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Dive into the research topics where Bryan W. Reed is active.

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Featured researches published by Bryan W. Reed.


Science | 2008

Imaging of Transient Structures Using Nanosecond in Situ TEM

Judy S. Kim; Thomas LaGrange; Bryan W. Reed; Ml Taheri; Michael R. Armstrong; Wayne E. King; Nigel D. Browning

The microstructure and properties of a material depend on dynamic processes such as defect motion, nucleation and growth, and phase transitions. Transmission electron microscopy (TEM) can spatially resolve these nanoscale phenomena but lacks the time resolution for direct observation. We used a photoemitted electron pulse to probe dynamic events with “snapshot” diffraction and imaging at 15-nanosecond resolution inside of a dynamic TEM. With the use of this capability, the moving reaction front of reactive nanolaminates is observed in situ. Time-resolved images and diffraction show a transient cellular morphology in a dynamically mixing, self-propagating reaction front, revealing brief phase separation during cooling, and thus provide insights into the mechanisms driving the self-propagating high-temperature synthesis.


Journal of Applied Physics | 2005

Ultrafast electron microscopy in materials science, biology, and chemistry

Wayne E. King; Alan M. Frank; Bryan W. Reed; John Schmerge; Bradley J. Siwick; Brent C. Stuart; Peter M. Weber

The use of pump-probe experiments to study complex transient events has been an area of significant interest in materials science, biology, and chemistry. While the emphasis has been on laser pump with laser probe and laser pump with x-ray probe experiments, there is a significant and growing interest in using electrons as probes. Early experiments used electrons for gas-phase diffraction of photostimulated chemical reactions. More recently, scientists are beginning to explore phenomena in the solid state such as phase transformations, twinning, solid-state chemical reactions, radiation damage, and shock propagation. This review focuses on the emerging area of ultrafast electron microscopy (UEM), which comprises ultrafast electron diffraction (UED) and dynamic transmission electron microscopy (DTEM). The topics that are treated include the following: (1) The physics of electrons as an ultrafast probe. This encompasses the propagation dynamics of the electrons (space-charge effect, Child’s law, Boersch effect) and extends to relativistic effects. (2) The anatomy of UED and DTEM instruments. This includes discussions of the photoactivated electron gun (also known as photogun or photoelectron gun) at conventional energies (60–200 keV) and extends to MeV beams generated by rf guns. Another critical aspect of the systems is the electron detector. Charge-coupled device cameras and microchannel-plate-based cameras are compared and contrasted. The effect of various physical phenomena on detective quantum efficiency is discussed. (3) Practical aspects of operation. This includes determination of time zero, measurement of pulse-length, and strategies for pulse compression. (4) Current and potential applications in materials science, biology, and chemistry. UEM has the potential to make a significant impact in future science and technology. Understanding of reaction pathways of complex transient phenomena in materials science, biology, and chemistry will provide fundamental knowledge for discovery-class science.


Applied Physics Letters | 2006

Single-shot dynamic transmission electron microscopy

Thomas LaGrange; Michael R. Armstrong; K. Boyden; C. G. Brown; Jeffrey D. Colvin; William J. DeHope; Alan M. Frank; D. J. Gibson; Frederic V. Hartemann; Judy S. Kim; Wayne E. King; Bj Pyke; Bryan W. Reed; Michael D. Shirk; Richard M. Shuttlesworth; Brent C. Stuart; Ben Torralva; Nigel D. Browning

A dynamic transmission electron microscope (DTEM) has been designed and implemented to study structural dynamics in condensed matter systems. The DTEM is a conventional in situ transmission electron microscope (TEM) modified to drive material processes with a nanosecond laser, “pump” pulse and measure it shortly afterward with a 30-ns-long probe pulse of ∼107 electrons. An image with a resolution of <20nm may be obtained with a single pulse, largely eliminating the need to average multiple measurements and enabling the study of unique, irreversible events with nanosecond- and nanometer-scale resolution. Space charge effects, while unavoidable at such a high current, may be kept to reasonable levels by appropriate choices of operating parameters. Applications include the study of phase transformations and defect dynamics at length and time scales difficult to access with any other technique. This single-shot approach is complementary to stroboscopic TEM, which is capable of much higher temporal resolution ...


Ultramicroscopy | 2008

Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

Thomas LaGrange; Bryan W. Reed; Ml Taheri; J. Bradley Pesavento; Judy S. Kim; Nigel D. Browning

Most biological processes, chemical reactions and materials dynamics occur at rates much faster than can be captured with standard video rate acquisition methods in transmission electron microscopes (TEM). Thus, there is a need to increase the temporal resolution in order to capture and understand salient features of these rapid materials processes. This paper details the development of a high-time resolution dynamic transmission electron microscope (DTEM) that captures dynamics in materials with nanosecond time resolution. The current DTEM performance, having a spatial resolution <10nm for single-shot imaging using 15ns electron pulses, will be discussed in the context of experimental investigations in solid state reactions of NiAl reactive multilayer films, the study of martensitic transformations in nanocrystalline Ti and the catalytic growth of Si nanowires. In addition, this paper will address the technical issues involved with high current, electron pulse operation and the near-term improvements to the electron optics, which will greatly improve the signal and spatial resolutions, and to the laser system, which will allow tailored specimen and photocathode drive conditions.


Journal of Applied Physics | 2006

Femtosecond electron pulse propagation for ultrafast electron diffraction

Bryan W. Reed

Ultrafast electron diffraction (UED) relies on short, intense pulses of electrons, which because of Coulombic repulsion will expand and change shape as they propagate. While such pulse expansion has been studied in other contexts, efforts to model this effect for typical UED parameters have only arisen fairly recently. These efforts have yielded accurate predictions with very simple models, but have left a number of unexplained results (such as the development of a linear self-similar profile with sharply defined end points). The present work develops a series of models that gradually incorporate more physical principles, allowing a clear determination of which processes control which aspects of the pulse propagation. This will include a complete analytical solution of the one-dimensional problem (including a fundamental limitation on temporal resolution), followed by the gradual inclusion of two-dimensional and inhomogeneous effects. Even very simple models tend to capture the relevant on-axis behavior t...


Applied Physics Letters | 2013

Irreversible reactions studied with nanosecond transmission electron microscopy movies: Laser crystallization of phase change materials

Melissa K. Santala; Bryan W. Reed; Simone Raoux; Teya Topuria; Thomas LaGrange

We use multi-frame, nanosecond-scale photo-emission transmission electron microscopy to create movies of irreversible reactions that occur too rapidly to capture with conventional microscopy. The technique is applied to the crystallization of phase change materials used for optical and resistive memory. For those applications, laser- or current-induced crystallization is orders of magnitude too fast to capture with other imaging techniques. We recorded movies of laser-induced crystallization and measured crystal growth rates at temperatures close to where the maximum growth rate occurs. This paves the way for studying crystallization kinetics of phase change materials over the whole range of technologically relevant temperatures.


Micron | 2012

Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope.

Thomas LaGrange; Bryan W. Reed; Melissa K. Santala; Joseph T. McKeown; Andreas Kulovits; J.M.K. Wiezorek; Liliya Nikolova; Federico Rosei; Bradely J. Siwick

The growing field of ultrafast materials science, aimed at exploring short-lived transient processes in materials on the microsecond to femtosecond timescales, has spawned the development of time-resolved, in situ techniques in electron microscopy capable of capturing these events. This article gives a brief overview of two principal approaches that have emerged in the past decade: the stroboscopic ultrafast electron microscope and the nanosecond-time-resolved single-shot instrument. The high time resolution is garnered through the use of advanced pulsed laser systems and a pump-probe experimental platforms using laser-driven photoemission processes to generate time-correlated electron probe pulses synchronized with laser-driven events in the specimen. Each technique has its advantages and limitations and thus is complementary in terms of the materials systems and processes that they can investigate. The stroboscopic approach can achieve atomic resolution and sub-picosecond time resolution for capturing transient events, though it is limited to highly repeatable (>10(6) cycles) materials processes, e.g., optically driven electronic phase transitions that must reset to the materials ground state within the repetition rate of the femtosecond laser. The single-shot approach can explore irreversible events in materials, but the spatial resolution is limited by electron source brightness and electron-electron interactions at nanosecond temporal resolutions and higher. The first part of the article will explain basic operating principles of the stroboscopic approach and briefly review recent applications of this technique. As the authors have pursued the development of the single-shot approach, the latter part of the review discusses its instrumentation design in detail and presents examples of materials science studies and the near-term instrumentation developments of this technique.


Journal of Applied Physics | 2014

In situ imaging of ultra-fast loss of nanostructure in nanoparticle aggregates

Garth C. Egan; Kyle Sullivan; Thomas LaGrange; Bryan W. Reed; Michael R. Zachariah

The word “nanoparticle” nominally elicits a vision of an isolated sphere; however, the vast bulk of nanoparticulate material exists in an aggregated state. This can have significant implications for applications such as combustion, catalysis, and optical excitation, where particles are exposed to high temperature and rapid heating conditions. In such environments, particles become susceptible to morphological changes which can reduce surface area, often to the detriment of functionality. Here, we report on thermally-induced coalescence which can occur in aluminum nanoparticle aggregates subjected to rapid heating (106–1011 K/s). Using dynamic transmission electron microscopy, we observed morphological changes in nanoparticle aggregates occurring in as little as a few nanoseconds after the onset of heating. The time-resolved probes reveal that the morphological changes initiate within 15 ns and are completed in less than 50 ns. The morphological changes were found to have a threshold temperature of about 1...


Applied Physics Letters | 2007

Prospects for electron imaging with ultrafast time resolution

Michael R. Armstrong; Bryan W. Reed; Ben Torralva; Nigel D. Browning

Many pivotal aspects of material science, biomechanics, and chemistry would benefit from nanometer imaging with ultrafast time resolution. Here we demonstrate the feasibility of short-pulse electron imaging with t10 nanometer/10 picosecond spatio-temporal resolution, sufficient to characterize phenomena that propagate at the speed of sound in materials (1-10 kilometer/second) without smearing. We outline resolution-degrading effects that occur at high current density followed by strategies to mitigate these effects. Finally, we present a model electron imaging system that achieves 10 nanometer/10 picosecond spatio-temporal resolution.


Applied Physics Letters | 2010

Nanocrystallization of amorphous germanium films observed with nanosecond temporal resolution

Liliya Nikolova; Thomas LaGrange; Bryan W. Reed; Mark J. Stern; Nigel D. Browning; Jean-Claude Kieffer; Bradley J. Siwick; Federico Rosei

Using dynamic transmission electron microscopy we measure nucleation and growth rates during laser driven crystallization of amorphous germanium (a-Ge) films supported by silicon monoxide membranes. The films were crystallized using single 532 nm laser pulses at a fluence of ∼128 mJ cm−2. Devitrification processes initiate less than 20 ns after excitation and are complete within ∼55 ns. The nucleation rate was estimated by tracking crystallite density as a function of time and reached a maximum of ∼1.6×1022 nuclei/cm3 s. This study provides information on nanocrystallization phenomena in a-Ge, which is important for the implementation of nanostructured group IV semiconductors in optoelectronics devices.

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Thomas LaGrange

Lawrence Livermore National Laboratory

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T. LaGrange

Lawrence Livermore National Laboratory

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Mukul Kumar

University of Cincinnati

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Joseph T. McKeown

Lawrence Livermore National Laboratory

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Melissa K. Santala

Lawrence Livermore National Laboratory

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Wayne E. King

Lawrence Livermore National Laboratory

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