Yasuo Higashi

Development of a high-speed nanoprofiler using normal vector tracing method for high-accuracy mirrors

High-precision optical elements are used in various fields. Ultraprecise aspherical mirrors that offer nanofocusing and high coherence are used to concentrate high-brightness X-rays in developing third-generation synchrotron radiation facilities. In industry, extreme ultraviolet (wavelength: 13.5 nm) lithography, which is used to fabricate semiconductor devices, uses high-accuracy aspherical mirrors for its projection optical systems. The demand for rapid progress in nanomeasurement technologies is increasing because it is difficult to realize next-generation ultraprecise mirrors with the required precision by conventional processing. The measuring method itself requires superhigh precision. We developed an innovative nanoprofiler that can directly measure the figure of high-accuracy mirrors without using a reference surface. The principle of our measuring method is to determine the normal vectors by causing the optical paths of the incident and reflected light at the measurement point to coincide; it is based on the straightness of laser light and the accuracy of rotational goniometers. From the acquired normal vectors and their coordinates, the three-dimensional shape is calculated by a reconstruction algorithm. We measured concave spherical mirrors and compared the results with those using a Fizeau interferometer. The profiles of the mirrors were consistent within the range of error in their middle portions. In addition, we evaluated the performance of an airflow control unit by measuring a concave spherical mirror. This unit suppressed the influence of environmental change, and drastically improved the repeatability.

Surface gradient integrated profiler for x-ray and EUV optics: 3D mapping of 1m-long flat mirror and off-axis parabolic mirror

A new ultra-precision profiler has been developed in order to measure such as asymmetric and aspheric profiles. In the present study, the normal vectors at each points on the surface are determined by the reflected light beam goes back exactly on the same path as the incident beam. The surface gradients at each point are calculated from the normal vector and the surface profile is obtained by integrating the gradient. The measuring instrument was designed according to the above principle of the measuring method. In the design, four ultra-precision goniometers were applied to the adjustment of the light axis for the normal vector measurement. The angle positioning resolution and accuracy of each goniometer are respectively 0.018 μrad and 0.2 μrad. In the measuring instrument, the most important item is the measuring accuracy of the normal vectors by the goniometers. Therefore, the rotating angle positioning errors were measured and calibrated. Then the measurement of a concave mirror with 300 mm radius and 460mm, 1m long plane mirrors were measured. Then, The 3D surface profile of the mirror such 1m-long flat mirror, a concave mirror with 2000 mm radius and off-axis parabolic mirror are obtained by integrating the interpolated gradient.

Development of a high-speed nanoprofiler using normal vector tracing

A new high-speed nanoprofiler was developed in this study. This profiler measures normal vectors and their coordinates on the surface of a specimen. Each normal vector and coordinate is determined by making the incident light path and the reflected light path coincident using 5-axis controlled stages. This is ensured by output signal of quadrant photo diode (QPD). From the acquired normal vectors and their coordinates, the three-dimensional shape is calculated by a reconstruction algorithm based on least-squares. In this study, a concave spherical mirror with a 400 mm radius of curvature was measured. As a result, a peak of 30 nm PV was observed at the center of the mirror. Measurement repeatability was 1 nm. In addition, cross-comparison with a Fizeau interferometer was implemented and the results were consistent within 10 nm. In particular, the high spatial frequency profile was highly consistent, and any differences were considered to be caused by systematic errors.

High-speed surface slope measuring profiler for aspheric shapes

A new high-speed slope measuring instrument is currently under development for small-aperture aspheric lenses and mirrors. In the present study, normal vectors at each point on the lens surface were determined using the reflected light beam that follows the same path as the incident beam. The capability of the developed instrument to achieve submicroradian surface slope metrology of a small-radius aspheric lens was verified. The paper also describes in detail the design principle, aspheric lens measuring method, initial alignment and calibration procedure, shape determination procedure developed from the measured slope metrology, and the high-speed slope measuring technique.

Surface gradient integrated profiler for x-ray and EUV optics: self calibration method of measured position for an off-axis parabolic mirror (f=150mm) measurement

A new ultra-precision profiler has been developed in order to measure such as asymmetric and aspheric profiles. In the present study, the normal vectors at each points on the surface are determined by the reflected light beam goes back exactly on the same path as the incident beam. The surface gradients at each point are calculated from the normal vector and the surface profile is obtained by integrating the gradient. The measuring instrument was designed according to the above principle of the measuring method. In the design, four ultra-precision goniometers were applied to the adjustment of the light axis for the normal vector measurement. In the measuring instrument, the angle-positioning resolution and accuracy of each goniometer are respectively 1.8x10-8rad and 2x10-7rad. A coaxial with an off-axis parabolic mirror has been developing for applying as an optical cavity. The most important engineering technique is to measure the profile of the reflective surface with sub nanometer. The present measuring instrument is evaluating to have capability to the surface measuring accuracy with nanometer for such parabolic mirror profile measurement. A coaxial off-axis parabolic mirror with 150 mm focal length has been polished. The outside and inside diameter of the mirror is 360 mm and 258 mm respectively. The thickness of the coaxial direction is 50 mm. The focal point is located on the center of the coaxial and the center of the coaxial direction of the mirror. The profile measurement such a mirror has been demonstrated. Specially, self calibration method for increasing the measured position accuracy from measured data is discussed.