Elif Öz

Measurement of atomic L shell Coster-Kronig yields (f12, f23 and f13) for some elements in the atomic number range 59⩽Z⩽90

Non-radiative transitions cause changes in the generation of the intensity of the L lines. In order to investigate the physical quantities relevant to the L lines affected by the non-radiative transitions, experimental measurements were carried out using a Si(Li) x-ray spectrometer. Atomic L shell Coster-Kronig yields (f12, f13 and f23) for some elements in the atomic number range 59≤Z≤90 were determined. These selected measured semi-empirical values were also fitted by least squares to polynomials in Z of the form ∑nanZn (except for f13) and compared with theoretical and with earlier fitted values.

Measurement of atomic L shell fluorescence (ω1, ω2, ω3) and Auger (a1, a2 and a3) yields for some elements in the atomic number range 59≤Z≤85

Abstract A comprehensive set of theoretical Coster–Kronig and fluorescence yields are presented for atomic numbers 18≤Z≤100. These quantities are based on ab initio relativistic calculations. Agreement with experimental values is fair for ω1 and generally good for ω2, ω3 (Z≥54) [1] . Therefore, atomic L shell fluorescence (ω1, ω2, ω3) and Auger yields (a1, a2 and a3) for some elements in the atomic number range 59≤Z≤85 were determined. These selected measured semi-empirical values were also fitted by least squares to polynomials in the Z of the form ∑nanZn and compared with theoretical and with earlier fitted values.

Measurement of the Kα and Kβ X-rays polarization degree and polarization effect on the Kβ/Kα intensity ratio

Abstract The linear polarization degree of K α and K β X-rays of some elements in the atomic range 57⩽ Z ⩽69 has been measured. In addition, the polarization effect on the intensity ratio of these elements is investigated. It is found that the K β X-rays are more polarized than K α X-rays. The polarization effect on the K β /K α intensity ratio was investigated. Because the polarization of characteristic K X-ray is not found in the literature the comparison was not made with other experimental and theoretical results.

Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry

Abstract A method is presented to determine the coating thickness on a metallic substrate in energy dispersive X-ray fluorescence. The method is based on the measurement of incoherent scattered radiation. Energy dispersive XRF apparatus includes a filtered Am241 point source and an Si(Li) detector with resolution 160 eV at 5.9 keV . The thicknesses of the coating materials found by the scattered radiation have been compared with thicknesses found by the gravimetric method. The obtained results show that there is good agreement between the present experimental results and the values of the gravimetric method within the estimated experimental error.

MEASUREMENT OF FOIL AND CABLE THICKNESSES BY A TRANSMISSION METHOD

X-ray fluorescence analysis techniques can be applied to determine sample thickness by either absolute or relative methods. An absolute method for thickness determination by x-ray fluorescence analysis has been devised, based on two types of independent measurements of the fluorescence intensity of the constituents of the sample and performance of transmission and reflection irradiation setups. In the present work, a method for determination of the average thickness of material between a gamma-ray source and a detector is presented. The thicknesses of Au, Ag, and Cu foils, and Cu cables have been calculated by a transmission method. An Am-241 radioisotope source and a Si(Li) detector have been used. The method has high accuracy and is easy to use, it is non-destructive towards the sample, and it allows one to the control the sample thickness. To assess the reliability of the method, the results obtained are compared with the results obtained with a micrometer. The results are in good agreement with each other, within the estimated experimental error

MEASUREMENT OF SAMPLE THICKNESS BY AN INTENSITY RATIO METHOD

The thickness measurement of Sn, Ni, and In, evaporated on a Cu substrate is described by means of an intensity ratio method. The detected lines consist of the Kα and Kβ x-rays of the Cu substrate. An Am241 point source and Si(Li) detector with resolution of 160 eV at 5.9 keV were used to excite characteristic K x-rays from copper and to provide the acquisition of the photons, respectively. The obtained results show that the nondestructive estimate of an unknown coating thickness is very quick and easy by means of the intensity ratio method.