Christin Büchner

The Atomic Structure of a Metal-Supported Vitreous Thin Silica Film**

Clear as glass: The atomic structure of a metal-supported vitreous thin silica film was resolved using low-temperature scanning tunneling microscopy (STM). Based on the STM image, a model was constructed and the atomic arrangement of the thin silica glass determined (see picture). The total pair correlation function of the structural model shows good agreement with diffraction experiments performed on vitreous silica.

Ultrathin Silica Films: The Atomic Structure of Two‐Dimensional Crystals and Glasses

For the last 15 years, we have been studying the preparation and characterization of ordered silica films on metal supports. We review the efforts so far, and then discuss the specific case of a silica bilayer, which exists in a crystalline and a vitreous variety, and puts us into a position to investigate, for the first time, the real space structure (AFM/STM) of a two-dimensional glass and its properties. We show that pair correlation functions determined from the images of this two-dimensional glass are similar to those determined by X-ray and neutron scattering from three-dimensional glasses, if the appropriate sensitivity factors are taken into account. We are in a position, to verify, for the first time, a model of the vitreous silica structure proposed by William Zachariasen in 1932. Beyond this, the possibility to prepare the crystalline and the glassy structure on the same support allows us to study the crystal-glass phase transition in real space. We, finally, discuss possibilities to use silica films to start investigating related systems such as zeolites and clay films. We also mention hydroxylation of the silica films in order to adsorb metal atoms modeling heterogenized homogeneous catalysts.

A Large-Area Transferable Wide Band Gap 2D Silicon Dioxide Layer

An atomically smooth silica bilayer is transferred from the growth substrate to a new support via mechanical exfoliation at millimeter scale. The atomic structure and morphology are maintained perfectly throughout the process. A simple heating treatment results in complete removal of the transfer medium. Low-energy electron diffraction, Auger electron spectroscopy, scanning tunneling microscopy, and environmental scanning electron microscopy show the success of the transfer steps. Excellent chemical and thermal stability result from the absence of dangling bonds in the film structure. By adding this wide band gap oxide to the toolbox of 2D materials, possibilities for van der Waals heterostructures will be broadened significantly.

Topological Investigation of Two-dimensional Amorphous Materials

Abstract Real space image data of two-dimensional amorphous networks have become available in high resolution. We review a number of systems regarding ring size distribution, pair correlation function and characteristic structural clusters. We present similarities and differences that can help identify general descriptors for amorphousness.

Resolving amorphous solid-liquid interfaces by atomic force microscopy

Recent advancements in liquid atomic force microscopy make it an ideal technique for probing the structure of solid-liquid interfaces. Here, we present a structural study of a two-dimensional amorphous silica bilayer immersed in an aqueous solution utilizing liquid atomic force microscopy with sub-nanometer resolution. Structures show good agreement with atomically resolved ultra-high vacuum scanning tunneling microscopy images obtained on the same sample system, owing to the structural stability of the silica bilayer and the imaging clarity from the two-dimensional sample system. Pair distance histograms of ring center positions are utilized to develop quantitative metrics for structural comparison, and the physical origin of pair distance histogram peaks is addressed by direct assessment of real space structures.

Assessing the amorphousness and periodicity of common domain boundaries in silica bilayers on Ru(0 0 0 1)

Domain boundaries are hypothesized to play a role in the crystalline to amorphous transition. Here we examine domain boundary structures in comparison to crystalline and amorphous structures in bilayer silica grown on Ru(0 0 0 1). Atomically resolved scanning probe microscopy data of boundaries in crystalline bilayer films are analyzed to determine structural motifs. A rich variety of boundary structures including rotational, closed-loop, antiphase, and complex boundaries are identified. Repeating units with ring sizes of 558 and 57 form the two most common domain boundary types. Quantitative metrics are utilized to assess the structural composition and degree of order for the chemically equivalent crystalline, domain boundary, and amorphous structures. It is found that domain boundaries in the crystalline phase show similarities to the amorphous phase in their ring statistics and, in some cases, in terms of the observed ring neighborhoods. However, by assessing order and periodicity, domain boundaries are shown to be distinct from the glassy state. The role of the Ru(0 0 0 1) substrate in influencing grain boundary structure is also discussed.

The Atomic Structure of Two-Dimensional Silica

Determining the structure of amorphous materials used to be challenging due to the complexity of this material class. Despite many attempts to resolve amorphous materials by various diffraction methods as well as scanning probe methods, no-one has yet been able to carry out atomic imaging and to clearly identify the structure of amorphous materials. Only modern preparation methods in combination with advanced scanning tunneling and atomic force microscopy have succeeded in decrypting the everyday material glass. A bilayer silicate film on a ruthenium single crystal has been developed at the Fritz-Haber Institute. On the atomic level, this film is flat and ideal for using scanning probe microscopy. For the first time a clear image of an amorphous material has been obtained which allowed for the derivation of atomic sites and a detailed analysis from real space coordinates. The text book example of the vitreous silica structure proposed by William Zachariasen in 1932 has thereby finally been verified.

Enhanced atomic corrugation in dynamic force microscopy—The role of repulsive forces

Full range two dimensional (2D) force mapping was performed by means of low temperature dynamic force microscopy (DFM) on a highly complex surface structure. For this purpose, we used a thin film of vitreous silica on a Ru(0001)-support, which is a 2D structural equivalent to silica glass. The 2D spectroscopy shows that the contrast generating shift in vertical distance between two sites on the surface is twice as large on the repulsive branch of the frequency shift-distance curve as compared to the attractive branch. The results give insight into the origin of the formation of atomic resolution in DFM.

A portable quartz micro balance for physical vapor deposition techniques

A portable quartz crystal micro balance for physical vapor deposition techniques is presented. The device is used for the calibration of evaporators employed in the preparation of thin film systems that are studied in surface science. The design is based upon a portable sample setup, highly versatile and customizable. It can be transported within an ultrahigh vacuum system, stored in a sample garage and be used in front of different evaporators. Details of the setup are described. Finally, the performance of the device is demonstrated and compared to scanning tunneling microscopy measurements.

Bending Rigidity of 2D Silica

A chemically stable bilayers of SiO_{2} (2D silica) is a new, wide band gap 2D material. Up till now graphene has been the only 2D material where the bending rigidity has been measured. Here we present inelastic helium atom scattering data from 2D silica on Ru(0001) and extract the first bending rigidity, κ, measurements for a nonmonoatomic 2D material of definable thickness. We find a value of κ=8.8  eV±0.5  eV which is of the same order of magnitude as theoretical values in the literature for freestanding crystalline 2D silica.