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Dive into the research topics where Deepak Pandey is active.

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Featured researches published by Deepak Pandey.


Journal of Applied Physics | 2010

Large-scale graphitic thin films synthesized on Ni and transferred to insulators: Structural and electronic properties

Helin Cao; Qingkai Yu; Robert Colby; Deepak Pandey; C. S. Park; Jie Lian; Dmitry Zemlyanov; Isaac Childres; Vladimir P. Drachev; Eric A. Stach; Muhammad Mustafa Hussain; Hao Li; S. S. Pei; Yong P. Chen

We present a comprehensive study of the structural and electronic properties of ultrathin films containing graphene layers synthesized by chemical vapor deposition based surface segregation on polycrystalline Ni foils then transferred onto insulating SiO2/Si substrates. Films of size up to several mm’s have been synthesized. Structural characterizations by atomic force microscopy, scanning tunneling microscopy, cross-sectional transmission electron microscopy (XTEM), and Raman spectroscopy confirm that such large-scale graphitic thin films (GTF) contain both thick graphite regions and thin regions of few-layer graphene. The films also contain many wrinkles, with sharply-bent tips and dislocations revealed by XTEM, yielding insights on the growth and buckling processes of the GTF. Measurements on mm-scale back-gated transistor devices fabricated from the transferred GTF show ambipolar field effect with resistance modulation ∼50% and carrier mobilities reaching ∼2000 cm2/V s. We also demonstrate quantum tra...


215th ECS Meeting | 2009

Surface Microscopy Characterizations of Large Size Graphene Films Grown by Surface Segregation on Ni and Transferred to Si/SiO2 Substrate

Deepak Pandey; Gyan Prakash; Qingkai Yu; Helin Cao; Luis A. Jauregui; S. S. Pei; Yong P. Chen

We report surface microscopy characterizations of large size graphene films (up to mm) grown on polycrystalline Ni foils and transferred to Si/SiO2. Wrinkles in such films are studied by both atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Local graphitic lattice structures of the films are imaged with atomic-resolution STM and compared with those of the highly ordered pyrolytic graphite (HOPG).


Nature Materials | 2011

Control and characterization of individual grains and grain boundaries in graphene grown by chemical vapour deposition

Qingkai Yu; Luis A. Jauregui; Wei Wu; Robert Colby; Jifa Tian; Zhihua Su; Helin Cao; Zhihong Liu; Deepak Pandey; Dongguang Wei; Ting Fung Chung; Peng Peng; Nathan P. Guisinger; Eric A. Stach; Jiming Bao; Shin Shem Pei; Yong P. Chen


Surface Science | 2008

Scanning probe microscopy study of exfoliated oxidized graphene sheets

Deepak Pandey; R. Reifenberger; Richard D. Piner


Surface Science | 2011

Folding and cracking of graphene oxide sheets upon deposition

Deepak Pandey; Ting Fung Chung; G. Prakash; Richard D. Piner; Yong P. Chen; R. Reifenberger


Physica Status Solidi-rapid Research Letters | 2013

Structural and electronic properties of highly doped topological insulator Bi2Se3 crystals

Helin Cao; Su-Yang Xu; I. Miotkowski; Jifa Tian; Deepak Pandey; M. Zahid Hasan; Yong P. Chen


Langmuir | 2007

UHV STM I(V) and XPS Studies of Aryl Diazonium Molecules Assembled on Si(111)

Deepak Pandey; Dmitry Zemlyanov; Kirk H. Bevan; R. Reifenberger; Shawn M. Dirk; Steve W. Howell; D. R. Wheeler


Archive | 2010

Single-crystal Grains and Grain Boundaries in Graphene Grown by Chemical Vapor Deposition

Qingkai Yu; Luis A. Jauregui; Wei Wu; Robert Colby; Jifa Tian; Zhihua Su; Helin Cao; Zhihong Liu; Deepak Pandey; Dongguang Wei; Ting Fung Chung; Peng Peng; Nathan P. Guisinger; Eric A. Stach; Jiming Bao; Shin Shem Pei; Yong P. Chen


Archive | 2009

Large Scale Graphene Films Synthesized on Metals and Transferred to Insulators for Electronic Applications

Helin Cao; Qingkai Yu; Deepak Pandey; Dmitry Zemlianov; Robert Colby; Isaac Childres; Vladimir P. Drachev; Eric A. Stach; Jie Lian; Hao Li; S. S. Pei; Yong P. Chen


Surface Science | 2011

WITHDRAWN: Folding and cracking of graphene oxide sheets upon deposition

Deepak Pandey; Ting Fung Chung; G. Prakash; Richard D. Piner; Yong P. Chen; R. Reifenberger

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Qingkai Yu

Texas State University

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Richard D. Piner

University of Texas at Austin

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S. S. Pei

University of Houston

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Hao Li

University of Missouri

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