Young Jun Chang
Seoul National University
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Publication
Featured researches published by Young Jun Chang.
Applied Physics Letters | 2005
Y. S. Kim; Dae Ho Kim; Jurae Kim; Young Jun Chang; T. W. Noh; J.H. Kong; Kookrin Char; Yun Daniel Park; Sang Don Bu; Jong-Gul Yoon; Jin-Seok Chung
To investigate the critical thickness of ferroelectric BaTiO3 (BTO) films, we fabricated fully strained SrRuO3∕BTO∕SrRuO3 heterostructures on SrTiO3 substrates by pulsed laser deposition with in situ reflection high-energy electron diffraction. We varied the BTO layer thickness from 3to30nm. By fabricating 10×10μm2 capacitors, we could observe polarization versus electric-field hysteresis loops, which demonstrate the existence of ferroelectricity in BTO layers thicker than 5nm. This observation provides an experimental upper bound of 5nm for the critical thickness. The BTO thickness-dependent scaling of the remanent polarization agrees with the predictions of recent first-principle simulations [J. Junquera and P. Ghosez, Nature 422, 506 (2003)].
Physical Review B | 2011
Andrew L. Walter; Shu Nie; Keun Su Kim; Luca Moreschini; Young Jun Chang; D. Innocenti; Karsten Horn; Kevin F. McCarty; Eli Rotenberg
The electronic structure of graphene on Cu(111) and Cu(100) single crystals is investigated using low energy electron microscopy, low energy electron diffraction and angle resolved photoemission spectroscopy. On both substrates the graphene is rotationally disordered and interactions between the graphene and substrate lead to a shift in the Dirac crossing of
Applied Physics Letters | 2011
Andrew L. Walter; Ki-Joon Jeon; Florian Speck; Markus Ostler; Thomas Seyller; Luca Moreschini; Yong Su Kim; Young Jun Chang; Karsten Horn; Eli Rotenberg
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Physical Review Letters | 2012
A. Crepaldi; Luca Moreschini; G. Autès; C. Tournier-Colletta; Simon Moser; Naunidh Virk; H. Berger; Ph. Bugnon; Young Jun Chang; Klaus Kern; E. Rotenberg; Oleg V. Yazyev; M. Grioni
-0.3 eV and the opening of a
Physical Review Letters | 2009
Young Jun Chang; C. Kim; S. H. Phark; Y. S. Kim; Jaejun Yu; T. W. Noh
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Physical Review B | 2010
Young Jun Chang; Yong Su Kim; Karsten Horn; Eli Rotenberg
250 meV gap. Exposure of the samples to air resulted in intercalation of oxygen under the graphene on Cu(100), which formed a (
Applied Physics Letters | 2005
Deok-Yong Cho; Kee-Shik Park; Beom-Rak Choi; S.-J. Oh; Young Jun Chang; Dae Ho Kim; T. W. Noh; Ranju Jung; Jae-Cheol Lee; Sang Don Bu
\sqrt{2} \times 2\sqrt{2}
Physical Review Letters | 2004
T. C. Kim; C. M. Ghim; Hyun Jung Kim; Dong-Hyun Kim; Do Young Noh; Namdong Kim; Jinwook Chung; Juhee Yang; Young Jun Chang; T. W. Noh; B. Kahng; J. Kim
)R45
Applied Physics Letters | 2014
Dongmin Seo; Kwangnam Yu; Young Jun Chang; Egon Sohn; Kee Hoon Kim; E. J. Choi
^{\rm o}
Applied Physics Letters | 2011
S. H. Phark; Young Jun Chang; Tae Won Noh
superstructure. The effect of this intercalation on the graphene