Juergen Lindolf

Auto-adjustment of self-refresh frequency

Measurement probe for detecting electrical signals in an integrated semiconductor circuit

Integrated circuit with electrostatic discharge protection

Circuit for measuring capacitances of structures in an IC enables voltage-dependent, differential capacitance measurement - has test and reference structures connected to junctions of series transistors in parallel circuits connected between poles of controllable voltage supply

Semiconductor chip and process for forming a contact surface form the surface in a well against which a test needle can rest

Vertical MOS transistor in semiconductor substrate

Measuring probe for detection of IC signals has lever arm of high conductivity material covered by insulation layer provided with window at apex of probe point

Herstellungsverfahren für eine integrierte Schaltung, insbesondere eine Antifuse Manufacturing process for an integrated circuit, in particular a antifuse

MEASURING SONDE FOR DETECTING ELECTRICAL SIGNAL IN INTEGRATED CIRCUIT, METHOD FOR USING THE MEASURING SONDE, METHOD FOR MANUFACTURING THE MEASURING SONDE AND MEASURING SYSTEM BY THE MEASURING SONDE

Receiver circuit, parts arranged in circuit for switching in dram memory