Dawood Al-Abri

RFID-based system for school children transportation safety enhancement

This paper presents a system to monitor pick-up/drop-off of school children to enhance the safety of children during the daily transportation from and to school. The system consists of two main units, a bus unit and a school unit. The bus unit the system is used to detect when a child boards or leaves the bus. This information is communicated to the school unit that identifies which of the children did not board or leave the bus and issues an alert message accordingly. The system has a developed web-based database-driven application that facilities its management and provides useful information about the children to authorized personal. A complete prototype of the proposed system was implemented and tested to validate the system functionality. The results show that the system is promising for daily transportation safety.

Electromagnetics interference (EMI) radiation from airflow openings in personal computers shielded enclosures: An experimental study

In this paper, electromagnetic radiation leakage through airflow openings found in modern personal computers and mobile electronic devices (i.e., enclosures) is experimentally studied in the low frequency regime. Three different designs of enclosures covers are assessed through experimental work. The three airflow covers of the shielding enclosure cases comprise the use of all holes (case 1), hexagon (case 2), slotted cover (case 3), and a reference case of a solid cover with no openings. Comparison is then made between the designed covers in reference to the solid cover that mimics a closed enclosure. The measurements are conducted based on capturing the amount of power transfer, through the transmission coefficient S21 , in both near vicinity and far-region from the enclosures opening. It was found that hexagonal airflow cover provides better shielding effectiveness than cases 1 and 3, especially in the near-vicinity region to the enclosure.

A heuristic approach towards the designs of digital logic circuits in Built-In Test environment with optimal solution

In todays world Built-In Test is the necessity for the designs of digital logic circuits. However, providing solutions with such concept requires cumbersome and typical procedures of designs and because of this majority of the design go without incorporating the features of Built-In Test in the designs. The design procedures further aggravates if optimal design is needed. Hence, in view of this, an idea of a heuristic approach towards the designs of digital logic circuits in Built-In Test environment with optimal solution is proposed through this paper.