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Featured researches published by Atsushi Takane.


Magnetic Resonance Imaging | 1995

Illuminating method and apparatus in nuclear magnetic resonance inspection

Munetaka Tsuda; Atsushi Takane; Masao Yabusaki

In an illuminating method for nuclear magnetic resonance inspection, the progress of inspection is visually informed to a patient so that the patient can easily and surely keep himself or herself at rest during a scanning period, thereby improving accuracy of the inspection and allowing the patient to feel more at ease. Control signals indicating the progress of inspection are supplied from a control circuit to an illumination control circuit. The illumination control circuit changes, based on the control signals, the intensity, color, etc. of light emitted from a magnet cavity illuminating panel in accordance with the progress of inspection. It is thus possible to visually inform the patient of the progress of inspection, improve accuracy of the inspection, and illuminate a magnetic field generating space for suppressing a feeling of uneasiness felt by the patient.


Magnetic Resonance Imaging | 1995

Magnetic resonance imaging method and apparatus for imaging a fluid portion in a body

Atsushi Takane; Munetaka Tsuda; Hideaki Koizumi

Radio frequency pulses are repeatedly applied to a sample including a fluid portion positioned in a static magnetic field, so that spins of the sample are put into the steady-state free precession state so as to generate an FID signal just after the radio frequency pulse and generate a time-reversed FID signal just before the next radio frequency pulse. Both of the signals generated thus are detected and are subjected to image reconstruction process to image the fluid portion of the sample.


Archive | 2003

Semiconductor inspection system

Atsushi Takane; Haruo Yoda; Shoji Yoshida; Mitsuji Ikeda; Yasuhiko Ozawa


Archive | 2000

Image-formation apparatus using charged particle beams under various focus conditions

Atsushi Takane; Haruo Yoda; Hideo Todokoro; Fumio Mizuno; Shoji Yoshida; Mitsuji Ikeda; Mitsugu Sato; Makoto Ezumi


Archive | 2006

Charged particle beam equipment

Hiromi Inada; Hiroyuki Tanaka; Shunichi Watanabe; Shigeto Isakozawa; Mitsugu Sato; Atsushi Takane; Satoshi Yamaguchi


Archive | 2008

Method of forming a sample image and charged particle beam apparatus

Mitsugu Sato; Atsushi Takane; Takashi Iizumi; Tadashi Otaka; Hideo Todokoro; Satoru Yamaguchi; Kazutaka Nimura


Archive | 2002

Charged particle beam alignment method and charged particle beam apparatus

Mitsugu Sato; Tadashi Otaka; Makoto Ezumi; Atsushi Takane; Shoji Yoshida; Satoru Yamaguchi; Yasuhiko Ozawa


Archive | 2002

Image evaluation method and microscope

Tohru Ishitani; Mitsugu Sato; Hideo Todokoro; Tadashi Otaka; Takashi Iizumi; Atsushi Takane


Archive | 2004

Scanning electron microscope and sample observing method using it

Shuichi Takeuchi; Mine Nakagawa; Mitsugu Sato; Atsushi Takane; Kazutaka Nimura


Archive | 2005

Pattern matching apparatus and scanning electron microscope using the same

Yasutaka Toyoda; Mitsuji Ikeda; Atsushi Takane

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