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Dive into the research topics where Adam Purkrt is active.

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Featured researches published by Adam Purkrt.


Applied Physics Letters | 2011

Nanostructured three-dimensional thin film silicon solar cells with very high efficiency potential

M. Vanecek; Oleg Babchenko; Adam Purkrt; Jakub Holovsky; Neda Neykova; A. Poruba; Zdenek Remes; J. Meier; U. Kroll

We report on the experimental realization of amorphous/microcrystalline silicon tandem solar cells (Micromorph) based on our three-dimensional design. An enhancement is reached in the short-circuit current by 40%, with an excellent open-circuit voltage of 1.41V and a fill factor of 72%. We have used nanoholes or microholes dry etched into the ZnO front contact layer. Monte Carlo optical modeling shows that stable efficiency of amorphous silicon p-i-n solar cells in over 12% range is possible. For the Micromorph cells, efficiency over 15% with the thickness of amorphous Si below 200 nm and of microcrystalline Si around 500 nm is possible.


Nanoscale Research Letters | 2011

Synthesis, structure, and opto-electronic properties of organic-based nanoscale heterojunctions

Bohuslav Rezek; Jan Čermák; Alexander Kromka; Martin Ledinský; Pavel Hubík; J. Mareš; Adam Purkrt; Vĕra Cimrová; A. Fejfar; J. Kočka

Enormous research effort has been put into optimizing organic-based opto-electronic systems for efficient generation of free charge carriers. This optimization is mainly due to typically high dissociation energy (0.1-1 eV) and short diffusion length (10 nm) of excitons in organic materials. Inherently, interplay of microscopic structural, chemical, and opto-electronic properties plays crucial role. We show that employing and combining advanced scanning probe techniques can provide us significant insight into the correlation of these properties. By adjusting parameters of contact- and tapping-mode atomic force microscopy (AFM), we perform morphologic and mechanical characterizations (nanoshaving) of organic layers, measure their electrical conductivity by current-sensing AFM, and deduce work functions and surface photovoltage (SPV) effects by Kelvin force microscopy using high spatial resolution. These data are further correlated with local material composition detected using micro-Raman spectroscopy and with other electronic transport data. We demonstrate benefits of this multi-dimensional characterizations on (i) bulk heterojunction of fully organic composite films, indicating differences in blend quality and component segregation leading to local shunts of photovoltaic cell, and (ii) thin-film heterojunction of polypyrrole (PPy) electropolymerized on hydrogen-terminated diamond, indicating covalent bonding and transfer of charge carriers from PPy to diamond.


MRS Proceedings | 2008

Experimental Limits of Light Capture in Thin Film Silicon Devices

A. Poruba; Petr Klapetek; Jakub Holovsky; Adam Purkrt; M. Vanecek

New approach for the determination of the angular distribution of the scattered light at nano-rough surfaces/interfaces from AFM (Atomic Force Microscopy) data is presented. Calculation comes from modeling the electromagnetic field in the tight vicinity of the nano-rough surface by complex solution of Maxwells equations and subsequent near field to far field transform. This method is demonstrated for four types of transparent conductive oxides (with rough free surfaces) deposited on glass substrates. As a result we have the amount and angular distribution of the scattered light „observed” in both transmission and reflection. Moreover calculation can be done for real sample dimensions (to compare the results with the measurement of the angular distribution function using LED laser) or for a semi-infinite sample which suppresses the interference effects and thus such distribution functions can be used as an input parameter for our 3-dimensional optical model CELL for thin film silicon solar cell modeling. In the second part of this contribution we describe our experiment of thin film silicon solar cell characterization by Light Beam Induced Current (LBIC). This measurement done for laboratory solar cell structures reveals the light scattering and light trapping properties of the multilayer stack on a glass substrate. We suggest the test structure for the direct back reflector quality comparison and thus also for its optimization.


ieee world conference on photovoltaic energy conference | 2006

Fast Quantum Efficiency Measurement and Characterization of Different Thin Film Solar Cells by Fourier Transform Photocurrent Spectroscopy

A. Poruba; L. Hodakova; Adam Purkrt; Jakub Holovsky; M. Vanecek

Fourier-transform Photocurrent Spectroscopy (FTPS) was introduced four years ago [1] as a method for fast and very sensitive evaluation of the spectral dependence of the optical absorption coefficient of photoconductive thin films and recently also for the quality assessment of thin film silicon solar cells [2]. In this contribution we refer about the FTPS characterization of different thin film solar cells (amorphous silicon, microcrystalline silicon, micromorph tandem, polymer solar cells) with the main target of a fast quantum efficiency (QE) measurement. Further, we study the possibility of the FTPS-QE measurement of single cell incorporated in the solar module when only the module terminals can be used for contacting. The FTPS measurement has proved to be very fast (time scale of seconds), enabling a quick verification of quantum efficiency and subgap absorption measurement of absorber of different thin film solar cells


Asia-Pacific Conference on Semiconducting Silicides and Related Materials (APAC Silicide 2016) | 2017

In-situ formation of magnesium silicide nanoparticles on the surface of the hydrogenated silicon films

Vlastimil Pic; Martin Ledinský; Adam Purkrt; Zdenek Remes; Jiri Stuchlik

The magnesium silicide nanoparticles were formed on the surface of hydrogenated silicon thin films by thermal evaporation, annealing and hydrogen plasma treatment. The high reactivity of silicon and magnesium leads to the self-formation of magnesium silicide nanoparticles (NPs). The reaction is stimulated in-situ by the low pressure hydrogen plasma. The presence of Mg2Si NPs was confirmed by SEM and Raman spectroscopy. The photothermal deflection spectroscopy (PDS) shows the enhanced optical absorption in the near infrared spectrum. The diode structures with insitu embedded Mg2Si NPs were characterized by the volt-ampere measurements in dark and under AM1.5 spectrum.


MRS Proceedings | 2009

Comparison Between Chemical and Plasmatic Treatment of Seeding Layer for Patterned Diamond Growth

Alexander Kromka; Oleg Babchenko; Bohuslav Rezek; Karel Hruska; Adam Purkrt; Zdenek Remes

We employ UV photolithographic and electron beam lithographic patterning of diamond seeding layer on SiO 2/Si substrates for the selective growth of micrometer and sub-micrometer diamond patterns. Using bottom-up strategy, thin diamond channels (470 nm in width) are directly grown. Differences between wet chemical and plasma treatment on the patterned diamond growth are studied. We find that the density of parasitic diamond crystals (outside predefined patterns) is lowered for gas mixture CF 4/O 2 plasma than for rich O2 plasma. After CF 4/O 2 plasma treatment, the density of parasitic crystals is 10 6 cm -2 which is comparable to the wet chemical treatment. Introducing sandwich-like structure, i.e. photoresist-seeding layer-photoresist, and its treatment (lift-off and CF 4/O 2 plasma) further reduces the density of parasitic crystals down to 10 5 cm -2 . The advantage of this novel treatment is short processing time, simplicity, and minimal damage of the substrate surface.


MRS Proceedings | 2009

Optical Monitoring of Nanocrystalline Diamond with Reduced Non-diamond Contamination

Zdenek Remes; Alexander Kromka; Tibor Izak; Adam Purkrt; M. Vanecek

Previously, the nanocrystalline grain boundaries were often contaminated by the “non-diamond phase” with the photo-ionization threshold at 0.8 eV. Here, we present the optical spectra of the NCD films grown on transparent substrates by the microwave plasma enhanced chemical vapor deposition (CVD) at a relatively low temperature below 600°C. The transmittance and reflectance spectra are useful to evaluate the film thickness, the surface roughness and the index of refraction. The direct measurement of the optical absorptance by the laser calorimetry and photothermal deflection spectroscopy (PDS) provides high sensitive methods to measure the weak optical absorption of thin films with rough surface. The optical measurements indicate the high optical transparency of our standard, nominally undoped 0.2-0.3 μm thick NCD film with low non-diamond content. However, the optical scattering is rather high in UV and needs to be reduced.


Journal of Non-crystalline Solids | 2008

Comparison of photocurrent spectra measured by FTPS and CPM for amorphous silicon layers and solar cells

Jakub Holovský; A. Poruba; Adam Purkrt; Zdeněk Remeš; M. Vaněček


Journal of Non-crystalline Solids | 2008

Advanced optical characterization of disordered semiconductors by Fourier transform photocurrent spectroscopy

A. Poruba; Jakub Holovsky; Adam Purkrt; M. Vanecek


Nanoscale Research Letters | 2016

Comparison of Silicon Nanocrystals Prepared by Two Fundamentally Different Methods

Ondřej Cibulka; Christoph Vorkötter; Adam Purkrt; Jakub Holovský; Jan Benedikt; Kateřina Herynková

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A. Poruba

Academy of Sciences of the Czech Republic

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M. Vanecek

Academy of Sciences of the Czech Republic

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Jakub Holovsky

Academy of Sciences of the Czech Republic

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Zdenek Remes

Academy of Sciences of the Czech Republic

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Alexander Kromka

Academy of Sciences of the Czech Republic

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Bohuslav Rezek

Czech Technical University in Prague

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Jakub Holovský

Academy of Sciences of the Czech Republic

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Martin Ledinský

Academy of Sciences of the Czech Republic

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Oleg Babchenko

Academy of Sciences of the Czech Republic

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Tibor Izak

Academy of Sciences of the Czech Republic

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