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Dive into the research topics where Adam J. Courchesne is active.

Publication


Featured researches published by Adam J. Courchesne.


Archive | 2009

Dynamically reconfigurable self-monitoring circuit

Adam J. Courchesne; Johnathan P. Ebbers; Kenneth J. Goodnow; Suzanne Granato; Eze Kamanu; Kyle E. Schneider; Peter A. Twombly


Archive | 2005

Apparatus and method for implementing an integrated circuit IP core library architecture

Serafino Bueti; Adam J. Courchesne; Kenneth J. Goodnow; Gregory J. Mann; Stanley B. Stanski


Archive | 2005

Method and apparatus for resource-based thread allocation in a multiprocessor computer system

Adam J. Courchesne; Francis A. Kampf; Gregory J. Mann; Jason M. Norman; Stanley B. Stanski


Archive | 2004

METHOD AND APPARATUS FOR SERVICING THREADS WITHIN A MULTI-PROCESSOR SYSTEM

Adam J. Courchesne; Kenneth J. Goodnow; Gregory J. Mann; Jason M. Norman; Stanley B. Stanski; Scott T. Vento


Archive | 2008

DESIGN STRUCTURE FOR CHIP IDENTIFICATION SYSTEM

Serafino Bueti; Adam J. Courchesne; Kenneth J. Goodnow; Todd E. Leonard; Peter A. Sandon; Peter A. Twombly; Charles S. Woodruff


Archive | 2008

ADAPTIVE LOSSLESS DATA COMPRESSION METHOD FOR COMPRESSION OF COLOR IMAGE DATA

Adam J. Courchesne; Francis A. Kampf


Archive | 2004

Communication systems and methods using microelectronics power distribution network

Serafino Bueti; Adam J. Courchesne; Kai D. Feng; Kenneth J. Goodnow; Gregory J. Mann; Scott T. Vento


Archive | 2006

A METHOD AND APPARATUS FOR TRANSFERRING DATA BETWEEN CORES IN AN INTEGRATED CIRCUIT

Adam J. Courchesne; Kenneth J. Goodnow; W. Harding; David W. Milton; Jason M. Norman; Clarence R. Ogilvie; Jason E. Rotella; Paul M. Schanely; Sebastian T. Ventrone


Archive | 2005

METHOD AND APPARATUS FOR MONITORING INTEGRATED CIRCUIT TEMPERATURE THROUGH DETERMINISTIC PATH DELAYS

Serafino Bueti; Adam J. Courchesne; Kenneth J. Goodnow; Jason M. Norman; Stanley B. Stanski; Scott T. Vento


Archive | 2007

On-chip identification circuit incorporating pairs of conductors, each having an essentially random chance of being shorted together as a result of process variations

Serafino Bueti; Adam J. Courchesne; Kenneth J. Goodnow; Todd E. Leonard; Peter A. Sandon; Peter A. Twombly; Charles S. Woodruff

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