Le Zhang

Exploiting Process Variations and Programming Sensitivity of Phase Change Memory for Reconfigurable Physical Unclonable Functions

Physical unclonable function (PUF) leverages the immensely complex and irreproducible nature of physical structures to achieve device authentication and secret information storage. To enhance the security and robustness of conventional PUFs, reconfigurable physical unclonable functions (RPUFs) with dynamically refreshable challenge-response pairs (CRPs) have emerged recently. In this paper, we propose two novel physically reconfigurable PUF (P-RPUF) schemes that exploit the process parameter variability and programming sensitivity of phase change memory (PCM) for CRP reconfiguration and evaluation. The first proposed PCM-based P-RPUF scheme extracts its CRPs from the measurable differences of the PCM cell resistances programmed by randomly varying pulses. An imprecisely controlled regulator is used to protect the privacy of the CRP in case the configuration state of the RPUF is divulged. The second proposed PCM-based RPUF scheme produces the random response by counting the number of programming pulses required to make the cell resistance converge to a predetermined target value. The merging of CRP reconfiguration and evaluation overcomes the inherent vulnerability of P-RPUF devices to malicious prediction attacks by limiting the number of accessible CRPs between two consecutive reconfigurations to only one. Both schemes were experimentally evaluated on 180-nm PCM chips. The obtained results demonstrated their quality for refreshable key generation when appropriate fuzzy extractor algorithms are incorporated.

Highly reliable memory-based Physical Unclonable Function using Spin-Transfer Torque MRAM

In recent years, Physical Unclonable Function (PUF) based on the inimitable and unpredictable disorder of physical devices has emerged to address security issues related to cryptographic key generation. In this paper, a novel memory-based PUF based on Spin-Transfer Torque (STT) Magnetic RAM, named as STT-PUF, is proposed as a key generation primitive for embedded computing systems. By comparing the resistances of STT-MRAM memory cells which are initialized to the same state, response bits can be generated by exploiting the inherent random mismatches between them. To enhance the robustness of response bits regeneration, an Automatic Write-Back (AWB) technique is proposed without compromising the resilience of STT-PUF against possible attacks. Simulations show that the proposed STT-PUF is able to produce raw response bits with uniqueness of 50.1% and entropy of 0.985 bit per cell. The worst-case Bit-Error Rate (BER) under varying operating conditions is 6.6 × 10-6.

A Low-Power Hybrid RO PUF With Improved Thermal Stability for Lightweight Applications

Ring oscillator (RO)-based physical unclonable function (PUF) is resilient against noise impacts, but its response is susceptible to temperature variations. This paper presents a low-power and small footprint hybrid RO PUF with a very high temperature stability, which makes it an ideal candidate for lightweight applications. The negative temperature coefficient of the low-power subthreshold operation of current starved inverters is exploited to mitigate the variations of differential RO frequencies with temperature. The new architecture uses conspicuously simplified circuitries to generate and compare a large number of pairs of RO frequencies. The proposed nine-stage hybrid RO PUF was fabricated using global foundry 65-nm CMOS technology. The PUF occupies only 250 μm2 of chip area and consumes only 32.3 μW per challenge response pair at 1.2 V and 230 MHz. The measured average and worst-case reliability of its responses are 99.84% and 97.28%, respectively, over a wide range of temperature from -40 to 120 °C.

PCKGen: A Phase Change Memory based cryptographic key generator

Physical Unclonable Function (PUF) is widely known as an effective countermeasure to withstand non-invasive computational attacks as well as invasive tempering attacks on trusted computing systems. However, vast majority of the PUFs reported to-date are defined by static Challenge-Response Pairs (CRPs) with inferior security. In this paper, we propose a novel design of dynamically reconfigurable PUF based on Phase Change Memory (PCM) technology to yield refreshed cryptographic keys whenever the need arises to achieve enhanced security. A dedicated circuit framework is also introduced to reinforce the diversity of the CRP sets and improve the stability of the proposed PUF. Extensive simulation results show that our proposed work promises a clean delineation from the security bottlenecks faced by the state-of-the-art PUF designs.

CMOS Image Sensor Based Physical Unclonable Function for Coherent Sensor-Level Authentication

In the applications of biometric authentication and video surveillance, the image sensor is expected to provide certain degree of trust and resiliency. This paper presents a new low-cost CMOS image sensor based physical unclonable function (PUF) targeting a variety of security, privacy and trusted protocols that involves image sensor as a trusted entity. The proposed PUF exploits the intrinsic imperfection during the image sensor manufacturing process to generate unique and reliable digital signatures. The proposed differential readout stabilizes the response bits extracted from the random fixed pattern noises of selected pixel pairs determined by the applied challenge against supply voltage and temperature variations. The threshold of difference can be tightened to winnow out more unstable response bits from the challenge-response space offered by modern image sensors to enhance the reliability under harsher operating conditions and loosened to improve its resiliency against masquerade attacks in routine operating environment. The proposed design can be classified as a weak PUF which is resilient to modeling attacks, with direct access to its challenge-response pair restricted by the linear feedback shift register. Our experiments on the reset voltages extracted from a 64 × 64 image sensor fabricated in 180 nm 3.3 V CMOS technology demonstrated that robust and reliable challenge-response pairs can be generated with a uniqueness of 49.37% and a reliability of 99.80% under temperature variations of 15 ~ 115 °C and supply voltage variations of 3 ~ 3.6 V.

Feasibility study of emerging non-volatilememory based physical unclonable functions

The feasibility and quality of Memory-based Physical Unclonable Functions (MemPUFs) based on emerging Non-Volatile Memory (eNVM) technologies (Spin-Transfer Torque Magnetic Random Access Memory, Phase Change RAM, and Resistive RAM) are studied in this paper. MemPUFs using the three technologies were evaluated in terms of reliability, uniqueness and randomness using different sensing modes and under varying operating conditions. Our results show that eNVM based MemPUFs with differential sensing mode exhibit good randomness and reliability. As compared to conventional MemPUFs, eNVM based MemPUFs are better in terms of area cost.

Highly Reliable Spin-Transfer Torque Magnetic RAM-Based Physical Unclonable Function With Multi-Response-Bits Per Cell

Memory-based physical unclonable function (MemPUF) has gained tremendous popularity in the recent years to securely preserve secret information in computing systems. Most MemPUFs in the literature have unreliable bit generation and/or are incapable of generating more than one response-bit per cell. Hence, we propose a novel MemPUF exploiting the unique characteristics of spin-transfer torque magnetic RAM (STT-MRAM) that can overcome these issues. Bit generation in our STT-MRAM-based MemPUF is stabilized using a novel automatic write-back technique. In addition, the alterability of the magnetic tunneling junction state is exploited to expand the response-bit capacity per cell. Our analysis demonstrated the advantage of our scheme in reliability enhancement (bit-error rate from ~10-1 to ~10-6 in the worst case under varying conditions) and response-bit capacity per cell improvement (from 1 to 1.48 bit). In comparison with the conventional MemPUFs, our approach is also better in terms of the average chip area and energy for producing a response-bit.

Optimizating Emerging Nonvolatile Memories for Dual-Mode Applications: Data Storage and Key Generator

Memory-based physical unclonable functions (PUFs) have been studied and developed as powerful primitives to generate device-specific random keys, which can be used for various security applications. However, the existing memory-based PUFs need to safely buffer the data bits in the memory before it is used to produce random bits, resulting in additional area/energy consumption and potential data security issues. In this paper, we propose a new memory-based PUF that exploits the nonvolatility and random variability of emerging memory technologies to produce random bits. Unlike conventional implementations, the random bit generation process of our proposed PUF does not disturb the data bits already stored in the memory. To satisfy the quality requirements for both memory and PUF applications, we also propose a general method to find the optimal design point of emerging nonvolatile memory (eNVM)-based PUF. An illustrative design using spin-transfer torque magnetic RAM exhibits desirable results using our method. Compared to the conventional types of memory-based PUFs, eNVM-based PUFs features enhanced security as cryptographic primitives and lower area and energy cost as data storage.

A Retrospective and a Look Forward: Fifteen Years of Physical Unclonable Function Advancement

Severe security threats and alerts associated with the use of smart devices have drawn increasing public attentions since the inception of Internet of Things (IoT) in late 1990s. IoT devices pose a unique and challenging scenario for hardware security because of their ubiquity and area-power cost constraints. Traditional software techniques and established cryptographic methods are either inadequate or impractical due to the computational capacity and permanent storage required to process and maintain the privacy of the secret key. In this light, Physical Unclonable Function (PUF), a burgeoning technology rooted in 2002, comes in handy as an inexpensive and yet effective security primitive to overcome the forgery tagging problem by its radically different way of generating and processing secret keys in security hardware. PUFs are hardware structures or functions designed to utilize the physical disorder of random nanoscale phenomena for the derivation of keys without having to keep any security-critical information explicitly in hardware. As we usher PUF into its 15th anniversary in 2017, it is timely to review the advancements of PUF over the past decade. Specifically, this survey addresses three fundamental questions which are at all times relevant in the security arms race. These questions are: how secure can a PUF be? what differences have PUFs brought to security applications and how do these differences impact existing security protocols? how is hardware implementation research influenced by the opportunities of nanotechnologies and new discoveries of disorder-based physical phenomena? It is hoped that this retrospective study of problems and solutions encountered in the journey of developing PUF to its current state will foreshadow the challenges and opportunities for future sustainable activities in the field.

CMOS image sensor based physical unclonable function for smart phone security applications

Recent years have seen the rapid growing market of smart phones. At the same time, pirated, knockoff or refurnished phones have also flooded into the worldwide market and inflicted great loss on the mobile phone industry. Existing anti-counterfeiting, authentification and identification methods, which rely on the verification of the IDs stored in the phone memory, are vulnerable to attack. This paper presents a new CMOS image sensor based physical unclonable function (PUF) for smart phone identification and anti-counterfeiting. The proposed PUF exploits the intrinsic imperfection during the image sensor manufacturing process to generate the unique signatures. With the proposed differential readout algorithm for the pixels of the fixed pattern noise, the effects of power supply and temperature variations are suppressed. Simulations on a typical 3-T CMOS image sensor in GF 65nm CMOS technology show that the proposed PUF can generate robust and reliable challenge-response pairs with an uniqueness of 50.12% and a reliability of 100% at temperature varying from 0°C to 100°C and supply voltage variation of ±16.7%.