Yukio Karasawa | Researchain

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Featured researches published by Yukio Karasawa.

Archive | 1992

Method and apparatus for producing silicon single crystal

Tetsuhiro Oda; Izumi Fusegawa; Hirotoshi Yamagishi; Atsushi Iwasaki; Akiho Maeda; Shinobu Takeyasu; Nobuyoshi Fujimaki; Yukio Karasawa

Archive | 1992

Heat treatment of Si single crystal

Izumi Fusegawa; Hirotoshi Yamagishi; Nobuyoshi Fujimaki; Yukio Karasawa

Archive | 1991

Method for testing electrical properties of silicon single crystal

Izumi Fusegawa; Hirotoshi Yamagishi; Nobuyoshi Fujimaki; Yukio Karasawa

Archive | 1990

Method of testing characteristic of single-crystal silicon

Nobuyoshi Fujimaki; Izumi Fusegawa; Yukio Karasawa; Hirotoshi Yamagishi

Archive | 1992

Method for testing quality of silicon wafer

Izumi Fusegawa; Hirotoshi Yamagishi; Nobuyoshi Fujimaki; Yukio Karasawa

Archive | 1986

Method and apparatus for czochralski single crystal growing

Hirotoshi Yamagishi; Izumi Fusegawa; Shuji Yokota; Junichi Hattori; Yukio Karasawa; Takao Abe

Archive | 1991

METHOD AND APPARATUS FOR PRODUCTION OF SILICON SINGLE CRYSTAL

Nobuyoshi Fujimaki; Izumi Fusegawa; Atsushi Iwasaki; Yukio Karasawa; Akio Maeda; Tetsuhiro Oda; Yukinobu Takeyasu; Hirotoshi Yamagishi; 秋穂前田; 哲宏小田; 浩利山岸; 淳岩崎; 泉布施川; 幸男柄沢; 志信竹安; 延嘉藤巻

Archive | 1993

Method for fabrication of semiconductor device

Izumi Fusegawa; Hirotoshi Yamagishi; Nobuyoshi Fujimaki; Yukio Karasawa

Archive | 1992

Method for forming a gate oxide film

Izumi Fusegawa; Hirotoshi Yamagishi; Nobuyoshi Fujimaki; Yukio Karasawa

Archive | 1992

A method for checking the quality of silicon wafers

Izumi Fusegawa; Hirotoshi Yamagishi; Nobuyoshi Fujimaki; Yukio Karasawa

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