Florian Schamberger

Vertical field effect transistor with internal annular gate and method of production

Integrated memory having a self-repair function

Semiconductor component for connection to a test system

Integrierte Schaltung mit einer Selbsttesteinrichtung

Integrated circuit with built-in self-test device

Configuration for generating signal impulses of defined lengths in a module with a bist-function

Bonding pad test configuration

Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making point

Integrated circuit having a self-test device

Configuration and method for storing the test results obtained by a BIST circuit