Ž. Gačević

Formation mechanisms of GaN nanowires grown by selective area growth homoepitaxy.

This work provides experimental evidence and theoretical explanations regarding the formation mechanisms of GaN nanowires grown by selective area growth on GaN-on-sapphire templates. The first growth stage, driven by selective area growth kinetics, consists of initial nucleation (along the nanohole inner periphery), coalescence onset and full coalescence, producing a single nanocrystal within each nanohole. In the second growth stage, driven by free-surface-energy minimization, the formed nanocrystal undergoes morphological evolution, exhibiting initial cylindrical-like shape, intermediate dodecagonal shape and a final, thermodynamically stable hexagonal shape. From this point on, the nanowire vertical growth proceeds while keeping the stable hexagonal form.

Optoelectronic properties of InAlN/GaN distributed bragg reflector heterostructure examined by valence electron energy loss spectroscopy.

High-resolution monochromated electron energy loss spectroscopy (EELS) at subnanometric spatial resolution and <200 meV energy resolution has been used to assess the valence band properties of a distributed Bragg reflector multilayer heterostructure composed of InAlN lattice matched to GaN. This work thoroughly presents the collection of methods and computational tools put together for this task. Among these are zero-loss-peak subtraction and nonlinear fitting tools, and theoretical modeling of the electron scattering distribution. EELS analysis allows retrieval of a great amount of information: indium concentration in the InAlN layers is monitored through the local plasmon energy position and calculated using a bowing parameter version of Vegard Law. Also a dielectric characterization of the InAlN and GaN layers has been performed through Kramers-Kronig analysis of the Valence-EELS data, allowing band gap energy to be measured and an insight on the polytypism of the GaN layers.

Blue-to-green single photons from InGaN/GaN dot-in-a-nanowire ordered arrays

Single-photon emitters (SPEs) are at the basis of many applications for quantum information management. Semiconductor-based SPEs are best suited for practical implementations because of high design flexibility, scalability and integration potential in practical devices. Single-photon emission from ordered arrays of InGaN nano-disks embedded in GaN nanowires is reported. Intense and narrow optical emission lines from quantum dot-like recombination centers are observed in the blue-green spectral range. Characterization by electron microscopy, cathodoluminescence and micro-photoluminescence indicate that single photons are emitted from regions of high In concentration in the nano-disks due to alloy composition fluctuations. Single-photon emission is determined by photon correlation measurements showing deep anti-bunching minima in the second-order correlation function. The present results are a promising step towards the realization of on-site/on-demand single-photon sources in the blue-green spectral range operating in the GHz frequency range at high temperatures.

Emission of Linearly Polarized Single Photons from Quantum Dots Contained in Nonpolar, Semipolar, and Polar Sections of Pencil-Like InGaN/GaN Nanowires

A pencil-like morphology of homoepitaxially grown GaN nanowires is exploited for the fabrication of thin conformal intrawire InGaN nanoshells which host quantum dots in nonpolar, semipolar and polar crystal regions. All three quantum dot types exhibit single photon emission with narrow emission line widths and high degrees of linear optical polarization. The host crystal region strongly affects both single photon wavelength and emission lifetime, reaching subnanosecond time scales for the non- and semipolar quantum dots. Localization sites in the InGaN potential landscape, most likely induced by indium fluctuations across the InGaN nanoshell, are identified as the driving mechanism for the single photon emission. The hereby reported pencil-like InGaN nanoshell is the first single nanostructure able to host all three types of single photon sources and is, thus, a promising building block for tunable quantum light devices integrated into future photonic circuits.

Ordered arrays of InGaN/GaN dot-in-a-wire nanostructures as single photon emitters

The realization of reliable single photon emitters operating at high temperature and located at predetermined positions still presents a major challenge for the development of solid-state systems for quantum light applications. We demonstrate single-photon emission from two-dimensional ordered arrays of GaN nanowires containing InGaN nanodisks. The structures were fabricated by molecular beam epitaxy on (0001) GaN-on-sapphire templates patterned with nanohole masks prepared by colloidal lithography. Low-temperature cathodoluminescence measurements reveal the spatial distribution of light emitted from a single nanowire heterostructure. The emission originating from the topmost part of the InGaN regions covers the blue-to-green spectral range and shows intense and narrow quantum dot-like photoluminescence lines. These lines exhibit an average linear polarization ratio of 92%. Photon correlation measurements show photon antibunching with a g(2)(0) values well below the 0.5 threshold for single photon emission. The antibunching rate increases linearly with the optical excitation power, extrapolating to the exciton decay rate of ~1 ns-1 at vanishing pump power. This value is comparable with the exciton lifetime measured by time-resolved photoluminescence. Fast and efficient single photon emitters with controlled spatial position and strong linear polarization are an important step towards high-speed on-chip quantum information management.

Dynamic control of the optical emission from GaN/InGaN nanowire quantum dots by surface acoustic waves

The optical emission of InGaN quantum dots embedded in GaN nanowires is dynamically controlled by a surface acoustic wave (SAW). The emission energy of both the exciton and biexciton lines is modulated over a 1.5 meV range at ∼330 MHz. A small but systematic difference in the exciton and biexciton spectral modulation reveals a linear change of the biexciton binding energy with the SAW amplitude. The present results are relevant for the dynamic control of individual single photon emitters based on nitride semiconductors.

Insight into high-reflectivity AlN/GaN Bragg reflectors with spontaneously formed (Al,Ga)N transient layers at the interfaces

This work gives a detailed insight into how the formation of (Al,Ga)N transient layers (TLs) at the interfaces of AlN/GaN Bragg reflectors modifies their structural and optical properties. While abrupt AlN/GaN interfaces are typically characterized with a network of microcracks, those with TLs are characterized with a network of nanocracks. Transmission electron microscopy reveals a strong correlation between strain and the TLs thickness, identifying thus the strain as the driving force for TLs formation. The AlN/GaN intermixing preserves the targeted stopband position (∼410 nm), whereas the peak reflectivity and the stopband width are both reduced, but still significantly high: >90% and >30 nm, respectively. To model their optical properties, a reduced refractive index contrast approximation is used, a novel method which yields an excellent agreement with the experiment.

(V)EELS Characterization of InAlN/GaN Distributed Bragg Reflectors

Ten-period InAlN/GaN distributed Bragg reflectors are examined by aberration corrected scanning transmission electron microscopy and by valence electron energy-loss spectroscopy (VEELS) with sub-nanometric spatial resolution and sub-eV energy dispersion. Deconvolution and peak subtraction methods, implemented in Matlab routines, are applied to the low loss region of the obtained VEEL spectra to retrieve information about the band gap energy and chemical composition, whereas a Kramers-Kronig transformation is used to retrieve the complex dielectric function of the examined material. The VEEL measurements reveal significant compositional variations in InAlN layers and show a ~2nm thick InAlN layer with high indium content at each GaN/InAlN interface.

Stacked GaAs(Sb)(N)-capped InAs/GaAs quantum dots for enhanced solar cell efficiency

In this manuscript we carry out a comparative analysis of p-i-n junction solar cells based on 10 stacks of InAs/GaAs quantum dots (QDs) capped with GaAs(Sb)(N) capping layers (CLs). The application of such CLs allows to significantly extend the photoresponse beyond 1.3 μm. Moreover, a strong photocurrent from the CLs is observed so that the devices work as QD-quantum well solar cells. The GaAsSb CL leads to the best results, providing a strong sub-band-gap contribution, which is higher than that in a sample containing standard GaAs-capped QDs, despite giving rise to the highest accumulated strain. The use of a GaAsN CL reduces the photocurrent originating from GaAs, pointing to electron retrapping and hindered extraction and/or the introduction of point defects as possible reasons for this. Nevertheless, the addition of N helps to balance the accumulated strain, necessary to stack a higher number of QD layers. In addition, the possibility to independently tune the hole and electron confinements by the simultaneous presence of Sb and N in the CL is also confirmed for 10 stacked QD layers. This not only allows to further extend the QD ground state and, therefore, the photoresponse, but also offers the possibility to design an optimized structure facilitating carrier extraction from the QDs. Nevertheless, carrier losses seem to be stronger under the simultaneous presence of N and Sb in the CL.