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Featured researches published by Yingli Xue.


Journal of Physics B | 2008

Single-electron capture in keV Ar15+...18++He collisions

S Knoop; D. Fischer; Yingli Xue; M Zapukhlyak; C. J. Osborne; Th. Ergler; T. Ferger; J. Braun; G. Brenner; H. Bruhns; C. Dimopoulou; Sascha W. Epp; A. J. González Martínez; G. Sikler; R. Soria Orts; H. Tawara; Tom Kirchner; J. R. Crespo López-Urrutia; R. Moshammer; J. Ullrich; Ronnie Hoekstra

Single-electron capture in 14 keV q(-1) Ar15+...18++He collisions is investigated both experimentally and theoretically. Partial cross sections and projectile scattering angle dependencies have been deduced from the target ion recoil momenta measured by the COLTRIMS technique. The comparison with close-coupling results obtained from a two-centre extension of the basis generator method yields good overall agreement, demonstrating the applicability of close-coupling calculations to collision systems involving highly charged ions in charge states up to 18+.


Review of Scientific Instruments | 2013

Note: a real-time beam current density meter.

J. P. Liu; Deyang Yu; Fangfang Ruan; Yingli Xue; Wei Wang

We have developed a real-time beam current density meter for charged particle beams. It measures the mean current density by collimating a uniform and large diameter primary beam. The suppression of the secondary electrons and the deflection of the beam were simulated, and it was tested with a 105 keV Ar(7+) ion beam.


Review of Scientific Instruments | 2015

A 128-channel picoammeter system and its application on charged particle beam current distribution measurements

Deyang Yu; J. P. Liu; Yingli Xue; Mingwu Zhang; Xiaohong Cai; Jianjun Hu; Jinmei Dong; Xin Li

A 128-channel picoammeter system is constructed based on instrumentation amplifiers. Taking advantage of a high electric potential and narrow bandwidth in DC energetic charged beam measurements, a current resolution better than 5 fA can be achieved. Two sets of 128-channel strip electrodes are implemented on printed circuit boards and are employed for ion and electron beam current distribution measurements. Tests with 60 keV O(3+) ions and 2 keV electrons show that it can provide exact boundaries when a positive charged particle beam current distribution is measured.


Physical Review A | 2017

Production and decay of K -shell hollow krypton in collisions with 52–197-MeV/u bare xenon ions

Caojie Shao; Deyang Yu; Xiaohong Cai; Xi Chen; Kun Ma; Jarah Evslin; Yingli Xue; Wei Wang; Yury. S. Kozhedub; Rongchun Lu; Zhangyong Song; Mingwu Zhang; J. P. Liu; Bian Yang; Yipan Guo; Jianming Zhang; Fangfang Ruan; Yehong Wu; Yuezhao Zhang; Chenzhong Dong; Ximeng Chen; Zhihu Yang

X-ray spectra of K-shell hollow krypton atoms produced in single collisions with 52 - 197 MeV/u Xe54+ ions are measured in a heavy-ion storage ring equipped with an internal gas-jet target. Energy shifts of the K{\alpha}_1,2^s, K{\alpha}_1,2^(h,s), and K\b{eta}_1,3^s transitions are obtained. Thus, the average number of the spectator L-vacancies presented during the x-ray emission is deduced. From the relative intensities of the K{\alpha}_1,2^s and K{\alpha}_1,2^(h,s) transitions, the ratio of K-shell hollow krypton to singly K-shell ionized atoms is determined to be 14 - 24%. In the considered collisions, the K-vacancies are mainly created by the direct ionization which cannot be calculated within the perturbation descriptions. The experimental results are compared with a relativistic coupled channel calculation performed within the independent particle approximation.


Applied Physics Letters | 2015

Electron beam guiding by grooved SiO2 parallel plates without energy loss

Yingli Xue; Deyang Yu; J. P. Liu; Mingwu Zhang; Bian Yang; Yuezhao Zhang; Xiaohong Cai

Using a pair of grooved SiO2 parallel plates, stably guided electron beams were obtained without energy loss at 800–2000 eV. This shows that the transmitted electrons are guided by a self-organized repulsive electric field, paving the way for a self-adaptive manipulation of electron beams.


Journal of Physics: Conference Series | 2017

Guiding of high-current electron beam by macro-insulating units

Mingwu Zhang; Yingli Xue; Xin Li; J. P. Liu; Bian Yang; Wei Wang; Yipan Guo; Wei Xi; Xiaona Zhu; Liping Yang; Deyang Yu; Caojie Shao; Xiaohong Cai

Since the unexpected guiding effect of low energy ions by PET nanocapillaries was reported, considerable work [1, and references therein] has been done to investigate slow highly charged ions (SHCIs) interacting with inner surface of various insulating capillaries. Now it is clear that the preceding SHCIs will deposit positive charges on the surface, building up an electric field by forming a charged patch and therefore preventing the succeeding ions from close contact with the surface. The deposited charge patch more than one may be created until stable guiding is achieved. However, when an electron beam passes through an insulating capillary, besides the low energy secondary electrons, a notable portion of the transmitted electrons suffers significant energy loss, and the transmission efficiency is much lower than that of SHCIs. The current studies of electron guiding indicate that it is essentially different from that of SHCI [2, and references therein]. In our previous work [2], using a pair of grooved SiO2 parallel plates, we had obtained stably guided electron beams without energy loss in the incident energy range of 800-2000V. Different beam fluxes and different ground boundaries were employed to explore the discharge mechanisms, but no obvious influences have been observed. It shows that the self-organizing repulsive electric field played the dominant role to guide the electrons, by comparing with a pair of asymmetric parallel plates that were constructed by replacing one of the plates by a ground metal. This is similar to the case of SHCI beams. However, our results suggest that the complicated mechanisms involved in charging and discharging of insulators bombarded by electrons. Following the above investigation, we used several insulators which were all made into grooved plates as same as the above grooved SiO2 plates, to study the dependence relative to the guiding beams on different materials. As shown in Figure 1, it is very surprised that, because the conductivities of these materials may differ several magnitudes from each other, the guiding behaviors among these different insulators are quite same. Moreover, we found that the gap between two symmetric plates might play significant role in guiding process of electron beams. The present results suggest that the guiding effect of high-current electron beams by macro-insulating units may be due to the combined contributions of the individual atom scattering and the repulsive field on material surface. This work was supported by the National Natural Science Foundation of China (Nos. 11205224, 11275240, and U1332206).


Chinese Physics C | 2016

Determination of internal-target thickness and experimental luminosity from beam energy loss at HIRFL-CSRe*

Caojie Shao; Deyang Yu; Rongchun Lu; T.C. Zhao; R. S. Mao; Jie Li; Yingli Xue; Wei Wang; Bian Yang; Mingwu Zhang; J. P. Liu; Zhangyong Song; Xiaohong Cai; Ximeng Chen; D.Y. Yin; L.J. Mao; Xiaodong Yang; Jiancheng Yang; Youjin Yuan

The target thickness for nitrogen was determined from the beam energy loss in HIRFL-CSRe during the experimental study of the K-REC process in 197 MeV/u Xe54+-N-2 collisions. Furthermore, the corresponding integrated luminosity of (1.15 +/- 0.06) x 10(30) cm(-2) was obtained. As an independent check on the energy-loss method, we have also determined the integrated luminosity by measuring the produced X-rays from the K-REC process with a known differential cross section. The values of (1.12 +/- 0.06) x 10(30) and (1.09 +/- 0.06) x 10(30) cm(-2) were obtained by using two high-purity germanium (HPGe) detectors which were oriented at 90 degrees and 120 degrees with respect to the beam path, respectively. The consistent results confirmed the feasibility of the energy-loss method, which may have an important impact on future internal target experiments at HIRFL-CSRe.


Journal of Physics: Conference Series | 2015

Double K-shell ionization of Kr induced by swift Xe54+ ions

Caojie Shao; Deyang Yu; Wei Wang; Yingli Xue; Mingwu Zhang; Bian Yang; Zhangyong Song; Rongchun Lu; J. P. Liu; Yipan Guo; Xiaohong Cai

Kα satellite and hypersatellite lines of Kr induced by 52-, 94-, 146-, and 197-MeV/u Xe54+ ions were measured. Experimental values were compared with theoretical ones obtained within the independent electron model (IEM) employing single electron probabilities calculated with the semi-classical approach (SCA). This comparison suggests that first order perturbation approximation is consistent well with the experimental result at 197-MeV/u projectile collision while breaks down for the lower energies.


Journal of Physics: Conference Series | 2015

Single and double electron capture by fast Xe54+ from Kr and Xe

Deyang Yu; Caojie Shao; Rongchun Lu; Wei Wang; J. P. Liu; Yingli Xue; Zhangyong Song; Mingwu Zhang; Bian Yang; Fangfang Ruan; Xiaohong Cai

Decay X-ray spectrum of the scattered ions in 52-197 MeV/u Xe54+ collision with Kr and Xe atoms are measured. The transitions form the single capture ion Xe53+* and from the double capture ion Xe52+* are observed, both in a single collision. The single capture is the dominate channel at high energies while the double capture becomes dominate at lower energies.


Journal of Physics: Conference Series | 2015

Electrons transmitted through a plate capillary

Yingli Xue; Deyang Yu; J. P. Liu; Mingwu Zhang; Bian Yang; Yuezhao Zhang; Xiaohong Cai

1.5 keV electrons passed through a plated capillary were studied. We observed that the electrons were transmitted the capillary along its axis for smaller tilt angle, while for larger tilt angle, the electrons emerged from the capillary neither along the capillary axis nor along the beam incident direction, but kept their initial energy.

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Xiaohong Cai

Chinese Academy of Sciences

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Deyang Yu

Chinese Academy of Sciences

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J. P. Liu

Chinese Academy of Sciences

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Wei Wang

Chinese Academy of Sciences

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Caojie Shao

Chinese Academy of Sciences

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Fangfang Ruan

Chinese Academy of Sciences

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Mingwu Zhang

Chinese Academy of Sciences

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Rongchun Lu

Chinese Academy of Sciences

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Bian Yang

Chinese Academy of Sciences

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Jing Chen

Chinese Academy of Sciences

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