Yutaka Akiba
Hitachi
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Publication
Featured researches published by Yutaka Akiba.
Microelectronics Reliability | 1991
Hironobu Okino; Akio Fujiwara; Yutaka Akiba; Susumu Kasukabe; Tsuyoshi Fujita; Masao Mitani; Kazuo Hirota
A probe head for use with equipment for testing a semiconductor device such as a large scale integrated circuit (LSI) includes electrode pads are formed on a circuit substrate, and a pad protecting conductive layer formed on the pads. A probe pin forming material is grown which is worked into a pin-like configuration, thereby improving a pin assembling property of a probe head portion and this realizes highly accurate pinning with high reliability.
Archive | 1996
Yutaka Akiba; Yasunori Narizuka; Hirayoshi Tanei; Naoya Kitamura
Archive | 1988
Susumu Kasukabe; Masasi Ookubo; Yutaka Akiba; Minoru Tanaka; Hitoshi Yokono
Archive | 1993
Yutaka Akiba; Kunio Matsumoto; Makoto Iida; Takashi Maruyama; Tsutomu Hara; Hitoshi Yoshidome; Kazuo Hirota
Archive | 2002
Yutaka Akiba
Archive | 1979
Yutaka Akiba; Kazuo Hirota
Archive | 1982
Yutaka Akiba; Kazuo Hirota
Archive | 2007
Hiroki Kaneko; Toshiaki Tanaka; Yutaka Akiba
Archive | 1997
Yutaka Akiba
Archive | 2005
Yutaka Akiba