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Dive into the research topics where Yasuyuki Fukuda is active.

Publication


Featured researches published by Yasuyuki Fukuda.


IEEE Journal of Solid-state Circuits | 2009

A 34 MB/s MLC Write Throughput 16 Gb NAND With All Bit Line Architecture on 56 nm Technology

Raul-Adrian Cernea; Long Pham; Farookh Moogat; Siu Chan; Binh Le; Yan Li; Shouchang Tsao; Tai-Yuan Tseng; Khanh Nguyen; Jason Li; Jayson Hu; Jong Hak Yuh; Cynthia Hsu; Fanglin Zhang; Teruhiko Kamei; Hiroaki Nasu; Phil Kliza; Khin Htoo; Jeffrey W. Lutze; Yingda Dong; Masaaki Higashitani; Junnhui Yang; Hung-Szu Lin; Vamshi Sakhamuri; Alan Li; Feng Pan; Sridhar Yadala; Subodh Taigor; Kishan Pradhan; James Lan

A 16 Gb 4-state MLC NAND flash memory augments the sustained program throughput to 34 MB/s by fully exercising all the available cells along a selected word line and by using additional performance enhancement modes. The same chip operating as an 8 Gb SLC device guarantees over 60 MB/s programming throughput. The newly introduced all bit line (ABL) architecture has multiple advantages when higher performance is targeted and it was made possible by adopting the ldquocurrent sensingrdquo (as opposed to the mainstream ldquovoltage sensingrdquo) technique. The general chip architecture is presented in contrast to a state of the art conventional circuit and a double size data buffer is found to be necessary for the maximum parallelism attained. Further conceptual changes designed to counterbalance the area increase are presented, hierarchical column architecture being of foremost importance. Optimization of other circuits, such as the charge pump, is another example. Fast data access rate is essential, and ways of boosting it are described, including a new redundancy scheme. ABL contribution to energy saving is also acknowledged.


international solid-state circuits conference | 2009

A 113mm2 32Gb 3b/cell NAND flash memory

Takuya Futatsuyama; Norihiro Fujita; Naoya Tokiwa; Yoshihiko Shindo; Toshiaki Edahiro; Teruhiko Kamei; Hiroaki Nasu; Makoto Iwai; Koji Kato; Yasuyuki Fukuda; Naoaki Kanagawa; Naofumi Abiko; Masahide Matsumoto; Toshihiko Himeno; Toshifumi Hashimoto; Yi-Ching Liu; Hardwell Chibvongodze; Takamitsu Hori; Manabu Sakai; Hong Ding; Yoshiharu Takeuchi; Hitoshi Shiga; Norifumi Kajimura; Yasuyuki Kajitani; Kiyofumi Sakurai; Kosuke Yanagidaira; Toshihiro Suzuki; Yuko Namiki; Tomofumi Fujimura; Man Mui

NAND flash memories are used in digital still cameras, cellular phones, MP3 players and various memory cards. As seen in the growing needs for applications such as solid-state drives and video camcoders, the market demands for larger-capacity storage has continuously increased and NAND Flash memories are enabling a wide range of new applications. In such situations, to achieve larger capacity at low cost per bit, technical improvement in feature-size scaling [1], multi-bit per cell [2,3] and area reduction are essential.


international solid-state circuits conference | 2008

A 34MB/s-Program-Throughput 16Gb MLC NAND with All-Bitline Architecture in 56nm

Raul-Adrian Cernea; Long Pham; Farookh Moogat; Siu Chan; Binh Le; Yan Li; Shouchang Tsao; Tai-Yuan Tseng; Khanh Nguyen; Jason Li; J. Hu; Jong Park; Cynthia Hsu; Fanglin Zhang; Teruhiko Kamei; Hiroaki Nasu; Phil Kliza; Khin Htoo; Jeffrey W. Lutze; Yingda Dong; Masaaki Higashitani; Junhui Yang; Hung-Szu Lin; Vamshi Sakhamuri; A. Li; Feng Pan; Sridhar Yadala; Subodh Taigor; Kishan Pradhan; James Lan

In the diverse world of NAND flash applications, higher storage capacity is not the only imperative. Increasingly, performance is a differentiating factor and is also a way of creating new markets or expanding existing markets. While conventional memory uses, for actual operations, every other cell along a selected word line (WL) (Takeuchi, 2006), this design simultaneously exercises them all. A performance improvement of at least 100% is derived from this all-bitline (ABL) architecture relative to conventional chips. Additional techniques push performance to even higher levels.


Archive | 2009

Resistance change memory device

Hiroshi Maejima; Katsuaki Isobe; Naoya Tokiwa; Satoru Takase; Yasuyuki Fukuda; Hideo Mukai; Tsuneo Inaba


Archive | 2010

Nonvolatile semiconductor memory capable of trimming an initial program voltage for each word line

Hiroyuki Nagashima; Yasuyuki Fukuda


Archive | 2007

Nonvolatile semiconductor memory and nonvolatile memory system using thereof

Hiroyuki Nagashima; Yasuyuki Fukuda


Archive | 2006

Nonvolatile semiconductor storage device and nonvolatile memory system using the same

Yasuyuki Fukuda; Hiroyuki Nagashima; 宏行 永嶋; 康之 福田


Archive | 2009

Method for fixing end of fiber rope

Yasuyuki Fukuda; Masaru Fukuyama; Yoichi Shudo; 勝 福山; 康之 福田; 洋一 首藤


Archive | 2017

dispositivo de relé de proteção de alimentação dc e método de detecção da falha

Kazuyoshi Fukuda; Osamu Kamimura; Tomomichi Nakatsuka; Yasuyuki Fukuda


Archive | 2010

Semiconductor storage device to correct threshold distribution of memory cells by rewriting and method of controlling the same

Norihiro Fujita; Yasuyuki Fukuda

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