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Publication
Featured researches published by Amanda E. Mikhail.
electronic components and technology conference | 2005
L. Brodsky; Amanda E. Mikhail; Mark D. Plucinski
Accurate characterization of the resistance to contact normal force relationship for a given contact system is critical in determining the reliability of that system. Since little is known of a contact system in its early development, sampling techniques are required to characterize resistance to normal force relationship. Though most models address relationships between mean values of resistance and normal force, the parameter of interest is in actuality the highest allowable resistance for a given normal force. Techniques are offered to assist the examiner in defining appropriate sample sizes to characterize the variance in contact resistance, and to detect differences in contact resistance at various normal forces. In addition, tradeoffs are discussed related to the selection of sample size with respect to sensitivity gained or lost as well as the likelihood of falsely characterizing a relationship. Finally, a method for modeling the entire resistance vs. normal force curve is offered through the collection of statistics acquired via sampling techniques.
Archive | 2006
John L. Colbert; John S. Corbin; Jason R. Eagle; Roger Duane Hamilton; Amanda E. Mikhail; Arvind K. Sinha; Terry Leo Sobotta
Archive | 2008
Brian Samuel Beaman; Joseph Kuczynski; Theron L. Lewis; Amanda E. Mikhail; Arvind K. Sinha
Archive | 2007
William L. Brodsky; John L. Colbert; Roger Duane Hamilton; Amanda E. Mikhail; Mark D. Plucinski
Archive | 2005
John L. Colbert; Eric A. Eckberg; Roger Duane Hamilton; Mark Kenneth Hoffmeyer; Amanda E. Mikhail; Arvind K. Sinha
Archive | 2008
John L. Colbert; Eric A. Eckberg; Roger Duane Hamilton; Mark Kenneth Hoffmeyer; Amanda E. Mikhail; Arvind K. Sinha
Archive | 2006
Jessica Rose Berens; Don Allan Gilliland; Amanda E. Mikhail
Archive | 2005
William L. Brodsky; Amanda E. Mikhail
Archive | 2002
Amanda E. Mikhail; Ray Clement Laning; Christopher Michael Marroquin; Scott A. Shurson; Brian Joseph Stanczyk
Archive | 2015
Mark Kenneth Hoffmeyer; Amanda E. Mikhail; Arvind K. Sinha