Xie Penghao

Experimental Investigation on Electromagnetic Radiation Effects to an Electronic System Through EMP Source

The radiation effect experiment to a complicated electronic system by using of GW ultra-wide band (UWB) radiation source has been carried out. In cases of opening or closing the door of device under test (DUT) , the responses of test points on combination No.04 and No.08 of DUT have been measured. The response characteristics of test points on combination No.02 have been tested at different orientations of antenna of EUT And spectrum analysis has been performed for response waveforms. The results have shown that the response voltage on internal circuits of EUT may reach about 1.6 kV at condition of opening door of DUT when radiated by UWB source with 2.0 X 104 V/m of field strength (rise time is 0.3 ns and pulse width is 3~4 ns). The maximum response voltage on combination No.02 is about 1.6 kV under condition of optimum coupling of antenna. In this case, some of the electronic components which are sensitive to electromagnetic field may be damaged.

Electromagnetic Coupling Effect Emulation Analysis of Metal Body with Small Hole

In order to study the electromagnetic coupling law of a metal body with different form holes, the body model and electromagnetic field needed were set up by the electromagnetic emulation software FEKO. Data showed that: the electromagnetic wave near the source presented obvious reflection; the intensity of electric and magnetic field changed tempestuously at frequency of 700MHz, which was the resonance frequency of electromagnetic coupling; the intensity of the round hole coupling field in the experiment is higher than the square hole; obvious electromagnetic wave diffraction happended at a distance from the body; the vertical far field changed greatly, affected by the body reflection mainly; in z, y direction the internal electromagnetic fields had asymmetry nature as to the hole.

Research on Conversion Relation Between Square Wave and ESD EMP in the Electromagnetic Damage of Electronic Devices

By proceeding from micro electromagnetic damage function of the device, combining with domestic and foreign research achievement on square wave EMP damage, the relation between the damage data of square wave and it of ESD EMP is analyzed. The dependence among the damage data of square wave and it of ESD EMP is setup tentatively. Then, the conversion among damage voltage of square wave and it of ESD EMP is finished.