Brian L. Brown

Stored write scheme for high speed/wide bandwidth memory devices

Clock skew circuit

Method for storing a temperature threshold in an integrated circuit, method for storing a temperature threshold in a dynamic random access memory, method of modifying dynamic random access memory operation in response to temperature, programmable temperature sensing circuit and memory integrated circuit

Redundancy test method for a semiconductor memory

Power-saver differential input buffer

Interface level programmability

Current controlled multi-state parallel test for semiconductor device

Memory access circuits for test time reduction

Two pass multi-state parallel test for semiconductor device

Architecture for high bandwidth wide I/O memory devices