Zoltan Manyoki | Researchain

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Archive | 2001

Integrated semiconductor memory with redundant units for memory cells

Thomas Böhm; Heinz Hönigschmid; Stefan Lammers; Zoltan Manyoki

Archive | 2001

Integrated memory having a bit line reference voltage, and a method for producing the bit line reference voltage

Thomas Böhm; Zoltan Manyoki; Robert Esterl; Thomas Röhr

Archive | 2001

Chip ID register configuration

Stefan Lammers; Zoltan Manyoki

Archive | 2001

On-chip test circuit to control the succession of exposure masks

Zoltan Manyoki

Archive | 2000

Integrated memory having memory cells and reference cells, and corresponding operating method

Thomas Böhm; Georg Braun; Heinz Hönigschmid; Zoltan Manyoki; Thomas Röhr

Archive | 2003

METHOD FOR MANUFACTURING AN INTEGRATED CIRCUIT HAVING A PARTICULAR FUNCTIONALITY REQUIRED BY A USER OF THE CIRCUIT AND HAVING FIRST STRUCTURES TO PRODUCE THE PARTICULAR FUNCTIONALITY AND SECOND STRUCTURES

Zoltan Manyoki

Archive | 2001

Integrated memory having memory cells and reference cells, and operating method for such a memory

Thomas Böhm; Heinz Hönigschmid; Thomas Röhr; Georg Braun; Zoltan Manyoki

Archive | 2000

Integrated memory having sense amplifiers disposed on opposite sides of a cell array

Zoltan Manyoki; Thomas Röhr; Thomas Böhm

Archive | 2000

Integrated memory having a reference potential and operating method for such a memory

Tobias Schlager; Zoltan Manyoki; Robert Esterl

Archive | 1999

Semiconductor module for burn-in test configuration

Norbert Wirth; Eric Cordes; Zoltan Manyoki; Dominique Savignac

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