Helmut Schneider

Vertical field effect transistor with internal annular gate and method of production

Control elements of a fault-tolerant multicomputer system

Fuse latch circuit

Integrated memory having a self-repair function

Integrierte Schaltung mit einer Selbsttesteinrichtung

Integrated semiconductor chip with modular dummy structures

Adjustable delay circuit

Method of operating an integrated circuit

Bonding pad test configuration

Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making point