Neil Peter Redden
Eastman Kodak Company
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SID Symposium Digest of Technical Papers | 2002
Steven A. Van Slyke; Angelo G. Pignata; Dennis R. Freeman; Neil Peter Redden; Dave Waters; H. Kikuchi; Toshio Negishi; Hiroshi Kanno; Yoshitaka Nishio; M. Nakai
A key requirement for fabrication of organic light emitting diode (OLED) displays is uniform film deposition over large areas because of the sensitivity of emission color and efficiency on film thickness. Conventional deposition using point sources is unattractive because of the requirement of a large source to substrate separation, usually with substrate rotation, to achieve acceptable thin film uniformity. By translating a novel extended linear evaporation source in a single direction, film non-uniformity of less than 5% has been demonstrated over a 300 mm × 400 mm substrate with a source to substrate separation of 100 mm. OLEDs with all organic layers deposited using linear sources have been determined to operate identically to devices fabricated using conventional point sources. The performance of doped and undoped devices as well as the advantages of linear source deposition over conventional deposition techniques will be described.
SID Symposium Digest of Technical Papers | 2006
Michael Long; Jeremy M. Grace; Dennis R. Freeman; Neil Peter Redden; Bruce Edward Koppe; Randolph C. Brost
A vacuum thermal evaporation source has been developed where blended or single-component organic materials are metered from a cooled reservoir to a heating element. High material utilization, very high deposition rates, and multicomponent deposition with precise composition control are features of this vaporization-on-demand source.
SID Symposium Digest of Technical Papers | 2008
Michael Long; Michael Louis Boroson; Dennis R. Freeman; Bruce Edward Koppe; Thomas William Palone; Neil Peter Redden
This paper will discuss how the unit manufacturing cost of AMOLED displays can be reduced by as much as 40% through the use of a flash vaporization source first presented at SID 2006. This cost reduction is achieved principally through higher materials utilization and higher productivity.
SID Symposium Digest of Technical Papers | 2009
Michael Long; Bruce Edward Koppe; Neil Peter Redden; Michael Louis Boroson
The ability to interrupt and reinitiate vaporization rapidly to precisely controlled rates is an important requirement for reducing the deposition cost component of OLED displays for both in-line and cluster tool configurations. A flash vaporization deposition system using closed-loop control is described that achieves these objectives.
Process Monitoring with Optical Fibers and Harsh Environment Sensors | 1999
Steven C. Switalski; Todd Colin; Neil Peter Redden; Eric Stahlecker; Vijay Parthasarathy
We have used fiber optic remote process to monitor processes at Kodak in the lab, in development or pilot, and in production. This talk will examine the use of near IR (NIR) diffuse reflectance spectroscopy as a process technology. Diffuse reflectance spectroscopy offers the capability of looking at powders, slurries, emulsions, and dispersions. Unlike attenuated total internal reflectance spectroscopy, diffuse reflectance offers the capability of interrogating both the liquid and solid phases of the material. This provides the ability to examine the physical state of the solid, such as particle size and morphology, even in a slurry, or in the presence of large amounts of solvent, in addition to the chemical quality of the solution. The use of the NIR spectral region provides the advantages of high signal-to-noise ratio, impressive photometric stability, and commercially available instrumentation, probes and optical fiber cable. Some representative examples will be presented to demonstrate the capabilities of diffuse reflectance spectroscopy for process monitoring with fiber optics.
Archive | 2002
Dennis R. Freeman; Neil Peter Redden; Steven A. Van Slyke
Archive | 2003
Jeremy M. Grace; Dennis R. Freeman; Neil Peter Redden; Justin H. Klug; Steven A. Van Slyke
Archive | 2006
Michael Louis Boroson; Michael Long; Jeremy Matthew Grace; Neil Peter Redden; Dustin Lee Winters; Thomas William Palone
Archive | 2004
Michael Long; David Richard Strip; Jeremy Mathew Grace; Dennis R. Freeman; Neil Peter Redden; Bruce Edward Koppe
Archive | 2004
Jeremy Matthew Grace; Dennis R. Freeman; Neil Peter Redden; Justin H. Klug; Steven A Vanslyke