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Dive into the research topics where Asahiro Kuni is active.

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Featured researches published by Asahiro Kuni.


Applications of Digital Image Processing VI | 1984

Pattern Inspection Techniques for SEM Image

Toshimitsu Hamada; Asahiro Kuni; Kazushi Yoshimura; Hiroshi Makihira

We have developed pattern inspection techniques for Integrated Circuit elements which use an SEMI (Scanning Electron Microscope). In this paper we will discuss the transformation of low SP1 ratio SEM image signals into binary values, detection techniques using the SEM to detect patterns on insulating materials, and detection algorithms for defects.


Archive | 2004

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

Takashi Hiroi; Maki Tanaka; Masahiro Watanabe; Asahiro Kuni; Yukio Matsuyama; Yuji Takagi; Hiroyuki Shinada; Mari Nozoe; Aritoshi Sugimoto


Archive | 2007

Pattern inspection method and apparatus

Takashi Hiroi; Masahiro Watanabe; Chie Shishido; Aritoshi Sugimoto; Maki Tanaka; Hiroshi Miyai; Asahiro Kuni; Yasuhiko Nara


Archive | 1982

Method of inspecting microscopic surface defects

Kazuo Yamaguchi; Asahiro Kuni; Nobuyuki Akiyama; Juro Endo


Archive | 1986

Method and apparatus for alignment

Akira Inagaki; Yukio Kembo; Ryuichi Funatsu; Asahiro Kuni; Keiichi Okamoto; Yoshihiro Komeyama


Archive | 1977

Method and apparatus for reduction-projection type mask alignment

Mituyoshi Koizumi; Nobuyuki Akiyama; Asahiro Kuni


Archive | 2000

Method and system for inspecting a pattern

Takashi Hiroi; Maki Tanaka; Masahiro Watanabe; Asahiro Kuni; Hiroyuki Shinada; Mari Nozoe; Aritoshi Sugimoto; Chie Shishido


Archive | 2000

Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus

Norimasa Nishimura; Akira Shimase; Masahiro Watanabe; Asahiro Kuni; Taku Ninomiya; Hiroshi Miyai


Archive | 1998

Visual inspection method and apparatus therefor

Yukio Matsuyama; Yuji Takagi; Takashi Hiroi; Maki Tanaka; Asahiro Kuni; Junzou Azuma; Shunji Maeda; Chie Shishido


Archive | 1978

Method and apparatus for detecting positions of chips on a semiconductor wafer

Yukio Kembo; Asahiro Kuni; Hiroshi Makihira

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