E.R. Glaser

Photoluminescence studies of self‐assembled InSb, GaSb, and AlSb quantum dot heterostructures

Photoluminescence (PL) spectroscopy has been performed on a set of self‐assembled InSb, GaSb, and AlSb quantum dot (QD) heterostructures grown on GaAs. Strong emission bands with peak energies near 1.15 eV and linewidths of ∼80 meV are observed at 1.6 K from 3 monolayer (ML) InSb and GaSb QDs capped with GaAs. The PL from a capped 4 ML AlSb QD sample is weaker with peak energy at 1.26 eV. The PL bands from these Sb‐based QD samples shift to lower energy by 20–50 meV with decreasing excitation power density. This behavior suggests a type II band lineup. Support for this assignment, with electrons in the GaAs and holes in the (In,Ga,Al)Sb QDs, is found from the observed shift of GaSb QD emission to higher energies when the GaAs barrier layers are replaced by Al0.1Ga0.9As.

Comparison of Epitaxial Graphene on Si-face and C-face 4H SiC Formed by Ultrahigh Vacuum and RF Furnace Production

We present X-ray photoelectron spectroscopy, van der Pauw Hall mobilities, low-temperature far-infrared magneto transmission (FIR-MT), and atomic force microscopy (AFM) results from graphene films produced by radiative heating in an ultrahigh vacuum (UHV) chamber or produced by radio frequency (RF) furnace annealing in a high vacuum chemical vapor deposition system on Si- and C-face 4H SiC substrates at 1200-1600 degrees C. Although the vacuum level and heating methods are different, graphene films produced by the two methods are chemically similar with the RF furnace annealing typically producing thicker graphene films than UHV. We observe, however, that the formation of graphene on the two faces is different with the thicker graphene films on the C-face RF samples having higher mobility. The FIR-MT showed a 0(-1) --> 1(0) Landau level transition with a square root B dependence and a line width consistent with a Dirac fermion with a mobility >250,000 cm(2) x V(-1) x s(-1) at 4.2 K in a C-face RF sample having a Hall-effect carrier mobility of 425 cm(2) x V(-1) x s(-1) at 300 K. AFM shows that graphene grows continuously over the varying morphology of both Si and C-face substrates.

Possible room-temperature ferromagnetism in hydrogenated carbon nanotubes

We find that ferromagnetism can be induced in carbon nanotubes (CNTs) by introducing hydrogen. Multiwalled CNTs grown inside porous alumina templates contain a large density of defects resulting in significant hydrogen uptake when annealed at high temperatures. This hydrogen incorporation produces H-complex and adatom magnetism which generates a sizable ferromagnetic moment and a Curie temperature near T(C)=1000 K. We studied the conditions for the incorporation of hydrogen, the temperature-dependent magnetic behavior, and the dependence of the ferromagnetism on the size of the nanotubes.

Gallium nitride materials - progress, status, and potential roadblocks

Metal-organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) are the principal techniques for the growth and n-type (Si) and p-type (Mg) doping of III-nitride thin films on sapphire and silicon carbide substrates as well as previously grown GaN films. Lateral and pendeoepitaxy via MOVPE reduce significantly the dislocation density and residual strain in GaN and AlGaN films. However tilt and coalescence boundaries are produced in the laterally growing material. Very high electron mobilities in the nitrides have been realized in radio-frequency plasma-assisted MBE GaN films and in two-dimensional electron gases in the AlGaN/GaN system grown on MOVPE-derived GaN substrates at the crossover from the intermediate growth regime to the droplet regime. State-of-the-art Mg doping profiles and transport properties have been achieved in MBE-derived p-type GaN. The Mg-memory effect, and heterogeneous growth, substrate uniformity, and flux control are significant challenges for MOVPE and MBE, respectively. Photoluminescence (PL) of MOVPE-derived unintentionally doped (UID) heteroepitaxial GaN films show sharp lines near 3.478 eV due to recombination processes associated with the annihilation of free-excitons (FEs) and excitons bound to a neutral shallow donor (D/spl deg/X).

Observation of optically detected magnetic resonance in GaN films

Optically detected magnetic resonance has been observed from GaN. Two magnetic resonances have been detected on the 2.2 eV‐deep photoluminescence band. The first resonance is sharp [full width at half‐maximum (FWHM) ∼2.2 mT] with g∥=1.9515±0.0002 and g⊥=1.9485±0.0002 and is assigned to conduction electrons, in agreement with recent electron paramagnetic resonance (EPR) studies of similar samples. The second feature, which has not been seen by EPR, is much broader (FWHM∼13 mT) with g∥=1.989±0.001 and g⊥=1.992±0.001. These parameters indicate a deep state. A tentative assignment is made to a deep state associated with the N vacancy.

Reduction of buffer layer conduction near plasma-assisted molecular-beam epitaxy grown GaN/AlN interfaces by beryllium doping

Beryllium doping of epitaxial GaN layers is used to reduce leakage currents through interfacial or buffer conducting layers grown by plasma-assisted molecular-beam epitaxy on SiC. Capacitance–voltage measurements of Schottky barrier test structures and dc pinch-off characteristics of unintentionally doped GaN high-electron-mobility transistors indicate that these leakage currents are localized near the GaN/AlN interface of our AlGaN/GaN/AlN device structures. Insertion of a 2000 A Be:GaN layer at the interface reduces these currents by three orders of magnitude.

Molecular beam epitaxy of beryllium-doped GaN buffer layers for AlGaN/GaN HEMTs

Group III-nitride semiconductors are promising materials for high-power microwave transistors. However, several materials issues remain to be solved. For example, conducting buffer or interfacial layers are a frequently observed problem in AlGaN/GaN HEMTs grown by both MOCVD and MBE. These conducting layers can cause poor pinch-off characteristics and poor inter-device isolation.

Interface control in InAs/AlSb superlattices

The presence of two species of both cations and anions permits the construction of InAs/AlSb heterostructures with either AlAs‐ or InSb‐like interfaces. Using migration‐enhanced epitaxial techniques, we grew InAs/AlSb superlattices with both types of interfaces. The control of interfacial composition was confirmed by x‐ray diffraction and Raman spectroscopy measurements. We demonstrate that superlattices displaying multiple x‐ray diffraction satellites, distinct planar vibrational modes, and strong photoluminescence can be achieved with both InSb‐ and AlAs‐bonded interfaces using appropriate buffer layers and growth temperatures.

Native defects and dopants in GaN studied through photoluminescence and optically detected magnetic resonance

Native defects and dopants in GaN grown by organometallic chemical vapor deposition have been studied with photoluminescence and optically detected magnetic resonance. For undoped samples, the combined results indicate the presence of residual shallow donors and acceptors and deep donors. A model for the capture and recombination among these defects is developed. For Mg-doped samples, the experiments reveal shallow and perturbed acceptors and shallow and deep donors. Hence, shallow and deep states for the native donor or donors appear in all samples. The Mg-acceptor is perturbed from its effective-mass state by nearby point defects.

Spin coherence and echo modulation of the silicon vacancy in4H−SiCat room temperature

The silicon vacancy in silicon carbide is a strong emergent candidate for applications in quantum information processing and sensing. We perform room temperature optically-detected magnetic resonance and spin echo measurements on an ensemble of vacancies and find the properties depend strongly on magnetic field. The spin echo decay time varies from less than 10