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Bradford Gene Van Treuren

Alcatel-Lucent

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Featured researches published by Bradford Gene Van Treuren.

international test conference | 2006

IEEE P1581 - Getting More Board Test Out of Boundary Scan

Heiko Ehrenberg; Bob Russell; Bradford Gene Van Treuren

IEEE P1581 has undergone significant improvement since its introduction. This paper explains the choice of simple, low overhead solutions the proposed standard provides in overcoming one of boundary scans greatest bottlenecks: test of complex memory devices. Design for testability guidelines are provided to allow board designers and test engineers to take full advantage of this new test technique

Archive | 2010

Method and apparatus for system testing using multiple instruction types

Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 2004

System for flexible embedded Boundary Scan testing

Bradford Gene Van Treuren; Jose M. Miranda; Paul J. Wheatley

Archive | 2010

METHOD AND APPARATUS FOR VIRTUAL IN-CIRCUIT EMULATION

Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 2007

Method and apparatus for describing components adapted for dynamically modifying a scan path for system-on-chip testing

Tapan Jyoti Chakraborty; Chen-Huan Chiang; Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 2008

APPARATUS AND METHOD FOR ISOLATING PORTIONS OF A SCAN PATH OF A SYSTEM-ON-CHIP

Tapan Jyoti Chakraborty; Chen-Huan Chiang; Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 2010

Method and apparatus for system testing using scan chain decomposition

Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 2007

Method and apparatus for describing parallel access to a system-on-chip

Tapan Jyoti Chakraborty; Chen-Huan Chiang; Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 2007

Method and apparatus for describing and testing a system-on-chip

Tapan Jyoti Chakraborty; Chen-Huan Chiang; Suresh Goyal; Michele Portolan; Bradford Gene Van Treuren

Archive | 1999

Method and system for testing cluster circuits in a boundary scan environment

Tapan Jyoti Chakraborty; Bradford Gene Van Treuren

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Suresh Goyal

Alcatel-Lucent

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Michele Portolan

Bell Labs

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Tapan Jyoti Chakraborty

Alcatel-Lucent

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Chen-Huan Chiang

Alcatel-Lucent

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Michele Portolan

Bell Labs

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Jose M. Miranda

Alcatel-Lucent

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Paul J. Wheatley

Alcatel-Lucent

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Antonio L. Franco

Alcatel-Lucent

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Bryan E. Peterson

Alcatel-Lucent

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Charles Calvin Byers

Alcatel-Lucent

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