Bruce Edward Koppe
Eastman Kodak Company
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Featured researches published by Bruce Edward Koppe.
SID Symposium Digest of Technical Papers | 2006
Michael Long; Jeremy M. Grace; Dennis R. Freeman; Neil Peter Redden; Bruce Edward Koppe; Randolph C. Brost
A vacuum thermal evaporation source has been developed where blended or single-component organic materials are metered from a cooled reservoir to a heating element. High material utilization, very high deposition rates, and multicomponent deposition with precise composition control are features of this vaporization-on-demand source.
SID Symposium Digest of Technical Papers | 2008
Michael Long; Michael Louis Boroson; Dennis R. Freeman; Bruce Edward Koppe; Thomas William Palone; Neil Peter Redden
This paper will discuss how the unit manufacturing cost of AMOLED displays can be reduced by as much as 40% through the use of a flash vaporization source first presented at SID 2006. This cost reduction is achieved principally through higher materials utilization and higher productivity.
SID Symposium Digest of Technical Papers | 2009
Michael Long; Bruce Edward Koppe; Neil Peter Redden; Michael Louis Boroson
The ability to interrupt and reinitiate vaporization rapidly to precisely controlled rates is an important requirement for reducing the deposition cost component of OLED displays for both in-line and cluster tool configurations. A flash vaporization deposition system using closed-loop control is described that achieves these objectives.
Archive | 1992
David M. Orlicki; Bruce Edward Koppe; John Michael Kresock
Archive | 2004
Michael Long; David Richard Strip; Jeremy Mathew Grace; Dennis R. Freeman; Neil Peter Redden; Bruce Edward Koppe
Archive | 2005
Michael Long; Thomas William Palone; Bruce Edward Koppe
Archive | 2004
Michael Long; Jeremy M. Grace; Bruce Edward Koppe
Archive | 2005
Michael Long; Jeremy Matthew Grace; Bruce Edward Koppe
Archive | 2005
Michael Long; Bruce Edward Koppe; Thomas William Palone
Archive | 2005
Michael Long; Jeremy Matthew Grace; Bruce Edward Koppe; Dennis R. Freeman; Neil Peter Redden; Robert Ferdinand Zwaap