Zoltan Manyoki

Integrated semiconductor memory with redundant units for memory cells

Integrated memory having a bit line reference voltage, and a method for producing the bit line reference voltage

Chip ID register configuration

On-chip test circuit to control the succession of exposure masks

Integrated memory having memory cells and reference cells, and corresponding operating method

METHOD FOR MANUFACTURING AN INTEGRATED CIRCUIT HAVING A PARTICULAR FUNCTIONALITY REQUIRED BY A USER OF THE CIRCUIT AND HAVING FIRST STRUCTURES TO PRODUCE THE PARTICULAR FUNCTIONALITY AND SECOND STRUCTURES

Integrated memory having memory cells and reference cells, and operating method for such a memory

Integrated memory having sense amplifiers disposed on opposite sides of a cell array

Integrated memory having a reference potential and operating method for such a memory

Semiconductor module for burn-in test configuration