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Dive into the research topics where Zhi Hui Kong is active.

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Featured researches published by Zhi Hui Kong.


IEEE Transactions on Very Large Scale Integration Systems | 2010

Design of Low-Power High-Speed Truncation-Error-Tolerant Adder and Its Application in Digital Signal Processing

Ning Zhu; Wang Ling Goh; Weija Zhang; Kiat Seng Yeo; Zhi Hui Kong

In modern VLSI technology, the occurrence of all kinds of errors has become inevitable. By adopting an emerging concept in VLSI design and test, error tolerance (ET), a novel error-tolerant adder (ETA) is proposed. The ETA is able to ease the strict restriction on accuracy, and at the same time achieve tremendous improvements in both the power consumption and speed performance. When compared to its conventional counterparts, the proposed ETA is able to attain more than 65% improvement in the Power-Delay Product (PDP). One important potential application of the proposed ETA is in digital signal processing systems that can tolerate certain amount of errors.


IEEE Transactions on Circuits and Systems | 2011

An 8T Differential SRAM With Improved Noise Margin for Bit-Interleaving in 65 nm CMOS

Do Anh-Tuan; Jeremy Yung Shern Low; Joshua Yung Lih Low; Zhi Hui Kong; Xiaoliang Tan; Kiat Seng Yeo

Lowering power consumption and increasing noise margin have become two central topics in every state of the art SRAM design. Due to parameter fluctuations in scaled technologies, stable operation is critical to obtain high yield low-voltage, low-power SRAM. Recent published works in literature have shown that the conventional 6T SRAM suffers a severe stability degradation due to access disturbances at low-power mode. Thus, several 8T and 10T cell designs have been reported, improving the cell stability. However, they either employ single-ended read port or require too large area. In this paper, we use a fully differential 8T SRAM that allows efficient bit-interleaving to achieve soft-error tolerance with conventional Error Correcting Code (ECC). It also consumes less power when compared to the conventional 6T design. A column-based dynamic supply voltage scheme is utilized to improve both the read noise margin and the write-ability. To verify the technique, a 128 × 64-bit of the proposed SRAM has been implemented in a standard 65 nm/1 V CMOS process. Simulation results reaffirmed that the proposed design has 2× higher noise margin and consumes 54% less power when compared to the conventional 6T design.


IEEE Transactions on Information Forensics and Security | 2014

Exploiting Process Variations and Programming Sensitivity of Phase Change Memory for Reconfigurable Physical Unclonable Functions

Le Zhang; Zhi Hui Kong; Chip-Hong Chang; Alessandro Cabrini; Guido Torelli

Physical unclonable function (PUF) leverages the immensely complex and irreproducible nature of physical structures to achieve device authentication and secret information storage. To enhance the security and robustness of conventional PUFs, reconfigurable physical unclonable functions (RPUFs) with dynamically refreshable challenge-response pairs (CRPs) have emerged recently. In this paper, we propose two novel physically reconfigurable PUF (P-RPUF) schemes that exploit the process parameter variability and programming sensitivity of phase change memory (PCM) for CRP reconfiguration and evaluation. The first proposed PCM-based P-RPUF scheme extracts its CRPs from the measurable differences of the PCM cell resistances programmed by randomly varying pulses. An imprecisely controlled regulator is used to protect the privacy of the CRP in case the configuration state of the RPUF is divulged. The second proposed PCM-based RPUF scheme produces the random response by counting the number of programming pulses required to make the cell resistance converge to a predetermined target value. The merging of CRP reconfiguration and evaluation overcomes the inherent vulnerability of P-RPUF devices to malicious prediction attacks by limiting the number of accessible CRPs between two consecutive reconfigurations to only one. Both schemes were experimentally evaluated on 180-nm PCM chips. The obtained results demonstrated their quality for refreshable key generation when appropriate fuzzy extractor algorithms are incorporated.


international symposium on circuits and systems | 2014

Highly reliable memory-based Physical Unclonable Function using Spin-Transfer Torque MRAM

Le Zhang; Xuanyao Fong; Chip-Hong Chang; Zhi Hui Kong; Kaushik Roy

In recent years, Physical Unclonable Function (PUF) based on the inimitable and unpredictable disorder of physical devices has emerged to address security issues related to cryptographic key generation. In this paper, a novel memory-based PUF based on Spin-Transfer Torque (STT) Magnetic RAM, named as STT-PUF, is proposed as a key generation primitive for embedded computing systems. By comparing the resistances of STT-MRAM memory cells which are initialized to the same state, response bits can be generated by exploiting the inherent random mismatches between them. To enhance the robustness of response bits regeneration, an Automatic Write-Back (AWB) technique is proposed without compromising the resilience of STT-PUF against possible attacks. Simulations show that the proposed STT-PUF is able to produce raw response bits with uniqueness of 50.1% and entropy of 0.985 bit per cell. The worst-case Bit-Error Rate (BER) under varying operating conditions is 6.6 × 10-6.


IEEE Transactions on Very Large Scale Integration Systems | 2011

Design and Sensitivity Analysis of a New Current-Mode Sense Amplifier for Low-Power SRAM

Anh Tuan Do; Zhi Hui Kong; Kiat Seng Yeo; Jeremy Yung Shern Low

A new current-mode sense amplifier is presented. It extensively utilizes the cross-coupled inverters for both local and global sensing stages, hence achieving ultra low-power and ultra high-speed properties simultaneously. Its sensing delay and power consumption are almost independent of the bit- and data-line capacitances. Extensive post-layout simulations, based on an industry standard 1 V/65-nm CMOS technology, have verified that the new design outperforms other designs in comparison by at least 27% in terms of speed and 30% in terms of power consumption. Sensitivity analysis has proven that the new design offers the best reliability with the smallest standard deviation and bit-error-rate (BER). Four 32 × 32-bit SRAM macros have been used to validate the proposed design, in comparison with three other circuit topologies. The new design can operate at a maximum frequency of 1.25 GHz at 1 V supply voltage and a minimum supply voltage of 0.2 V. These attributes of the proposed circuit make it a wise choice for contemporary high-complexity systems where reliability and power consumption are of major concerns.


international symposium on circuits and systems | 2013

PCKGen: A Phase Change Memory based cryptographic key generator

Le Zhang; Zhi Hui Kong; Chip-Hong Chang

Physical Unclonable Function (PUF) is widely known as an effective countermeasure to withstand non-invasive computational attacks as well as invasive tempering attacks on trusted computing systems. However, vast majority of the PUFs reported to-date are defined by static Challenge-Response Pairs (CRPs) with inferior security. In this paper, we propose a novel design of dynamically reconfigurable PUF based on Phase Change Memory (PCM) technology to yield refreshed cryptographic keys whenever the need arises to achieve enhanced security. A dedicated circuit framework is also introduced to reinforce the diversity of the CRP sets and improve the stability of the proposed PUF. Extensive simulation results show that our proposed work promises a clean delineation from the security bottlenecks faced by the state-of-the-art PUF designs.


IEEE Transactions on Very Large Scale Integration Systems | 2013

A High Speed Low Power CAM With a Parity Bit and Power-Gated ML Sensing

Anh Tuan Do; Shoushun Chen; Zhi Hui Kong; Kiat Seng Yeo

Content addressable memory (CAM) offers high-speed search function in a single clock cycle. Due to its parallel match-line (ML) comparison, CAM is power-hungry. Thus, robust, high-speed and low-power ML sense amplifiers are highly sought-after in CAM designs. In this paper, we introduce a parity bit that leads to 39% sensing delay reduction at a cost of less than 1% area and power overhead. Furthermore, we propose an effective gated-power technique to reduce the peak and average power consumption and enhance the robustness of the design against process variations. A feedback loop is employed to auto-turn off the power supply to the comparison elements and hence reduce the average power consumption by 64%. The proposed design can work at a supply voltage down to 0.5 V.


IEEE Journal of Solid-state Circuits | 2014

A Monolithically Integrated Pressure/Oxygen/Temperature Sensing SoC for Multimodality Intracranial Neuromonitoring

Wai Pan Chan; Margarita Narducci; Yuan Gao; Ming-Yuan Cheng; Jia Hao Cheong; Arup K. George; Daw Don Cheam; Siew Chong Leong; Maria Ramona B. Damalerio; Ruiqi Lim; Ming-Ling Tsai; Abdur Rub Abdur Rahman; Mi Kyoung Park; Zhi Hui Kong; Rao Jai Prashanth; Minkyu Je

A fully integrated SoC for multimodality intracranial neuromonitoring is presented in this paper. Three sensors including a capacitive MEMS pressure sensor, an electrochemical oxygen sensor and a solid-state temperature sensor are integrated together in a single chip with their respective interface circuits. Chopper stabilization and dynamic element matching techniques are applied in sensor interface circuits to reduce circuit noise and offset. On-chip calibration is implemented for each sensor to compensate process variations. Measured sensitivity of the pressure, oxygen, and temperature sensors are 18.6 aF/mmHg, 194 pA/mmHg, and 2 mV/°C, respectively. Implemented in 0.18 m CMOS, the SoC occupies an area of 1.4 mm × 4 mm and consumes 166 μW DC power. A prototype catheter for intracranial pressure (ICP) monitoring has been implemented and the performance has been verified with ex vivo experiment.


Journal of Semiconductor Technology and Science | 2013

Impact Analysis of NBTI/PBTI on SRAM V MIN and Design Techniques for Improved SRAM V MIN

Tony Tae-Hyoung Kim; Zhi Hui Kong

Negative bias temperature instability (NBTI) and positive bias temperature instability (PBTI) are critical circuit reliability issues in highly scaled CMOS technologies. In this paper, we analyze the impacts of NBTI and PBTI on SRAM VMIN, and present a design solution for mitigating the impact of NBTI and PBTI on SRAM VMIN. Two different types of SRAM VMIN (SNM-limited VMIN and time-limited VMIN) are explained. Simulation results show that SNM-limited VMIN is more sensitive to NBTI while time-limited VMIN is more prone to suffer from PBTI effect. The proposed NBTI/PBTI-aware control of wordline pulse width and woldline voltage improves cell stability, and mitigates the VMIN degradation induced by NBTI/PBTI.


international symposium on circuits and systems | 2011

A low-power CAM with efficient power and delay trade-off

Anh Tuan Do; Shoushun Chen; Zhi Hui Kong; Kiat Seng Yeo

In a Content Addressable Memory (CAM) architecture, both the match-line (ML) sensing circuit and the priority encoder (PE) contribute significantly large delays during a compare cycle. Meanwhile the priority encoder consumes significantly less energy when compared to the sensing circuits, i.e. ∼1% of the overall energy consumption. Based on this observation, we propose the use of dual-supply voltages to trade-off the power and delay budget between the comparison and priority encoding circuits. In this work, the memory array and priority encoder is powered by a low and a high supply voltage, respectively. On top of this, a self-power-off ML sense amplifier is employed to reduce the voltage swing on the ML buses. Simulation results show a 76% dynamic power reduction as compared to the conventional design without sacrificing the overall speed.

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Chip-Hong Chang

Nanyang Technological University

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Kaixue Ma

University of Electronic Science and Technology of China

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Le Zhang

Nanyang Technological University

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Anh Tuan Do

Nanyang Technological University

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Arup K. George

Daegu Gyeongbuk Institute of Science and Technology

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Jiang-An Han

Nanyang Technological University

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Shoushun Chen

Nanyang Technological University

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Anh-Tuan Do

Nanyang Technological University

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