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Featured researches published by Erwin Spanner.


Proceedings of SPIE | 2016

Qualification of HEIDENHAIN linear encoders for picometer resolution metrology in VTF Etalons

C. Halbgewachs; T. J. Kentischer; Karsten Sändig; Joerg Baumgartner; Alexander Bell; Andreas Fischer; Stefan Funk; Frank Heidecke; Thomas Scheiffelen; W. Schmidt; Erwin Spanner; Peter Speckbacher; Oskar von der Luhe

The Visible Tunable Filter (VTF) is a narrowband tunable instrument for imaging spectropolarimetry in the wavelength range between 520 and 870 nm. It is based on large-format Fabry Perots with a free aperture of 250 mm. The instrument will be one of the first-light instruments of the 4 m aperture Daniel K. Inoue Solar Telescope (DKIST) that is currently under construction on Maui (Hawaii). To provide stable and repeatable spectral scanning by tuning the air gap distance of the Etalons, a metrology system with 20 pm resolution and drift stability of better 100 pm per hour is needed. The integration of the metrology system must preserve the tight optical specifications of the Etalon plates. The HEIDENHAIN LIP 382 linear encoder system has a selected linear scale for low noise high signal interpolation. The signal period is 128nm and the interpolated signal from the sensor can be read out at 128 nm/ 14 bit = 7.8125 pm. To qualify the LIP 382 system for the VTF, we investigated the resolution and stability under nominal VTF operation conditions and verified a mounting concept for the sensor heads. We present results that demonstrate that the LIP 382 system fulfills the requirements for the VTF Etalons. We also present a design for the sensor head mounts.


Archive | 1993

Polarizing interferometric displacement measuring arrangement

Dieter Michel; Erwin Spanner


Archive | 1997

Optical position-measuring device having reference mark graduation structures with chirp fields

Wolfgang Holzapfel; Erwin Spanner


Archive | 1995

Dual-beam interferometer with a phase grating

Andreas Dr Franz; Erwin Spanner


Archive | 1990

Position-measuring installation

Dieter Michel; Erwin Spanner


Archive | 1996

Phase grating and method of producing phase grating

Peter Speckbacher; Georg Flatscher; Michael Allgäuer; Erich Bayer; Erwin Spanner; Andreas Dr Franz


Archive | 1990

Position measuring apparatus with reflection

Dieter Michel; Erwin Spanner


Archive | 2000

Position measuring system and method for operating a position measuring system

Rainer Hagl; Mathias Hausschmid; Erwin Spanner; Jürgen Thiel; Johann Streitwieser


Archive | 1996

Photoelectric position measuring system with integral optical circuit having phase shifted interference gratings

Erwin Spanner


Archive | 2008

Optical position measuring arrangement

Wolfgang Holzapfel; Walter Huber; Erwin Spanner

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