Zhang Hong-Qiang

Studies of K-shell x-ray energy shifts induced by MeV/u heavy ions

This paper reports that the K x-ray spectra of the thin target (47)Ag, (48)Cd, (49)In and (50)Sn were measured by an HPGe semi-conductor detector in collisions with 84.5 MeV (6)C(4+) ions. Our experiment revealed the K alpha x-ray energy shifts were not obvious and the K beta(1) x-ray energy shifts were about 90 similar to 110 eV. The simple model of Burch et al has been previously used to calculate the K x-ray energy shifts due to an additional vacancy in 2p orbit. The present work extends the model of Burch to calculate the x-ray energy shifts of multiple ionized atoms induced by heavy ions with kinetic energy of MeV/u. In addition to our experimental results, many other experimental results are compared with the calculated values by using the model.

X-Ray Emission from Zr, Mo, In and Pb Targets Bombarded by Slow Highly Charged Arq+(q = 13,14,15,16) Ions

We study the L x-ray emission from Zr, Mo and In targets and M x-ray emission from Pb target under bombardment of low energy Arq+ (q = 13,14,15,16) ions. The relative x-ray yields were measured in the projectile kinetic energy range 210-360 keV. It is found that the relative x-ray yields from Zr, Mo and Pb targets increase with the increasing projectile kinetic energy for Ar14+ and Ar16+ projectiles and depend on the potential energy of the projectile remarkably.

Multi-Electron Processes in 4.15–11.08 keV/u13C6+ on Argon Collisions

The relative partial cross sections for 13C6+–Ar collisions at 4.15–11.08 keV/u incident energy are measured. The cross-section ratios σ2E/σSC, σ3E/σSC, σ4E/σSC and σ5E/σSC are approximately the constants of 0.51±0.05, 0.20±0.03, 0.06±0.03 and 0.02±0.01 in this region. The significance of the multi-electron process in highly charged ions (HCIs) with argon collisions is demonstrated (σME/σSC as high as 0.79±0.06). In multi-electron processes, it is shown that transfer ionization is dominant while pure electron capture is weak and negligible. For all reaction channels, the cross-sections are independent of the incident energy in the present energy region, which is in agreement with the static characteristic of classic models, i.e. the molecular Coulomb over-the-barrier model (MCBM), the extended classical over-the-barrier model (ECBM) and the semiempirical scaling laws (SL). The result is compared with these classical models and with our previous work of 13C6+-Ne collisions [Chin. Phys. Lett. 23 (2006) 95].

Investigation of transfer ionization in collisions of partially stripped carbon ions with helium at low to intermediate velocities

The ratios of transfer ionization (TI) to single-electron capture (SC) cross sections have been measured for the collisions of partially stripped Cq+ ions (q = 1-4) with He. The collision velocity ranges from 0.7 to 4.4v(0) (v(0) is the Bohr velocity). The projectile-ion and recoil-ion coincidence technique is used to separate the processes of TI and SC. The ratios reach the maximum when the velocity is about 3.7 v(0). This can be explained qualitatively based on the two-step mechanism. The experimental results are also compared with the results calculated using the classical trajectory Monte Carlo (CTMC) method. The CTMC results are in agreement with the experimental data basically. The discrepancies in higher velocity region are interpreted by the effective charge effect.

Multi-Electron Processes in 13C6+ Ions with Neon Collisions in Energy Region 4.15–11.08 keV/u

The cross-section ratios of double-, triple-, quadruple-, and the total multi-electron processes to the single electron capture process (σDE/σSC, σTE/σSC, σQE/σSC and σME/σSC) as well as the relative ratios among reaction channels in double-electron active, triple-electron active and quadruple-electron active are measured in 13C6+–Ne collision in the energy region of 4.15–11.08 keV/u by employing position-sensitive and time-of-flight coincident techniques. It is determined that the cross-section ratios σDE/σSC, σTE/σSC, σQE/σSC and σME/σSC are approximately the constants of 0.20±0.03, 0.16±0.04, 0.06±0.02 and 0.42±0.05. These values are obviously smaller than the predictions of the molecular Coulomb over-the-barrier model (MCBM) [J. Phys. B 23 (1990) 4293], the extended classical over-the-barrier model (ECBM) [J. Phys. B 19 (1986) 2925] and the semiempirical scaling laws (SL) [Phys. Rev. A 54 (1996) 4127]. However, the relative ratios among partial processes of DE, TE and QE are found to depend on collision energy, which suggests that the collision dynamics depends on the collision velocity. The limitation of velocity-independent character of ECBM, MCBM and SL is undoubtedly shown.

Double electron processes in low energy isotope bare ions C-13(6+) with helium collisions

The isotopic bare ion C-13(6+) was employed to collide with helium at 4.15-11.08ke V/u. The relative partial cross sections were measured by position-sensitive and time-of-flight coincident techniques. It is shown that the direct-ionization (DI) process can be completely ignored in this region, the transfer ionization (TI) process is the most important double-electron channel, and the probability of the pure double-electron capture (DC) process is quite small. The cross-section ratio of the total double-electron (DE) process (i.e. DC+TI) to the single-electron capture (SC) process is experimentally determined to be approximately a constant of 0.09 +/- 0.03 in this region, and this value is obviously smaller than the predictions of the classical over-barrier models and the semi-empirical scaling laws. It is found that; the cross-section ratio of pure DC to DE decreases obviously as the projectile velocity increases. Because the pure DC process only comes from the radiation de-excitation following the DC process and are competed by the TI process (comes from the auto-ionization following the DC process), this implies that the population of the two captured electrons depends distinctly on the collision velocity Comparison with works on Ar16+-He by Wu et al. [Phys. Rev. A 48 (1993) 3617] reveals that the strong projectile-dependent character of the pure DC process exists.