Yasuyuki Fukuda
Toshiba
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Publication
Featured researches published by Yasuyuki Fukuda.
IEEE Journal of Solid-state Circuits | 2009
Raul-Adrian Cernea; Long Pham; Farookh Moogat; Siu Chan; Binh Le; Yan Li; Shouchang Tsao; Tai-Yuan Tseng; Khanh Nguyen; Jason Li; Jayson Hu; Jong Hak Yuh; Cynthia Hsu; Fanglin Zhang; Teruhiko Kamei; Hiroaki Nasu; Phil Kliza; Khin Htoo; Jeffrey W. Lutze; Yingda Dong; Masaaki Higashitani; Junnhui Yang; Hung-Szu Lin; Vamshi Sakhamuri; Alan Li; Feng Pan; Sridhar Yadala; Subodh Taigor; Kishan Pradhan; James Lan
A 16 Gb 4-state MLC NAND flash memory augments the sustained program throughput to 34 MB/s by fully exercising all the available cells along a selected word line and by using additional performance enhancement modes. The same chip operating as an 8 Gb SLC device guarantees over 60 MB/s programming throughput. The newly introduced all bit line (ABL) architecture has multiple advantages when higher performance is targeted and it was made possible by adopting the ldquocurrent sensingrdquo (as opposed to the mainstream ldquovoltage sensingrdquo) technique. The general chip architecture is presented in contrast to a state of the art conventional circuit and a double size data buffer is found to be necessary for the maximum parallelism attained. Further conceptual changes designed to counterbalance the area increase are presented, hierarchical column architecture being of foremost importance. Optimization of other circuits, such as the charge pump, is another example. Fast data access rate is essential, and ways of boosting it are described, including a new redundancy scheme. ABL contribution to energy saving is also acknowledged.
international solid-state circuits conference | 2009
Takuya Futatsuyama; Norihiro Fujita; Naoya Tokiwa; Yoshihiko Shindo; Toshiaki Edahiro; Teruhiko Kamei; Hiroaki Nasu; Makoto Iwai; Koji Kato; Yasuyuki Fukuda; Naoaki Kanagawa; Naofumi Abiko; Masahide Matsumoto; Toshihiko Himeno; Toshifumi Hashimoto; Yi-Ching Liu; Hardwell Chibvongodze; Takamitsu Hori; Manabu Sakai; Hong Ding; Yoshiharu Takeuchi; Hitoshi Shiga; Norifumi Kajimura; Yasuyuki Kajitani; Kiyofumi Sakurai; Kosuke Yanagidaira; Toshihiro Suzuki; Yuko Namiki; Tomofumi Fujimura; Man Mui
NAND flash memories are used in digital still cameras, cellular phones, MP3 players and various memory cards. As seen in the growing needs for applications such as solid-state drives and video camcoders, the market demands for larger-capacity storage has continuously increased and NAND Flash memories are enabling a wide range of new applications. In such situations, to achieve larger capacity at low cost per bit, technical improvement in feature-size scaling [1], multi-bit per cell [2,3] and area reduction are essential.
international solid-state circuits conference | 2008
Raul-Adrian Cernea; Long Pham; Farookh Moogat; Siu Chan; Binh Le; Yan Li; Shouchang Tsao; Tai-Yuan Tseng; Khanh Nguyen; Jason Li; J. Hu; Jong Park; Cynthia Hsu; Fanglin Zhang; Teruhiko Kamei; Hiroaki Nasu; Phil Kliza; Khin Htoo; Jeffrey W. Lutze; Yingda Dong; Masaaki Higashitani; Junhui Yang; Hung-Szu Lin; Vamshi Sakhamuri; A. Li; Feng Pan; Sridhar Yadala; Subodh Taigor; Kishan Pradhan; James Lan
In the diverse world of NAND flash applications, higher storage capacity is not the only imperative. Increasingly, performance is a differentiating factor and is also a way of creating new markets or expanding existing markets. While conventional memory uses, for actual operations, every other cell along a selected word line (WL) (Takeuchi, 2006), this design simultaneously exercises them all. A performance improvement of at least 100% is derived from this all-bitline (ABL) architecture relative to conventional chips. Additional techniques push performance to even higher levels.
Archive | 2009
Hiroshi Maejima; Katsuaki Isobe; Naoya Tokiwa; Satoru Takase; Yasuyuki Fukuda; Hideo Mukai; Tsuneo Inaba
Archive | 2010
Hiroyuki Nagashima; Yasuyuki Fukuda
Archive | 2007
Hiroyuki Nagashima; Yasuyuki Fukuda
Archive | 2006
Yasuyuki Fukuda; Hiroyuki Nagashima; 宏行 永嶋; 康之 福田
Archive | 2009
Yasuyuki Fukuda; Masaru Fukuyama; Yoichi Shudo; 勝 福山; 康之 福田; 洋一 首藤
Archive | 2017
Kazuyoshi Fukuda; Osamu Kamimura; Tomomichi Nakatsuka; Yasuyuki Fukuda
Archive | 2010
Norihiro Fujita; Yasuyuki Fukuda