Boon Tang Teh | Researchain

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Archive | 2002

Address sequencer within BIST (Built-in-Self-Test) system

Boon Tang Teh; Edward V. Bautista; Ken Cheong Cheah; Colin S. Bill; Joseph Kucera; Weng Fook Lee; Darlene G. Hamilton

Archive | 2002

On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode

Ken Cheong Cheah; Edward V. Bautista; Weng Fook Lee; Boon Tang Teh

Archive | 2001

Word line decoding architecture in a flash memory

Takao Akaogi; Ali K. Al-Shamma; Lee Cleveland; Yong Kim; Jin-lien Lin; Kendra Nguyen; Boon Tang Teh

Archive | 2001

Command-driven test modes

Jin-lien Lin; Takao Akaogi; Ali K. Al-Shamma; Lee Cleveland; Yong Kim; Boon Tang Teh; Kendra Nguyen

Archive | 2004

BUILT-IN-SELF-TEST OF FLASH MEMORY CELLS

Colin S. Bill; Azrul Halim; Darlene G. Hamilton; Edward V. Bautista; Weng Fook Lee; Ken Cheong Cheah; Chee Boon Law; Boon Tang Teh; Joseph Kucera; Syahrizal Salleh

Archive | 2000

VOLTAGE BOOST LEVEL CLAMPING CIRCUIT FOR A FLASH MEMORY

Takao Akaogi; Ali K. Al-Shamma; Lee Cleveland; Yong Kim; Jin-lien Lin; Boon Tang Teh; Kendra Nguyen

Archive | 2003

Auto-controle integre de cellules de memoire flash

Edward V. Bautista; Colin S. Bill; Ken Cheong Cheah; Azrul Halim; Darlene Hamilton; Joseph Kucera; Chee Boon Law; Weng Fook Lee; Syahrizal Salleh; Boon Tang Teh

Archive | 2001