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Dive into the research topics where Y. Roelens is active.

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Featured researches published by Y. Roelens.


Applied Physics Letters | 2006

Resonant and voltage-tunable terahertz detection in InGaAs∕InP nanometer transistors

A. El Fatimy; F. Teppe; N. Dyakonova; W. Knap; D. Seliuta; Gintaras Valušis; A. Shchepetov; Y. Roelens; S. Bollaert; A. Cappy; S. L. Rumyantsev

The authors report on detection of terahertz radiation by high electron mobility nanometer InGaAs∕AlInAs transistors. The photovoltaic type of response was observed at the 1.8–3.1THz frequency range, which is far above the cutoff frequency of the transistors. The experiments were performed in the temperature range from 10to80K. The resonant response was observed and was found to be tunable by the gate voltage. The resonances were interpreted as plasma wave excitations in the gated two-dimensional electron gas. The minimum noise equivalent power was estimated, showing possible application of these transistors in sensing of terahertz radiation.


Journal of Applied Physics | 2005

Voltage tuneable terahertz emission from a ballistic nanometer InGaAs∕InAlAs transistor

J. Lusakowski; W. Knap; N. Dyakonova; L. Varani; J. Mateos; T. González; Y. Roelens; S. Bollaert; A. Cappy; K. Karpierz

Terahertz emission from InGaAs∕InAlAs lattice-matched high electron mobility transistors was observed. The emission appears in a threshold-like manner when the applied drain-to-source voltage UDS is larger than a threshold value UTH. The spectrum of the emitted signal consists of two maxima. The spectral position of the lower-frequency maximum (around 1 THz) is sensitive to UDS and UGS, while that of the higher frequency one (around 5 THz) is not. The lower-frequency maximum is interpreted as resulting from the Dyakonov–Shur instability of the gated two-dimensional electron fluid, while the higher frequency is supposed to result from current-driven plasma instability in the ungated part of the channel. The experimental results are confirmed by and discussed within Monte Carlo calculations of the high-frequency current noise spectra.


Nanotechnology | 2003

Ballistic nanodevices for terahertz data processing: Monte Carlo simulations

J. Mateos; Beatriz G. Vasallo; D. Pardo; T. González; J.S. Galloo; Y. Roelens; S. Bollaert; A. Cappy

By using a semi-classical two-dimensional Monte Carlo simulation, simple devices (T-branch junctions (TBJs) and rectifying diodes) based on AlInAs/InGaAs ballistic channels are analysed. Initially, the model is validated by means of Hall-effect measurements of mobility and electron concentration in long (diffusive) channels. Then, quasi-ballistic transport at room temperature is confirmed in a 100 nm channel. Our simulations qualitatively reproduce the experimental results of electric potential measured in a TBJ appearing as a result of electron ballistic transport, and in close relation with the presence of space charge inside the structure. As examples of devices exploiting the ballistic transport of electrons, preliminary simulations of a multiplexor/demultiplexor and a rectifying diode are presented, demonstrating their capability for terahertz operation.


IEEE Transactions on Electron Devices | 2003

Microscopic modeling of nonlinear transport in ballistic nanodevices

J. Mateos; Beatriz G. Vasallo; D. Pardo; T. González; J.S. Galloo; S. Bollaert; Y. Roelens; A. Cappy

By using a semi-classical two-dimensional (2-D) Monte Carlo simulation, simple ballistic devices based on AlInAs/InGaAs channels are analyzed. Our simulations qualitatively reproduce the experimental results in T- and Y-branch junctions as well as in a ballistic rectifier appearing as a result of electron ballistic transport. We show that a quantum description of electron transport is not essential for the physical explanation of these results since phase coherence plays no significant role. On the contrary, its origin can be purely classical: the presence of classical electron transport and space charge inside the structures.


Applied Physics Letters | 2006

Room temperature tunable detection of subterahertz radiation by plasma waves in nanometer InGaAs transistors

F. Teppe; M. Orlov; A. El Fatimy; Antoine Tiberj; W. Knap; J. Torres; V. I. Gavrilenko; A. Shchepetov; Y. Roelens; S. Bollaert

The authors report on the demonstration of room temperature, tunable terahertz detection obtained by 50nm gate length AlGaAs∕InGaAs high electron mobility transistors (HEMTs). They show that the physical mechanism of the detection is related to the plasma waves excited in the transistor channel and that the increasing of the drain current leads to the transformation of the broadband detection to the resonant and tunable one. They also show that the cap layer regions significantly affect the plasma oscillation spectrum in HEMTs by decreasing the resonant plasma frequencies.


Applied Physics Letters | 2008

Current driven resonant plasma wave detection of terahertz radiation: Toward the Dyakonov-Shur instability

S. Boubanga-Tombet; F. Teppe; D. Coquillat; S. Nadar; N. Dyakonova; H. Videlier; W. Knap; A. Shchepetov; C. Gardès; Y. Roelens; S. Bollaert; D. Seliuta; R. Vadoklis; G. Valušis

The experiments on the dc current influence on resonant terahertz plasma wave detection in InGaAs∕InAlAs multichannel high electron mobility transistors are reported. We observed the line width shrinking when a dc current is applied. We show that this line width decrease is due to the current induced reduction of plasma wave damping and takes place because the current drives the system toward the Dyakonov-Shur plasma wave instability.


IEEE Transactions on Electron Devices | 2007

Comparison Between the Dynamic Performance of Double- and Single-Gate AlInAs/InGaAs HEMTs

Beatriz G. Vasallo; N. Wichmann; S. Bollaert; Y. Roelens; A. Cappy; T. González; D. Pardo; J. Mateos

The static and dynamic behavior of InAlAs/InGaAs double-gate high-electron mobility transistors (DG-HEMTs) is studied by means of an ensemble 2-D Monte Carlo simulator. The model allows us to satisfactorily reproduce the experimental performance of this novel device and to go deeply into its physical behavior. A complete comparison between DG and similar standard HEMTs has been performed, and devices with different gate lengths have been analyzed in order to check the attenuation of short-channel effects expected in the DG-structures. We have confirmed that, for very small gate lengths, short-channel effects are less significant in the DG-HEMTs, leading to a better intrinsic dynamic performance. Moreover, the higher values of the transconductance over drain conductance ratio gm /gd, and, especially, the lower gate resistance Rg also provide a significant improvement of the extrinsic fmax.


Applied Physics Letters | 2008

Oblique modes effect on terahertz plasma wave resonant detection in InGaAs/InAlAs multichannel transistors

A. Shchepetov; C. Gardès; Y. Roelens; A. Cappy; S. Bollaert; S. Boubanga-Tombet; F. Teppe; D. Coquillat; S. Nadar; N. Dyakonova; H. Videlier; W. Knap; D. Seliuta; R. Vadoklis; Gintaras Valušis

We report on the demonstration of narrow terahertz plasma wave resonant detection at low temperature in 200nm gate length InGaAs∕InAlAs multichannel high electron mobility transistors. We observe that the resonant detection linewidth is smaller than in full channel high electron mobility transistors. We interpret this shrinking by the effect of multichannel geometry that does not allow oblique plasma mode propagation along the channel.


Semiconductor Science and Technology | 2007

Influence of the surface charge on the operation of ballistic T-branch junctions: a self-consistent model for Monte Carlo simulations

I. Iniguez-de-la-Torre; J. Mateos; T. González; D. Pardo; J S Galloo; S. Bollaert; Y. Roelens; A. Cappy

We analyse the influence of the surface charge on the operation of ballistic T-branch junctions by means of a semi-classical 2D Monte Carlo simulator. We propose a new self-consistent model in which the local value of the surface charge is dynamically adjusted depending on the surrounding carrier density. The well-known parabolic behaviour of the central branch potential VC when biasing right and left branches in a push–pull fashion is found to be much influenced by the value of the surface charge in both the horizontal and vertical branches. With the help of experimental measurements performed in real devices, the influence of the width of the central branch on the values of VC and its relation to surface charge effects are also studied.


IEEE Electron Device Letters | 2004

Nonlinear effects in T-branch junctions

J. Mateos; Beatriz G. Vasallo; D. Pardo; T. González; Emmanuelle Pichonat; J.S. Galloo; S. Bollaert; Y. Roelens; A. Cappy

The negative potential appearing at the central branch of T-branch junctions (TBJs) when biasing left and right contacts in push-pull fashion has been found to appear under high biasing not only for short (ballistic) TBJs but also for long (diffusive) ones. By means of a microscopic Monte Carlo simulation we are able to explain this nonlinear effect as a consequence of intervalley scattering mechanisms leading to the emergence of an accumulation domain that modifies the electronic potential profile within the devices.

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J. Mateos

University of Salamanca

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T. González

University of Salamanca

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D. Pardo

University of Salamanca

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W. Knap

University of Montpellier

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Xavier Wallart

Lille University of Science and Technology

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X. Wallart

Centre national de la recherche scientifique

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