Yoichi Takahara | Researchain

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Archive | 1995

Specimen holding method and fluid treatment method of specimen surface and systems therefor

Takao Satoh; Haruo Itoh; Hitoshi Oka; Yoichi Takahara; Akio Saito

Archive | 2005

Method and apparatus for inspecting defects and a system for inspecting defects

Yukihiro Shibata; Shunji Maeda; Takafumi Okabe; Yoichi Takahara

Archive | 1993

Method of controlling adhesion of fine particles to an object in liquid

Katsuhiro Ota; Akio Saito; Yoichi Takahara; Hitoshi Oka

Archive | 2000

Cleaning apparatus for plate-like part and method thereof

Noriyuki Ohroku; Yuichirou Tanaka; Yoichi Takahara; Tomonori Saeki; Susumu Aiuchi; Hitoshi Oka; Fumio Morita; Masataka Fujiki; Akinobu Yamaoka

Archive | 1995

Sample holding method, sample turning method and method and apparatus for treatment of fluid on surface of sample

Hitoshi Oka; Tomonori Saeki; Akio Saito; Takao Sato; Yoichi Takahara; 智則佐伯; 孝雄佐藤; 洋一高原; 昭男齊藤

Archive | 1995

Sample-and-hold method, method for treating fluid on sample surface, and devices for those methods

Haruo Ito; Hitoshi Oka; Akio Saito; Takao Sato; Yoichi Takahara; 晴夫伊藤; 孝雄佐藤; 昭男斉藤; 洋一高原

Archive | 1996

Sample retaining method, sample rotating method, sample surface fluid treatment method and apparatuses for these methods

Hitoshi Oka; Takao Satoh; Yoichi Takahara; Tomonori Saeki; Akio Saito

Archive | 2002

Thin film semiconductor element and its manufacturing method

Hironobu Abe; Kazuhiko Horikoshi; Toshihiko Itoga; Yoshinobu Kimura; Kiyoshi Ogata; Osamu Okura; Masakazu Saito; Yoichi Takahara; Takuo Tamura; Hirokatsu Yamaguchi; 和彦堀越; 理大倉; 潔尾形; 裕功山口; 雅和斉藤; 嘉伸木村; 太久夫田村; 敏彦糸賀; 広伸阿部; 洋一高原

Archive | 2001

Transistor with thin film active region having clusters of different crystal orientation

Takuo Tamura; Kiyoshi Ogata; Yoichi Takahara; Kazuhiko Horikoshi; Hironaru Yamaguchi; Makoto Ohkura; Hironobu Abe; Masakazu Saitou; Yoshinobu Kimura; Toshihiko Itoga

Archive | 2007