B. A. Gribkov
Russian Academy of Sciences
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Featured researches published by B. A. Gribkov.
Physical Review B | 2010
V. L. Mironov; O. L. Ermolaeva; S. A. Gusev; A. Yu. Klimov; V. V. Rogov; B. A. Gribkov; O. G. Udalov; A. A. Fraerman; R. Marsh; R. Shaikhaidarov; V. T. Petrashov
We report on results of computer micromodelling of anti-vortex states in asymmetrical cross-like ferromagnetic nanostructures and their practical realization. The arrays of cobalt crosses with 1 mkm branches, 100 nm widths of the branches and 40 nm thicknesses were fabricated using e-beam lithography and ion etching. Each branch of the cross was tapered at one end and bulbous at the other. The stable formation of anti-vortex magnetic states in these nanostructures during magnetization reversal was demonstrated experimentally using magnetic force microscopy.
Journal of Applied Physics | 2009
V. L. Mironov; B. A. Gribkov; S. N. Vdovichev; S. A. Gusev; A. A. Fraerman; O. L. Ermolaeva; A. B. Shubin; A. M. Alexeev; P. A. Zhdan; C. Binns
We report on the results of a magnetic force microscopy investigation of remagnetization processes in arrays of CoPt nanodisks with diameters of 35 and 200 nm and a thickness of 9.8 nm fabricated by e-beam lithography and ion etching. The controllable magnetization reversal of individual CoPt nanodisks by the magnetic force microscope (MFM) tip-induced magnetic field was demonstrated. We observed experimentally two essentially different processes of tip-induced remagnetization. Magnetization reversal of 200 nm disks was observed when the probe moved across the particle while in case of 35 nm nanodisks one-touch remagnetization was realized. Micromagnetic modeling based on the Landau–Lifshitz–Gilbert (LLG) equation demonstrated that the tip-induced magnetization reversal occurs through the essentially inhomogeneous states. Computer simulations confirmed that in case of 200 nm disks the mechanism of embryo nucleation with reversed magnetization and further dynamic propagation following the probe moving across the particle was realized. On the other hand one-touch remagnetization of 35 nm disks occurs through the inhomogeneous vortexlike state. Micromagnetic LLG simulations showed that magnetization reversal in an inhomogeneous MFM probe field has a lower energy barrier in comparison with the mechanism of coherent rotation, which takes place in a homogeneous external magnetic field.We report on the results of a magnetic force microscopy investigation of remagnetization processes in arrays of CoPt nanodisks with diameters of 35 and 200 nm and a thickness of 9.8 nm fabricated by e-beam lithography and ion etching. The controllable magnetization reversal of individual CoPt nanodisks by the magnetic force microscope (MFM) tip-induced magnetic field was demonstrated. We observed experimentally two essentially different processes of tip-induced remagnetization. Magnetization reversal of 200 nm disks was observed when the probe moved across the particle while in case of 35 nm nanodisks one-touch remagnetization was realized. Micromagnetic modeling based on the Landau–Lifshitz–Gilbert (LLG) equation demonstrated that the tip-induced magnetization reversal occurs through the essentially inhomogeneous states. Computer simulations confirmed that in case of 200 nm disks the mechanism of embryo nucleation with reversed magnetization and further dynamic propagation following the probe moving acro...
Journal of Applied Physics | 2008
A. A. Fraerman; B. A. Gribkov; S. A. Gusev; A. Yu. Klimov; V. L. Mironov; D. S. Nikitushkin; V. V. Rogov; S. N. Vdovichev; Björgvin Hjörvarsson; H. Zabel
We have used magnetic force microscopy (MFM) to investigate noncollinear helical states in multilayer nanomagnets, consisting of a stack of single domain ferromagnetic disks separated by insulating nonmagnetic spacers. The nanomagnets were fabricated from a [Co∕Si]×3 multilayer thin film structure by electron beam lithography and ion beam etching. The structural parameters (Co layer and spacer thicknesses) were optimized to obtain a clear spiral signature in the MFM contrast, taking into account the magnetostatic interaction between the layers. MFM contrast corresponding to the helical states with different helicities was observed for the optimized structure with Co layer thicknesses of 16, 11, and 8nm, and with 3nm Si spacer thickness.
Bulletin of The Russian Academy of Sciences: Physics | 2011
M. M. Barysheva; Yu. A. Vainer; B. A. Gribkov; M. V. Zorina; A. E. Pestov; D. N. Rogachev; N. N. Salashchenko; N. I. Chkhalo
The abilities of standard methods for rough surface investigation are analyzed in case of supersmooth substrates for multilayered X-ray optics. The X-ray specular reflection technique is shown to be the most adequate one. X-ray diffuse scattering and AFM can be applied only in a case of PSD-function calculation and approximation over the entire spectrum range of spatial frequencies.
Applied Physics Letters | 2009
D. Y. Vodolazov; B. A. Gribkov; A. Yu. Klimov; V. V. Rogov; S. N. Vdovichev
We measured the critical current of the bilayer Nb/Co in the applied magnetic field. When the magnetic field was tilted to the axis which was perpendicular to the plane of the bilayer we observed a large difference in critical currents flowing in opposite directions. We found that the largest critical current of the bilayer exceeded the critical current of the superconductor without Co layer in a wide range of the tilted magnetic fields. The theory which takes into account the surface barrier effect for vortex entry and magnetic field of the magnetic layer gave a quantitative explanation of our experimental results.
Bulletin of The Russian Academy of Sciences: Physics | 2012
M. M. Barysheva; Yu. A. Vainer; B. A. Gribkov; M. V. Zorina; A. E. Pestov; N. N. Salashchenko; R. A. Khramkov; N. I. Chkhalo
The behavior of roughness on surfaces of Cr/Sc multilayer structure, crystalline silicon [100], and fused quartz upon ion beam etching in the region of middle and high frequencies of the spatial spectrum (10−2–102 μm−1) is studied. The possibility of keeping surface roughness at level σ ∼ 0.3 nm upon etching by Ar atoms/ions to depths of up to 10 μm is demonstrated.
Jetp Letters | 2004
S. N. Vdovichev; B. A. Gribkov; S. A. Gusev; E. V. Il'ichev; A. Yu. Klimov; Yu. N. Nozdrin; Georgy L. Pakhomov; V. V. Rogov; R. Stolz; A. A. Fraerman
The effect of a system of ferromagnetic particles on the field-dependent critical current of a Josephson junction is experimentally studied for junctions of different geometries. For edge junctions, the effect of commensurability between the periodic magnetic field of the particles and the Josephson vortex lattice is observed. The effect manifests itself in additional maxima of the field-dependent critical current. For overlap junctions, giant (greater than sixfold) variations of the maximum critical current are observed depending on the magnetic state of the particles. The changes in the “Fraunhofer” pattern of the overlaped Josephson junctions are attributed to the formation of Abrikosov vortices due to the effect of uniformly magnetized particles. The effects revealed in the experiments can be used to analyze the inhomogeneous magnetic field of a system of submicron particles and to control the transport properties of Josephson junctions.
Physics of Metals and Metallography | 2010
V. L. Mironov; A. A. Fraerman; B. A. Gribkov; O. L. Ermolayeva; A. Yu. Klimov; S. A. Gusev; I. M. Nefedov; I. A. Shereshevskii
The work presents a survey of the results of studies of the processes of magnetization reversal of ferromagnetic nanoparticles under the action of the field of a magnetic force microscope probe.
Journal of Applied Physics | 2008
V. L. Mironov; O. G. Udalov; B. A. Gribkov; A. A. Fraerman
Theoretical and experimental investigations have been carried out with the aim of comparing atomic force microscopy (AFM) and x-ray reflectometry (XRR) as methods for characterizing surface roughness. It is shown that AFM gives more appropriate information about the surface roughness in comparison to XRR. The method for estimating the parameters that characterize x-ray scattering on the basis of AFM data is developed.
Technical Physics | 2013
M. M. Barysheva; Yu. A. Vainer; B. A. Gribkov; M. V. Zorina; A. E. Pestov; N. N. Salashchenko; N. I. Chkhalo; A. V. Shcherbakov
The aim of this work is application of soft X-ray diffuse scattering for certification of diffractiongrade optical elements and their substrates at a working wavelength. A device is suggested that allows certification under laboratory conditions owing to a dynamic range approaching that of synchrotron radiation sources. Experimental data are compared with data of alternative methods.