B. J. Van Bael

Tunable Spin Loading and T-1 of a Silicon Spin Qubit Measured by Single-Shot Readout

The remarkable properties of silicon have made it the central material for the fabrication of current microelectronic devices. Silicon’s fundamental properties also make it an attractive option for the development of devices for spintronics [1] and quantum information processing [2–5]. The ability to manipulate and measure spins of single electrons is crucial for these applications. Here we report the manipulation and measurement of a single spin in a quantum dot fabricated in a silicon/silicon-germanium heterostructure. We demonstrate that the rate of loading of electrons into the device can be tuned over an order of magnitude using a gate voltage, that the spin state of the loaded electron depends systematically on the loading voltage level, and that this tunability arises because electron spins can be loaded through excited orbital states of the quantum dot. The longitudinal spin relaxation time T1 is measured using single-shot pulsed techniques [6] and found to be ∼ 3 seconds at a field of 1.85 Tesla. The demonstration of single spin measurement as well as a long spin relaxation time and tunability of the loading are all favorable properties for spintronics and quantum information processing applications. Silicon is a material in which spin qubits are expected to have long coherence times, thanks to the predominance of a spin-zero nuclear isotope and relatively weak spin-orbit coupling. However, silicon quantum dots have yet to demonstrate the reproducibility and controllability achieved in gallium arsenide devices [7–10]. Here, we demonstrate the control and manipulation of spin states of single electrons in a silicon/silicon-germanium (Si/SiGe) quantum dot and report the first single-shot measurements of the longitudinal spin relaxation time T1 in such devices. We also show that the presence of a relatively low-lying spin-split orbital excited state in the dot can be exploited to increase the speed and tunability of the loading of spins into the dot. Our results demonstrate that Si/SiGe quantum dots can be fabricated that are sufficiently tunable to enable single-electron manipulation and measurement, and that long spin relaxation times are consistent with the orbital and/or valley excitation energies in these systems. The measurements we report were performed on a gate-defined quantum dot with the gate configuration shown in Fig. 1a, tuned to be in the single-dot regime. The dot is measured at low temperature and in a parallel magnetic field. As shown in Fig. 1b, an electron can be loaded into one of four energy eigenstates; we denote 2.0 1.0 0.0 B (T) -0.158 -0.152

Charge Sensing and Controllable Tunnel Coupling in a Si/SiGe Double Quantum Dot

We report integrated charge sensing measurements on a Si/SiGe double quantum dot. The quantum dot is shown to be tunable from a single, large dot to a well-isolated double dot. Charge sensing measurements enable the extraction of the tunnel coupling t between the quantum dots as a function of the voltage on the top gates defining the device. Control of the voltage on a single such gate tunes the barrier separating the two dots. The measured tunnel coupling is an exponential function of the gate voltage. The ability to control t is an important step toward controlling spin qubits in silicon quantum dots.

Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

We investigate the tunnel rates and energies of excited states of small numbers of electrons in a quantum dot fabricated in a Si/SiGe heterostructure. Tunnel rates for loading and unloading electrons are found to be strongly energy dependent, and they vary significantly between different excited states. We show that this phenomenon enables charge sensing measurements of the average electron occupation that are analogous to Coulomb diamonds. Excited-state energies can be read directly from the plot, and we develop a rate model that enables a quantitative understanding of the relative sizes of different electron tunnel rates.

Identifying single electron charge sensor events using wavelet edge detection

The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.