerful light trapping scheme, the textured photonic crystal (TPC) backside reflector, to thin film Si solar cells. TPC combines a one-dimensional photonic crystal as a distributed Bragg reflector with a diffraction grating. Light absorption is strongly enhanced by high reflectivity and large angle diffraction, as designed with scattering matrix analysis. 5 μm thick monocrystalline thin film Si solar cells integrated with TPC were fabricated through an active layer transfer technique. Measured short circuit current density Jsc was increased by 19%, compared to a theoretical prediction of 28%.
IEEE Transactions on Electron Devices | 2007
Ning-Ning Feng; Lirong Zeng; Jifeng Liu; Ching-yin Hong; Lionel C. Kimerling; Xiaoman Duan
We present a design optimization of a highly efficient light-trapping structure to significantly increase the efficiency of thin-film crystalline silicon solar cells. The structure consists of an antireflection (AR) coating, a silicon active layer, and a back reflector that combines a diffractive reflection grating with a distributed Bragg reflector. We have demonstrated that with careful design optimization, the presented light-trapping structure can lead to a remarkable cell-efficiency enhancement for the cells with very thin silicon active layers (typically 2.0-10.0 mum) due to the significantly enhanced absorption in the wavelength range of 800-1100 nm. On the other hand, less enhancement has been predicted for much thicker cells (i.e.,>100 mum) due to the limited absorption increase in this wavelength range. According to our simulation, the overall cell efficiency can be doubled for a 2.0-mum-thick cell with light-trapping structure. It is found that the improvement is mainly contributed by the optimized AR coating and diffraction grating with the corresponding relative improvements of 36% and 54%, respectively. The simulation results show that the absolute cell efficiency of a 2.0-mum-thick cell with the optimal light-trapping structure can be as large as 12%.
Applied Physics Letters | 2004
L. Dal Negro; M. Stolfi; Yasha Yi; J. Michel; Xiaoman Duan; Lionel C. Kimerling; J. LeBlanc; J. Haavisto
Aperiodic one-dimensional Si∕SiO2 Thue–Morse (T–M) multilayer structures have been fabricated in order to investigate both the band gap properties with respect to the system size (band gap scaling) and the omnidirectional reflectance at the fundamental optical band gap. Variable angle reflectance data have experimentally demonstrated a large reflectance band gap in the optical spectrum of a T–M quasicrystal, in agreement with transfer matrix simulations. We explain the physical origin of the T–M omnidirectional band gap as a result of periodic spatial correlations in the complex T–M structure. The unprecedented degree of structural flexibility of T–M systems can provide an attractive alternative to photonic crystals for the fabrication of photonic devices.
Journal of Applied Physics | 1996
Anuradha M. Agarwal; Ling Liao; James S. Foresi; Marcie R. Black; Xiaoman Duan; Lionel C. Kimerling
Photonic integrated circuits in silicon require waveguiding through a material compatible with silicon very large scale integrated circuit technology. Polycrystalline silicon (poly‐Si), with a high index of refraction compared to SiO2 and air, is an ideal candidate for use in silicon optical interconnect technology. In spite of its advantages, the biggest hurdle to overcome in this technology is that losses of 350 dB/cm have been measured in as‐deposited bulk poly‐Si structures, as against 1 dB/cm losses measured in waveguides fabricated in crystalline silicon. We report methods for reducing scattering and absorption, which are the main sources of losses in this system. To reduce surface scattering losses we fabricate waveguides in smooth recrystallized amorphous silicon and chemomechanically polished poly‐Si, both of which reduce losses by about 40 dB/cm. Atomic force microscopy and spectrophotometry studies are used to monitor surface roughness, which was reduced from an rms value of 19–20 nm down to ab...
Optics Express | 2004
Yasha Yi; Shoji Akiyama; Peter Bermel; Xiaoman Duan; L. C. Kimerling
A new silicon based waveguide with full CMOS compatibility is developed to fabricate an on-chip Bragg cladding waveguide that has an oxide core surrounded by a high index contrast cladding layers. The cladding consists of several dielectric bilayers, where each bilayer consists of a high index-contrast pair of layers of Si and Si3N4. This new waveguide guides light based on omnidirectional reflection, reflecting light at any angle or polarization back into the core. Its fabrication is fully compatible with current microelectronics processes. In principle, a core of any low-index material can be realized with our novel structure, including air. Potential applications include tight turning radii, high power transmission, and dispersion compensation.
Applied Physics Letters | 2002
Yasha Yi; Peter Bermel; Kazumi Wada; Xiaoman Duan; John D. Joannopoulos; L. C. Kimerling
A Si-based tunable omnidirectional reflecting photonic band gap structure with a relatively large air gap defect is fabricated and measured. Using only one device, low-voltage tuning around two telecom wavelengths of 1.55 and 1.3 μm by electrostatic force is realized. Four widely spaced resonant modes within the photonic band gap are observed, which is in good agreement with numerical simulations. The whole process is at low temperature and can be compatible with current microelectronics process technology. There are several potential applications of this technology in wavelength division multiplexing devices.
IEEE Journal of Selected Topics in Quantum Electronics | 2006
Yasha Yi; Shoji Akiyama; Peter Bermel; Xiaoman Duan; Lionel C. Kimerling
A novel on-chip Bragg cladding waveguide is designed and fabricated using conventional CMOS techniques. This optical waveguide has a low refractive index core surrounded by high index-contrast cladding bilayers. Polysilicon (n=3.5) and silicon nitride (n=2.0) are used for high index-contrast Bragg layers, where index difference is as high as 1.5. Our simulation shows that sharp bending in low index core materials can be achieved, which is not possible using index guiding mechanism. Within our approach, various on-chip applications are expected such as optical integration, high power transmission, biosensor/microelectromechanical system and so on
Applied Physics Letters | 2006
Xueyin Sun; Juejun Hu; Ching-yin Hong; Jeff Viens; Xiaoman Duan; Rabindra N. Das; Akshay Agarwal; L. C. Kimerling
A photodetector pixel using a photonic crystal structure incorporating photoconductive layers has been realized. The fabricated device exploits mode discrimination and resonant cavity enhancement to provide simultaneous multispectral detection capability, high quantum efficiency, and dramatically suppressed shot noise. Detectivities as high as 2.6×1010 and 2.0×1010cmHz1∕2W−1 at the two preselected wavelengths, 632 and 728nm, were achieved, respectively.
Materials Science and Engineering B-advanced Functional Solid-state Materials | 2001
M. Lipson; Thomas D. Chen; Kevin M. Chen; Xiaoman Duan; Lionel C. Kimerling
Abstract Erbium can provide the Silicon with optoelectronic capabilities. Er:Si has a very sharp emission line at 1.54 μm. The main limitation of Erbium is its low emission efficiency at room temperature. In this work, we show that microcavities can modify the optical properties of the Erbium. Two different mechanisms for modifying the optical properties of the Er ions were studied, one in which the collection of light is optimized. In this case, an enhancement of the photoluminescence by a factor of 1000 was obtained. The second mechanism that was studied is a strong photon-Erbium interaction. In this case, we show evidence for mixing of optical properties of Erbium and photons indicating that properties such as lifetime and energy levels can be changed externally.