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Dive into the research topics where Chandrasekharan Kothandaraman is active.

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Featured researches published by Chandrasekharan Kothandaraman.


IEEE Electron Device Letters | 2002

Electrically programmable fuse (eFUSE) using electromigration in silicides

Chandrasekharan Kothandaraman; Sundar K. Iyer; Subramanian S. Iyer

For the first time we describe a positive application of electromigration, as an electrically programmable fuse device (eFUSE). Upon programming, eFUSEs show a large increase in resistance that enable easy sensing. The transient device characteristics show that the eFUSE stays in a low resistance state during programming due to the local heating of the fuse link. The programming is enhanced by a device design that uses a large cathode which increases the temperature gradient and minimizes the effect of microstructural variations.


Archive | 2002

ELECTRICAL ANTIFUSE WITH EXTERNAL CAPACITANCE

Chandrasekharan Kothandaraman


Archive | 2002

Fuse structure for semiconductor device

Chandrasekharan Kothandaraman


Archive | 2004

Single-poly 2-transistor based fuse element

Chandrasekharan Kothandaraman; Danny Pak-Chum Shum


Archive | 2004

Via structure for semiconductor chip

Chandrasekharan Kothandaraman


Archive | 2011

Elektrisch programmierbares 2-Transistoren-Sicherungselement mit einfacher Polysiliziumschicht und elektrisch programmierbare Transistor-Sicherungszelle

Chandrasekharan Kothandaraman; Danny Pak-Chum Shum


Archive | 2004

2-Transistoren-Schmelzsicherungselement mit einzelner Polysiliziumschicht

Chandrasekharan Kothandaraman; Danny Pak-Chum Shum


Archive | 2003

Electrical antifuse with external capacitance used for programming

Chandrasekharan Kothandaraman


Archive | 2003

Fuse structure programming by electromigration of silicide enhanced by creating temperature gradient

Subramanian Iyer; Subramanian S. Iyer; Chandrasekharan Kothandaraman; Chandrasekhar San Jose Narayan


The Japan Society of Applied Physics | 2002

Implementation of electrically programmable fuse (eFUSE) in CMOS technologies using electromigration

Subramanian S. Iyer; Chandrasekharan Kothandaraman; Norman Robson; Danny Shum; James P. Rice; S. S. Iyer

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