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Latest external collaboration on country level. Dive into details by clicking on the dots.

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Dive into the research topics where Ayako Sato is active.

Publication


Featured researches published by Ayako Sato.


Archive | 2007

Memory device, memory controller and memory system

Tomohiro Kawakubo; Syusaku Yamaguchi; Hitoshi Ikeda; Toshiya Uchida; Hiroyuki Kobayashi; Tatsuya Kanda; Yoshinobu Yamamoto; Satoru Shirakawa; Tetsuo Miyamoto; Tatsushi Otsuka; Hidenaga Takahashi; Masanori Kurita; Shinnosuke Kamata; Ayako Sato


Archive | 2011

MULTI-PORT MEMORY BASED ON DRAM CORE

Yasurou Matsuzaki; Takaaki Suzuki; Masafumi Yamazaki; Kenichi Kawasaki; Shinnosuke Kamata; Ayako Sato; Masato Matsumiya


Archive | 2002

DRAM having SRAM equivalent interface

Ayako Sato; Masato Matsumiya


Archive | 2002

DRAM operating like SRAM

Toshiya Miyo; Toshikazu Nakamura; Satoshi Eto; Ayako Sato; Masato Matsumiya


Archive | 2006

Semiconductor memory device for storing data in memory cells as complementary information

Ayako Sato; Masato Matsumiya; Satoshi Eto


Archive | 2002

Test method for semiconductor memory circuit

Masafumi Yamazaki; Takaaki Suzuki; Toshikazu Nakamura; Satoshi Eto; Toshiya Miyo; Ayako Sato; Takayuki Yoneda; Noriko Kawamura


Archive | 2007

Storage device, memory controller and memory system

Tomohiro Kawakubo; Syusaku Yamaguchi; Hitoshi Ikeda; Toshiya Uchida; Hiroyuki Kobayashi; Tatsuya Kanda; Yoshinobu Yamamoto; Satoru Shirakawa; Tetsuo Miyamoto; Tatsushi Otsuka; Hidenaga Takahashi; Masanori Kurita; Shinnosuke Kamata; Ayako Sato


Archive | 2007

Speichervorrichtung, Speichersteuerung und Speichersystem Memory device, memory controller and memory system

Takahiko Sato; Toshiya Uchida; Tatsuya Kanda; Tetsuo Miyamoto; Satoru Shirakawa; Yoshinobu Yamamoto; Tatsushi Otsuka; Hidenaga Takahashi; Masanori Kurita; Shinnosuke Kamata; Ayako Sato


Archive | 2002

Testverfahren für Halbleiter-Speicherschaltung

Masafumi Yamazaki; Takaaki Suzuki; Toshikazu Nakamura; Satoshi Eto; Toshiya Miyo; Ayako Sato; Takayuki Yoneda; Noriko Kawamura


Archive | 2002

Testverfahren für Halbleiter-Speicherschaltung Test method for the semiconductor memory circuit

Masafumi Yamazaki; Takaaki Suzuki; Toshikazu Nakamura; Satoshi Eto; Toshiya Miyo; Ayako Sato; Takayuki Yoneda; Noriko Kawamura

Collaboration


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