Yuuichi Tatsumi

High voltage booster circuit for use in EEPROMs

Output circuit of semiconductor integrated circuit device

Semiconductor memory device having transfer gates which prevent high voltages from being applied to memory and dummy cells in the reading operation

Semiconductor memory device with redundancy circuit

Semiconductor memory device having copy protect function and method for accessing the same

Nonvolatile semiconductor memory device with stabilized data write characteristic

Semiconductor memory device having a test cell array

Semiconductor memory device with dummy cell array

Method for manufacturing industrial products and combination of masks for manufacturing the same

Semiconductor memory device using MONOS type nonvolatile memory cell