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Featured researches published by Young-Hun Seo.


international solid-state circuits conference | 2017

23.4 An extremely low-standby-power 3.733Gb/s/pin 2Gb LPDDR4 SDRAM for wearable devices

Hye-Jung Kwon; Eunsung Seo; ChangYong Lee; Young-Hun Seo; Gong-Heum Han; Hye-Ran Kim; Jong-Ho Lee; Min-Su Jang; Sung-Geun Do; Seung-Hyun Cho; Jae-Koo Park; Su-Yeon Doo; Jung-Bum Shin; Sang-Hoon Jung; Hyoung-Ju Kim; In-Ho Im; Beob-Rae Cho; Jae-Woong Lee; Jae-Youl Lee; Ki-Hun Yu; Hyung-Kyu Kim; Chul-Hee Jeon; Hyun-Soo Park; Sang-Sun Kim; Seok-Ho Lee; Jong-Wook Park; Bo-Tak Lim; Jun-Young Park; Yoon-Sik Park; Hyuk-Jun Kwon

With the growth of wearable devices, such as smart watches and smart glasses, there is an increasing demand for lower power dissipation, to achieve longer battery life with limited battery capacity. Nevertheless, memory bandwidth needs to increase to support high-resolution graphic engines. Since most wearable devices are event driven, they consume a bulk of power in standby mode. Therefore, it is crictical to reduce standby-mode power, as well as improve active-mode power efficiency. However, DRAMs periodic self-refresh, critical for data retention, imposes a lower bound on standby-mode power. This paper presents a 2Gb LPDDR4 SDRAM with 0.15mW standby mode power, which is 66% lower than the standby power for a memory of the same density. The proposed memory also achieves a bandwidth of 3.733Gb/s/pin. To extremely reduce standby mode power, an in-DRAM error-correction-code (ECC) engine is used for self-refresh current reduction. Intensive power gating in deep-power-down (DPD) mode, a temperature controlled internal power generator and an aggressively increased gate length is also used to reduce leakage current. In addition, active-mode power efficiency is improved by using a dual-page-size scheme.


Archive | 2006

ON CHIP TEMPERATURE DETECTOR, TEMPERATURE DETECTION METHOD AND REFRESH CONTROL METHOD USING THE SAME

Young-Hun Seo


Archive | 2005

DRAM device with a refresh period that varies responsive to a temperature signal having a hysteresis characteristic

Jong-Hyun Choi; Beob-Rae Cho; Young-Hun Seo


Archive | 2006

INTERNAL REFERENCE VOLTAGE GENERATING CIRCUIT FOR REDUCING STANDBY CURRENT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME

Young-Hun Seo; Dong-Il Seo; Kyu-Chan Lee; Jong-Hyun Choi


Archive | 2006

Temperature sensor instruction signal generator and semiconductor memory device having the same

Jong-Hyun Choi; Dong-Il Seo; Yong-Gu Kang; Jung-Yong Choi; Young-Hun Seo


Archive | 2006

Temperature sensor capable of controlling sensing temperature

Young-Hun Seo


Archive | 2008

Method for testing semiconductor memory device using probe and semiconductor memory device using the same

Young-Hun Seo; Won-kyung Chung; Han-na Park


Archive | 2007

Methods and devices for preventing data stored in memory from being read out

Jong-Hyun Choi; Dong-Il Seo; Kyu-Chan Lee; Young-Hun Seo


Archive | 2008

Circuit and method for controlling refresh periods in semiconductor memory devices

Kwang-Sook Noh; Young-Hun Seo; Jong-Hyun Choi


Archive | 2015

SENSOR AMPLIFIER, MEMORY DEVICE COMPRISING SAME, AND RELATED METHOD OF OPERATION

Young-Hun Seo

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