Y. Kurucu

Measurement of M shell X-ray production cross sections and fluorescence yields for the elements in the atomic range 70 ≤ Z ≤ 92 at 5.96 keV

Total M X-ray cross sections for 12 elements in atomic range 70 ≤ Z ≤ 92 were measured at 5.96 keV Mn K X-ray photon energy. The average M shell fluorescence yields (ωM of these elements have also been observed using the presently measured cross section values and the theoretical M shell photoionisation cross section values.

Measurement of the incoherent scattering functions

Abstract Incoherent scattering functions of Al, Ti, Fe, Ni, Cu, Zn, Zr, Nb, Mo, Ag, Sn, Ta, Au and Pb have been experimentally investigated for 59.5 keV gamma rays of 241 Am at the scattering angle 110° by using the help of a Ge(Li) detector. The measured incoherent scattering functions at the momentum transfer x ≅2.739 A −1 have been compared with those estimated on the basis of the non-relativistic Hartree–Fock wave functions. The present results constitute the first measurement for this combination of energy and angle, and good agreement is obtained between experiment and theory.

Measurement of photon-induced L X-ray production cross-sections for some elements with 40 ≤ Z ≤ 70 at 122 keV

Abstract X-ray production cross-sections for Kα and Kβ X-ray line were measured for Zr, Mo, Ag, In, Sn, Ba, Ce, Nd, Gd, Dy, Er and Yb at a photon excitation energy of 122 keV using a high-resolution Ge(Li)detector. Experimental results were compared with the theoretical values using Kβ/Kα intensity ratios based on Hartree-Fock and Hartree-Slater theories. The results were in good agreement the theoretical values.

Incoherent Scattering of 59.5 keV Gamma Rays by Fe, Zn and Nb

With the help of a Ge(Li) detector, the incoherent scattering differential cross-sections were determined for 59.5keV gamma rays scattered by Fe, Zn and Nb through angles from 55–105°. The background correction and detection efficiency are also included in the study. The experimental results are given and compared with some available theoretical data obtained with some approximation methods.

Coherent scattering of 59.5 keV photons by Au and Pb

Whole atom differential cross-sections for coherent scattering of 59.5 keV γ-rays by gold and lead were measured for angles ranging from 36° to 135°. A Ge(Li) detector was used to detect coherently scattered photons. The results were compared with that of different formalisms of form factor theory.

Peak area determination and energy dependence of gamma- and X-ray peak tailing

Two analytical shape functions representing the shapes of γ- and characteristic X-ray photopeak sides obtained with a Ge(Li) detector are described. The photopeak centroid is accurately determined by using these functions. Energy dependence of photopeak tailing at the lower energy side of the photopeaks are obtained by the least-squares fitting method. The present method can be used for the analysis of partly overlapped photopeaks, one side of which is well resolved, with a sufficient accuracy.

Incoherent Scattering Functions of 59.5keV Gamma Rays by Ti, Ni, Zr, In, Au and Pb

With the help of a Ge(Li) detector, incoherent scattering functions of Ti, Ni, Zr, In, Au and Pb were determined from 36° to 135° in the case of 59.5keV gamma rays of 241 Am. The measured incoherent scattering functions at the momentum transfer 1.484 ≤ x ≤ 4.437A-1 are in agreement with those estimated on the basis of the non-relativistic Hartree–Fock wave functions.

Analysis of Binary Systems with Rayleigh and Compton Scattered Photons

Introduction Recently, several methods have been commonly in use for the quantitative analysis of different samples [1–3]. Some of these are destructive for, e.g., atomic emission and absorption spectroscopy. The techniques, such as activation analysis and X- or γ-ray transmission, are nondestructive and require accurate measurements of the sample thickness and a good experimental arrangement [4,5]. X-ray fluorescence (XRF) and photon induced X-ray emission spectroscopy are restricted to the surface of the analyzed sample [1,6]. Analysis with the XRF technique in cases of overlap may not well resolve characteristic peaks. Therefore, use of scattered intensity ratios is more appropriate for analysis of binary systems.

Scattering of 59.5 keV γ-rays by Ti, Ni and Zr

ABSTRACT Incoherent scattering differential cross-sections have been experimentally determined for 59.5 keV photons in the angular range 36°-135° for the elements Ti, Ni and Zr. The experimental values have been compared with those estimated on the basis of the non-relativistic Hartree-Fock wave functions.

Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry

Abstract A method is presented to determine the coating thickness on a metallic substrate in energy dispersive X-ray fluorescence. The method is based on the measurement of incoherent scattered radiation. Energy dispersive XRF apparatus includes a filtered Am241 point source and an Si(Li) detector with resolution 160 eV at 5.9 keV . The thicknesses of the coating materials found by the scattered radiation have been compared with thicknesses found by the gravimetric method. The obtained results show that there is good agreement between the present experimental results and the values of the gravimetric method within the estimated experimental error.