Daniel J. Devine
Mattson Technology, Inc.
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Featured researches published by Daniel J. Devine.
international conference on advanced thermal processing of semiconductors | 2001
Brad S. Mattson; Paul Janis Timans; Sing-Pin Tay; Daniel J. Devine; Jung Kim
RTP presents a unique opportunity for the semiconductor industry. By completing the transition to RTP as we enter the 300 mm-era, the industry can seize the opportunity for significant improvements in cycle-time, in thermal budget minimization and in process performance. This paper examines how RTP has evolved to meet these challenges and describes the state-of-the-art of RTP technology today. The poor throughput performance of 300 mm batch furnaces, the risk of misprocessing large batches of very valuable wafers and the inflexibility of the furnace in an era when cycle-time is paramount all signal the end of large-batch thermal processing within this decade.
Archive | 2010
Martin Zucker; Daniel J. Devine; Young Jai Lee
Archive | 2006
Paul Janis Timans; Daniel J. Devine; Young Jai Lee; Yao Zhi Hu; Peter C. Calif. Bordiga
Archive | 2009
Songlin Xu; Daniel J. Devine; Wen Ma; Ce Qin; Vijay Vaniapura
Archive | 2003
Daniel J. Devine; Young Jai Lee; Paul Janis Timans; Frank Allan Lema
Archive | 2003
Young Jai Lee; Ronald L. Wang; Steven Ly; Daniel J. Devine
Archive | 2003
Rene George; John Zajac; Daniel J. Devine; Craig Ranft; Andreas Kadavanich
Archive | 2007
Martin Zucker; Daniel J. Devine; Vladimir Nagorny; Jonathan Mohn
Archive | 2007
Daniel J. Devine; Rene George; Ce Qin; Dixit Desai
Archive | 2008
Daniel J. Devine; Charles Crapuchettes; Dixit Desai; Rene George; Vincent C. Lee; Yuya Saratoga Matsuda; Jonathan Mohn; Ryan Pakulski; Stephen E. Savas; Martin Zucker