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Publication
Featured researches published by Yoichi Torigoe.
Journal of General Plant Pathology | 2003
Takashi Kobayashi; Eiji Kanda; Shigeo Naito; Toshihiko Nakajima; Ichiro Arakawa; Kazutoshi Nemoto; Masanao Honma; Hiroyuki Toujyou; Kiyoshi Ishiguro; Katsuki Kitada; Yoichi Torigoe
Abstract Rice reflectance was measured to determine the spectral regions most sensitive to leaf blast infection with a multispectral radiometer. As disease severity increased, reflectance also increased in the 400–500 nm (blue), 570–700 nm (red), and 900–2000 nm regions but decreased in the 500–570 nm and 700–900 nm regions. The increased reflectance in the blue and red regions may be attributed to decreased chlorophyll and carotenoid contents in response to the blast infection. The maximum and minimum reflectance differences occurred at 680 nm and 760 nm for the nondiseased and diseased rice, respectively. The spectral location of maximum sensitivity was 675 nm regardless of disease severity. Rice reflectance ratios were evaluated as indicators of leaf blast severity. Two ratios, R550/R675 (reflectance at 550 nm divided by reflectance at 675 nm), and R570/R675 quantified the significant disease severity. These wavelengths were selected based on the sensitivity minima and maxima. The ratios of nondiseased rice plants varied depending on growth stage. The variation in ratios must be considered when they are used to estimate leaf blast severity.
The Open Agriculture Journal | 2016
Takashi Kobayashi; Masashi Sasahara; Eiji Kanda; Kiyoshi Ishiguro; Shu Hase; Yoichi Torigoe
Rice blast disease occurs in rice production areas all over the world and is the most important disease in Japan. Remote sensing techniques may provide a mean for detecting disease intensity for large area without being subjected to raters. This study evaluated the use of airborne hyperspectral imagery to measure the severity of panicle blast in field crops. Hyperspectral remote sensing imagery was acquired at the dough stage of rice grain development in northern Japan. The most consistent relationship, with high R and low P, was the simple band ratio R498 to 515/R700 to 717 (i.e., the reflectance at 498 to 515-nm divided by the reflectance at 700to 717-nm). The band ratio of R498 to 515/R700 to 717 increased significantly (P < 0.001) with increasing visual estimates of disease incidence, defined as the percentage of diseased spikelets (R = 0.83). Assessment of disease distribution and severity could provide useful information for making decisions regarding the necessity of fungicide application and estimate potential yield loss due to the disease.
Japanese Journal of Crop Science | 1982
Yoichi Torigoe; Hiroshi Shinji; Hiroshi Kurihara
Japanese Journal of Crop Science | 2002
Eiji Kanda; Yoichi Torigoe; Takashi Kobayashi
Japanese Journal of Crop Science | 1986
Yoichi Torigoe
Japanese Journal of Crop Science | 2000
Eiji Kanda; Yoichi Torigoe; Takashi Kobayashi
Japanese Journal of Crop Science | 1993
Yoichi Torigoe; Takahiro Inoue; Tetsuro Amano; Kei Ogawa; Michikazu Fukuhara
Japanese Journal of Crop Science | 1992
Yoichi Torigoe; Tetsuro Amano; Kei Ogawa; Michikazu Fukuhara
Japanese Journal of Crop Science | 1986
Yoichi Torigoe; Hiroaki Watanabe; Hiroshi Kurihara
Japanese Journal of Crop Science | 1987
Yoichi Torigoe; Ikuo Manabe; Mineo Minami; Hirosi Kurihara