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Featured researches published by Yoshihiro Kashiba.


Archive | 2002

TEST PROBE FOR SEMICONDUCTOR DEVICES, METHOD OF MANUFACTURING OF THE SAME, AND MEMBER FOR REMOVING FOREIGN MATTER

Shigeki Maekawa; Megumi Takemoto; Kazunobu Miki; Mutsumi Kano; Takahiro Nagata; Yoshihiro Kashiba


Archive | 2002

Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus

Shigeki Maekawa; Megumi Takemoto; Yoshihiro Kashiba


Archive | 2001

Semiconductor device test probe having improved tip portion and manufacturing method thereof

Megumi Takemoto; Shigeki Maekawa; Yoshihiro Kashiba; Yoshinori Deguchi; Kazunobu Miki


Archive | 2003

Socket for testing a semiconductor device and a connecting sheet used for the same

Shigeki Maekawa; Yoshihiro Kashiba


Archive | 2004

Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested

Yasushi Tokumo; Shigeki Maekawa; Yoshihiro Kashiba; Shigeru Takada


Archive | 2003

Semiconductor device test probe

Megumi Takemoto; Shigeki Maekawa; Yoshihiro Kashiba; Yoshinori Deguchi; Kazunobu Miki


Archive | 1991

Ceramic-metal composite substrate

Yoshihiro Kashiba; Masaru Okada


Archive | 1991

Ceramic-metal composite substrate and method for producing the same

Yoshihiro Kashiba; Masaru Okada


Archive | 2003

SEMICONDUCTOR DEVICE TEST PROBE HAVING IMPROVED TIP PORTION

Megumi Takemoto; Shigeki Maekawa; Yoshihiro Kashiba; Yoshinori Deguchi; Kazunobu Miki


Archive | 2003

Probe card, and testing apparatus having the same

Megumi Takemoto; Shigeki Maekawa; Yoshihiro Kashiba; Yuetsu Watanabe

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